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研究生: 顏吉秀
Yen, Chi-Hsiu
論文名稱: 基於資料探勘與影像辨識之玻璃基板切割製程的智慧品質監控與即時預警系統
An Intelligent Real-Time Quality Monitoring and Early Warning System for Glass Substrate Cutting Processes Based on Data Mining and Image Recognition
指導教授: 翁慈宗
Wong, Tzu-Tsung
學位類別: 碩士
Master
系所名稱: 管理學院 - 工業與資訊管理學系
Department of Industrial and Information Management
論文出版年: 2026
畢業學年度: 114
語文別: 中文
論文頁數: 74
中文關鍵詞: 關聯分析分類玻璃基板切割影像辨識智慧製造
外文關鍵詞: association analysis, classification, glass substrate cutting, image recognition, smart manufacturing
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  • 面板產業中玻璃基板切割製程具高度自動化,現場普遍仰賴 AOI(Automated Optical Inspection)與 EIM(Edge Inspection Machine)進行缺陷檢測,傳統品質監控多依賴靜態閾值判定與人工經驗判讀,面對製程波動、設備退化及跨製程交互影響時,難以即時掌握異常趨勢及潛在風險,尤其在長時間連續生產下,缺陷易呈現累積與擴散現象,進而影響良率與品質穩定性。為改善上述限制,本研究提出一套結合影像辨識、資料探勘與即時預警機制之智慧品質監控架構。
    本研究整合 AOI、EIM 與 EDC(Equipment Data Collection),建構多源異質資料整合流程,並透過資料清理、時間對齊與特徵萃取建立分析模型。在影像辨識層面,採用 YOLOv8 建立多類缺陷辨識模型,將原始影像轉換為具一致性之結構化缺陷特徵,以作為後續分析之輸入。在資料探勘層面,本研究以 J48 決策樹建構 OK、CF 與 NG 三類品質狀態分類模型,並結合 Severity Score、類別不平衡處理與代價敏感學習,提升模型對高風險樣本辨識能力。透過 FP-Growth 探勘缺陷之間及缺陷與製程參數之共現關係,以揭示潛在缺陷組合、設備狀態與品質風險之關聯結構。透過影像辨識、品質分類與關聯規則之整合,本研究建立由缺陷偵測、品質預測至異常解釋之完整分析流程,使系統具備預測能力、可解釋性與現場決策支援能力。
    研究結果顯示,本架構可有效整合多源資料並提升異常辨識能力。關聯規則分析指出缺陷之間具有顯著共現關係,並與設備補正與刀具磨耗狀態相關,顯示缺陷之間可能存在連鎖共現特徵,並與特定製程狀態具有關聯性。在應用層面,本研究建立以 30 分鐘為週期之即時監控與預警機制,當偵測到異常趨勢時,透過即時通訊平台發送警示,並結合視覺化儀表板呈現品質狀態,以協助工程師快速判斷與改善製程。整體而言,本研究建立多源資料整合與分析架構,並結合影像辨識與資料探勘方法,使系統同時具備品質預測與異常解釋能力,進一步發展具即時預警功能之品質監控系統,提升製程監控即時性與決策效率,並展現其於智慧製造中由事後檢測轉向事前預防之實務價值。

    The glass substrate cutting process in the flat panel display industry relies heavily on Automated Optical Inspection (AOI) and Edge Inspection Machine (EIM) systems for defect detection. Traditional quality monitoring methods based on static thresholds and manual interpretation are often insufficient for identifying abnormal trends caused by process variation and equipment degradation. To address these limitations, this study proposes an intelligent quality monitoring framework integrating image recognition, data mining, and real-time early warning mechanisms. The data collected from AOI, EIM, and Equipment Data Collection (EDC) systems were processed by data cleaning, temporal alignment, and feature extraction. Decision tree learning combined with severity score, class imbalance handling, and cost-sensitive scheme was employed for classification when products are categorized as pass, conditional pass, and fail. FP-Growth algorithm was further applied to identify associations among defect types and process conditions. The experimental results demonstrate that the proposed framework effectively enhances anomaly detection and supports quality prediction and interpretation. A real-time monitoring mechanism with a 30-minute decision cycle was implemented to provide timely alerts and visualized decision support. The proposed framework not only facilitates proactive quality management, but also improves monitoring efficiency in smart manufacturing applications.

    摘要 I 誌謝 V 目錄 VI 表目錄 VIII 圖目錄 IX 第一章 緒論 1 1.1 研究背景與動機 1 1.2 研究目的 3 1.3 論文架構 3 第二章 文獻回顧 5 2.1 面板業玻璃基板缺陷檢測背景與研究架構 5 2.2 玻璃基板缺陷成因探討 6 2.3 製程與缺陷影響因子 7 2.4 YOLO 應用於影像辨識缺陷 8 2.5 資料探勘方法 11 2.5.1 分類 11 2.5.2 關聯規則探勘 13 2.6 評估測度 15 2.6.1 分類方法評估測度 15 2.6.2 關聯性規則評估測度 17 2.7 應用文獻 17 2.8 小結 18 第三章 研究方法 20 3.1 研究流程與整體架構 20 3.2 資料蒐集與整併 22 3.3 資料預處理 23 3.4 影像辨識模型建構 24 3.5 資料探勘分類分析與關聯規則 26 3.6 視覺化整合與即時預警 30 第四章 實證分析 32 4.1 資料來源與預處理 32 4.2 YOLOv8 缺陷辨識模型 33 4.3 FP-Growth 關聯規則分析 35 4.3.1 EIM 邊緣缺陷關聯規則分析結果 36 4.3.2 AOI 缺陷關聯規則分析結果 39 4.4 J48 分類方法分析 43 4.5 即時預警系統 50 4.6 跨模型整合分析與討論 54 第五章 結論與建議 55 5.1 研究結論 55 5.2 研究限制 56 5.3 未來研究建議 58 參考文獻 60

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