研究生: |
陳靜怡 Chen, Chien-Yi |
---|---|
論文名稱: |
氧化鋅中介層對ITO透明導電膜性質之影響 Effect of ZnO Interlayer on the Growth Characteristics and Properties of Transparent Conductive ITO Thin Films |
指導教授: |
洪敏雄
Hon, Min-hsiung 吳南均 none |
學位類別: |
碩士 Master |
系所名稱: |
工學院 - 材料科學及工程學系 Department of Materials Science and Engineering |
論文出版年: | 2002 |
畢業學年度: | 90 |
語文別: | 中文 |
論文頁數: | 84 |
中文關鍵詞: | 銦錫氧化物 、氧化鋅 、透明導電膜 |
外文關鍵詞: | ITO, ZnO |
相關次數: | 點閱:54 下載:3 |
分享至: |
查詢本校圖書館目錄 查詢臺灣博碩士論文知識加值系統 勘誤回報 |
本研究利用射頻磁控濺鍍法,分別於康寧玻璃Code 1737F及預鍍ZnO中介層的康寧玻璃上沉積ITO透明導電膜。探討製程參數對ITO膜性質之影響,及ZnO中介層的厚度與結晶性對ITO膜之結構、電性及可見光穿透率之影響。
實驗結果顯示,提高射頻功率、降低工作壓力、增加基板溫度,在低氧分壓及適當厚度下能提高ITO薄膜的導電性。提高射頻功率及降低工作壓力,ITO薄膜傾向以[400]為優選方向;提高氧分壓、增加沉積時間及基板溫度則以[222]為優選方向。
在添加中介層的實驗中發現:ZnO中介層對ITO薄膜[222]擇優取向有強化的作用,結晶性ZnO中介層有助於提昇ITO薄膜之結晶性,但ZnO中介層厚度對ITO薄膜性質的影響並不明顯。以ZnO中介層為基材,提高基板溫度與ITO鍍膜厚度可進一步強化ITO[222]之優選方向。在電性方面,ZnO中介層稍微降低了ITO薄膜之電阻率,若結合適當的ITO膜厚度(140~280nm)及基板溫度(250~350℃),可得到較低的電阻率,約為6.83×10-4Ω·cm。添加ZnO中介層對複合膜之可見光穿透率之影響不大,其穿透率皆在80﹪以上。
Transparent conducting indium tin oxide (ITO) thin films were deposited on both blank glass and ZnO-coated glass (Corning 1737) by RF magnetron sputtering. Two main issues were investigated. One part was the process parameter effects on the characteristics of indium tin oxide thin films. The other was the dependence of structure, electrical, and optical properties of ITO thin films deposited on ZnO-coated substrate on the thickness and crystallinity of ZnO interlayer.
The experimental results showed that the conductivity of ITO thin films increased at high sputtering power, low working pressure, higher substrate temperature, low oxygen pressure, and optimum thickness. The (400) preferred orientation appeared at high sputtering power and low working pressure. The (222) orientation increased as oxygen pressure, deposition time and substrate temperature were increased.
The experimental results showed that the ITO thin films favored (222) orientation as ZnO interlayer was applied. The crystallinity of ITO thin films increased as the crystallinity of ZnO interlayer increased. The ZnO interlayer thickness did not have significant effect on the properties of ITO films. As a thin ZnO interlayer was applied, the degree of ITO (222) preferred orientation increased with the increase of substrate temperature and ITO film thickness. For electrical property, the resistivity of ITO films decreased as ZnO interlayer was applied. The lowest resistivity of 6.83×10-4Ω·cm was obtained for ITO films deposited on ZnO/glass substrate in the conditions of an appropriate combination of ITO thickness (about 140-280nm) and substrate temperature (250~350℃). The ITO films on ZnO/glass substrate obtained showed a visible transmittance above 80%.
參考文獻
1. 李玉華, “透明導電膜及其應用”,科儀新知,第十二卷第一期,(1990)94。
2. F. Zhu, C. H. A. Huan, K. Zhang and A. T. S. Wee, “Investigation of Annealing Effects on Indium Tin Oxide Thin Films by Electron Energy Loss Spectroscopy”, Thin Solid Films, 359(2000) 244.
