| 研究生: |
方俊翰 Fang, Chun-Han |
|---|---|
| 論文名稱: |
基於低成本單晶片系統除錯平台之適用於實際工業界應用之完整除錯流程 Complete Debug Procedures for Realistic Industrial Applications Based on A Low-Cost On-Chip SoC Debug Platform |
| 指導教授: |
李昆忠
Lee, Kuen-Jong |
| 學位類別: |
碩士 Master |
| 系所名稱: |
電機資訊學院 - 電機工程學系 Department of Electrical Engineering |
| 論文出版年: | 2010 |
| 畢業學年度: | 98 |
| 語文別: | 英文 |
| 論文頁數: | 69 |
| 中文關鍵詞: | 單晶片 、除錯 |
| 外文關鍵詞: | SoC, debug |
| 相關次數: | 點閱:61 下載:0 |
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隨著製程技術與設計自動化工具的快速演進,越來越多大型且複雜的電路被整合進系統單晶片。對於複雜的系統單晶片而言,即使以軟體為基礎的模擬方式驗證成功,也無法確保實際晶片是否能正常運作。因此,在產品開發的過程中,設計者常常在除錯與驗證實際晶片的階段耗費大量時間,極有可能造成產品上市時間的延誤。為了能有效節省晶片除錯及驗證的時間,晶片設計者需要一個有效且系統化的除錯方式。
在本論文中,我們以成大測試實驗室所開發的單晶片系統除錯平台為基礎,致力於將此除錯平台與業界實際環境整合。將此除錯平台整合至業界的系統單晶片環境之後,再以業界實際的矽智產電路做為除錯對象,並實現在業界的雛型驗證版上。我們也將此平台與 ARM 處理器以及 ARM CoreSight on-chip debug and trace architecture 結合,提出嶄新的除錯流程,使除錯功能更加完整。此外,我們亦結合使用者圖形介面來與此除錯平台共同運作,提供波形化顯示的方式,使用者將可更容易地觀察連續時間的硬體擷取結果,以判別實際晶片中錯誤的根本原因。實驗結果顯示所開發的除錯平台應用到業界實際電路的可行性,能有效地解決晶片的除錯問題,加速業界產品的開發過程。
With the rapid development of semiconductor technology and design automation tools, more and more designs are now integrated into a so-called system-on-a-chip (SoC). For a complicated SoC, even if we verify the designs by software-based simulation thoroughly, we still cannot assure that the real chips can work without any bug. Hence, designers usually spend much time in debugging and verifying the real chip in the developing process, which often results in the delay of time-to-market. To overcome this problem, chip designers need not only efficient but also systematic debugging architectures and procedures.
In this thesis, we integrate the SoC debug platform developed by the NCKU Test Lab with a real industrial SoC design environment. After the integration, we employ an actual industrial intellectual property (IP) core as the core under debug and then implement the whole SoC system on an industrial prototyping board. We also combine the debug platform with an ARM processor and the ARM CoreSight on-chip debug and trace architecture, and propose novel debug procedures which make the debugging functions complete and efficient. Furthermore, we combine a graphic user interface with the debug platform to support the waveform-based display which allows users to observe the successive traced results of hardware easily to identify the root-cause of failures in the real chip. Experimental results show that the developed debug technology not only deals with the chip debugging problems efficiently but also accelerate the developing process of industrial products.
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校內:2015-08-30公開