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研究生: 石哲瑋
Shih, Jei-Wei
論文名稱: 應用於快閃記憶體之極化碼位元排列
Bit Permutation of Polar Codes for NAND Flash Memory
指導教授: 郭致宏
Kuo, Chih-Hung
學位類別: 碩士
Master
系所名稱: 電機資訊學院 - 電機工程學系
Department of Electrical Engineering
論文出版年: 2020
畢業學年度: 108
語文別: 中文
論文頁數: 58
中文關鍵詞: 極化碼接續消除解碼NAND型快閃記憶體量化軟決策位元排列
外文關鍵詞: Polar Codes, Successive-cancellation decoding, NAND flash memory, quantized soft, bit permutation
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  • 極化碼(polar codes)被證明可用於實現通道容量,為現今編碼理論的突破,而接續消除(successive-cancellation, SC)解碼為最基本的解碼方式,接續消除列表(successive-cancellation list, SCL)解碼可以改善SC解碼的更正能力,為現有解碼方案中主要做法。另一方面,簡化接續消除(simplified successive-cancellation, SSC)解碼中利用比率-0(rate-0)節點和比率-1(rate-1)節點特性來減少解碼週期。
    NAND型快閃記憶體因其高通量和低功率特性,廣泛應用在儲存裝置。其中如何為持資料可靠性為重要的課題。
    本論文將極化碼應用於快閃記憶體,實現快閃記憶體的特性與極化碼解碼方式來比較性能表現。本論文提出改變極化碼位元排列的方法,為了將訊息位元和凍結位元交換後達到降低解碼延遲的效果,同時要考量對性能的影響。
    本文針對(1024,922)極化碼改變位元排列並應用於快閃記憶體中,使用量化軟決策和SC解碼方式。改變位元排列後,解碼延遲可以減少19.56%,快閃記憶體使用壽命則從19.5K P/E cycles降到18K P/E cycles。

    Polar codes are the latest breakthrough in coding theory, as they provably achieve the channel capacity. Successive-cancellation (SC) decoding is the basic decode method. Successive-cancellation list (SCL) decoding can improve the correction ability of SC decoding, which is the main method in the existing decoding scheme. Rate-0 and rate-1 nodes are used to reduce the decoding cycles in simplified successive-cancellation (SSC) decoding.
    NAND flash memory has been widely used for data storage due to its high throughput and low power. How to maintain the data reliability is an important issue.
    We apply polar codes to flash memory. We implement the characteristics of flash memory and polar decoding method. After that we compare the performance of different methods. We propose a method to change the bit permutation of polar codes. We exchange the location of information bits and the location of frozen bits in order to reduce the decoding cycles. Simultaneously, we need to consider the influence of performance.
    We change the bit permutation of (1024, 922) polar code and then apply it to flash memory. We use quantized soft decoding method and SC decoder to simulate. After we change the permutation, the decoding cycles can be reduced by 19.56%, and the lifetime of the flash memory is reduced from 19.5K P/E cycles to 18K P/E cycles.

    中文摘要 I Abstract II 誌謝 IX 目錄 X 表目錄 XII 圖目錄 XIII 第一章 緒論 1 1.1 研究動機 1 1.2 研究貢獻 1 1.3 論文架構 2 第二章 相關研究背景介紹 3 2.1通道極化原理 3 2.2接續消除解碼 7 2.3接續消除列表解碼 9 2.4簡化接續消除解碼 11 2.5快閃記憶體基本原理 13 2.6快閃記憶體中資料可靠度探討 17 2.6.1寫入/擦除週期之機制 18 2.6.2單元間干擾 18 2.6.3資料保存錯誤 19 2.7 極化碼應用於快閃記憶體之探討 19 第三章 快閃記憶體解碼與極化碼位元排列設計 23 3.1快閃記憶體之極化碼解碼方式 23 3.1.1 硬決策解碼 24 3.1.2 純軟決策解碼 25 3.1.3 量化軟決策解碼 26 3.2極化碼之輸入排列設計 29 3.2.1蒙地卡羅法 30 3.2.2調整極化碼位元排列方法 34 第四章 實驗環境與數據分析 46 4.1快閃記憶體通道模擬 46 4.2快閃記憶體的解碼性能比較 48 4.3不同位元排列之極化碼比較 51 第五章 結論與未來展望 54 5.1結論 54 5.2未來展望 55 參考文獻 56

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