3. K. Zhang, F. Zhu, C. H. A. Huan and A. T. S. Wee, “Effect of Hydrogen Partial Pressure on Optoelectronic Properties of Indium Tin Oxide Thin Films Deposited by Radio Frequency Magnetron Sputtering Method”, J. Appl. Phys., 86(1999) 974.
4. L. J. Meng and M. P. dos Santos, “Properties of Indium Tin Oxide (ITO) Films Prepared by r.f. Reactive Magnetron Sputtering at Different Pressures”, Thin Solid Films, 303(1997) 151.
5. X. W. Sun, L. D. Wang and H. S. Kwok, “Improved ITO Thin Films with a Thin ZnO Buffer Layer by Sputtering”, Thin Solid Films, 360(2000) 75.
6. T. Ishida, H. Kobayashi and Y. Nakato, “Structures and Properties of Electron-beam-evaporated Indium Tin Oxide Films as Studied by X-ray Photoelectron Spectroscopy and Work-function Measurements”, J. Appl. Phys., 73(1993) 4344.
7. R. B. H. Tahar, T. Ban, Y. Ohya and Y. Takahashi, “Electronic Ttransport in Tin-doped Indium Oxide Thin Films Prepared by Sol-gel Technique”, J. Appl. Phys. 83 (1998) 2139.
8. Je-Hsiun Lan and Kanicki jerzy, “ITO Surface Ball Formation Induced by Atomic Hydrogen in PECVD and HW-CVD Tools”, Thin Solid Films, 304(1997) 123.
9. Watkins-Johnsons Co, “Highly Conductive and Transparent Films of Tin and Fluorine Doped Indium Oxide Produced by APCVD”, Thin Solid Films, 221(1992) 166.
10. 溫志中,“ITO透明導電膜之濺鍍技術展望”,工業材料,166期,(2000) 140。
11. Y. Shiesato, S. Takaki and T. Haranoh, “Electrical and Structural Properties of Low Resistivity Tin-doped Indium Oxide Films”, J. Appl. Phys., 71(1992) 3356.
12. M. Higuchi, S. Uekusa, R. Nakano and K. Yokogawa, “Micrograin Structure Influence on Electrical Characteristics of Sputtered Indium Tin Oxide Films”, J. Appl. Phys., 74(1993) 6710.
13. A. K. Kulkarni, K. H. Schulz, T. S. Lim, M. Khan, “Dependence of the Sheet Resistance of Indium-tin-oxide Thin Film on Grain Size and Grain Orientation Determined from X-ray Diffraction Techniques”, Thin Solid Films, 345(1999) 273.
14. L. J. Meng and M. P. dos Santos, “Properties of Indium Tin Oxide Films Prepared by R.F. Reactive Magnetron Sputtering at Different Substrate Temperature”, Thin Solid Films, 322(1998) 56.
15. K. Tominaga, T. Ueda, T. Ao, M. kataka and I. Mori, “ITO Films Prepared by Facing Target Sputtering System”, Thin Solid Films, 281-282(1996) 194.
16. 陳柏菁,“應用於平面顯示器之ITO透明電極”,光訊,第85期,2000年8月,p.27。
17. C. H. YI, Itaru and Y. Shigesato, “Oriented Tin-Doped Indium Oxide Films on <001> Preferred Oriented Polycrystalline ZnO Films”, Jpn. J. Appl. Phys. 1, 34 (1995) 1638.
18. K. Tominaga, T. Ueda, T. Ao, M. Karaoka and I. Mori, “ITO Films Prepared by Facing Target Sputtering System”, Thin solid films, 281-282 (1996) 194.
19. E. J. Tarsa, J. H. English and J. S. Speck, “Pulsed Laser Deposition of Oriented In2O3 on (001) InAs, MgO, and Yttria-stabilized zirconia”, Appl. Phys. Lett. , 62(1993) 2332.
20. M. Kamei, T. Yamami, S. Takaki and Y. Shiesato, “Heteroepitaxial Growth of Tin-doped Indium Oxide Films on Single Crystalline Yttria Stabilized Zirconia Substrates”, Appl. Phys. Lett. , 64(1994) 2712.
21. M. Kamei, Y. Shigesato, S. Takaki, Y. Hayashi, M. Sakaki and T. E. Haynes, “Electron Microscopic and Ion Scattering Studies of Heteroepitaxial Tin-doped Indium Oxide Films”, Appl. Phys. Lett.,65 (1994)546.
22. X.W. Sun, L.D. Wang, H.S. Kwok, “Improved ITO Thin Films with a Thin ZnO Buffer Layer by Sputtering”, Thin Solid Films, 360(2000) 75.
23. 林昭憲,“以電漿化學氣相沉積法蒸鍍氧化鋁薄膜之研究”,國立成功大學材料科學及工程研究所碩士論文,(1995)P.4。
24. J. Venables, “Nucleation and Growth of Thin films”, Rep. Prog. Phys., 47 (1984) 399.
25. Wyckoff and W. G Ralph., “Crystal Structure”, Vol. 2, Chap. V, Illus., (1960) P.2.
26. W. F. Wu and B. S. Chiou, “Properties of Radio-Frequency Magnetron Sputtered ITO Films without In-Situ Substrate Heating and Post-Deposition Annealing”, Thin Solid Films, 247(1994) 201.
27. H. L. Hartnagel, A. K. Jain and C. Jagadish, “ Semiconducting Transparent Thin films”, Published by Institute of Physics Publishing (1995)
28. F. El Akkad, M. Marafi, A. Punnoose and G. Prabu, “Effect of Substrate Temperature on the Structural, Electrical and Optical Properties of ITO Films Prepared by RF Magnetron Sputtering”, Phys. Stat. Sol. (a), 177(2000) 445.
29. H. Kim, J. S. Horwitz, G. Kushto, A. Pique, Z. H. Kafafi, C. M. Gilmore, and D. B. Chrisey, “ Effect of Film Thickness on the Properties of Indium Tin Oxide Thin Films”, J. Appl. Phys., 88(10) (2000) 6021.
30. B. D. Cullity, Elements of X-ray Diffraction, 2nd ed. (Additson-Wesley. Readin, MA, 1978).
31. C. V. R. V. Kumar and A. Mansinh, “Effect of Target-Substrate Distance on the Growth and Properties of Rf-sputtered Indium Tin Oxide Films”, J. Appl. Phys., 65(1989) 1270.
32. S. Muranaka, Y. Bando and T.Takade, “Influence of Substrate Temperature and Film Thickness on the Structure of Reactively Evaporated In2O3 Films”, Thin solid films, 151(1987) 355.
33. P. Thilakan and J. Kumar, “Studies on the Preferred Orientation Changes and its Influenced Properties on ITO Thin Films”, Vacuum, 48(5)(1997) 463.
34. W. F. Wu, B. S. Chiou and S. T Hsieh, “Effect of Sputtering Power on the Structural and Optical Properties of RF Magnetron Sputtered ITO Films”, Semicond. Sci. Technol. 9(1994) 1242.
35. L. J. Meng and M.P. D. Santos, “Properties of Indium Tin Oxide (ITO) Films Prepared by R.F. Reactive Magnetron Sputtering at Different Pressures”, Thin solid films, 303(1997) 151.
36. T. Minami, T. Yamamoto and T. Miyata, “Highly Transparent and Conductive Rare Earth-Doped ZnO Thin Films Prepared by Magnetron Sputtering”, Thin Solid Films, 366 (2000) 63.
37. S.Muranaka, Y. Bando and T. Takade, “Influence of Subtrate Temperature and Film Thickness on the Structure of Reactively Evaporated In2O3 Films”, Thin Solid Films 151(1987) 355.
38. 楊明輝, “金屬氧化物透明導電材料的基本原理”, 工業材料, 179期,p.134.