在本論文中，我們提出了一個診斷向量產生流程，目的在於可以在少量的診斷向量讓非等效延遲轉換錯誤之間有不同的輸出響應，並且能有效的辨認是否延遲轉換錯誤之間為等效錯誤。這流程主要由兩個主要的方法組成。第一個基於使用者自訂錯誤失活方法(user-defined-fault-based inactivation method)能把分開延遲轉換錯誤之間的問題轉換成偵測一堆使用者自訂的錯誤，並且所有的錯誤能同時被一次自動向量生成軟體產生。第二個統一錯誤對轉換方法能(unified fault-pair transformation method)把兩個延遲轉換錯誤的分開問題轉換成偵測一個延遲轉換錯誤，並且一樣能處理這些錯誤經由一次的自動向量生成軟體產生。藉由這兩個方法我們可以得到少量的診斷向量。當自動向量生成軟體的回溯次數太少時，會有少數的錯誤對沒辦法被上述兩個方法處理。我們利用布林可滿足方法來處理那些錯誤對，而辨識結果都是等效錯誤對。我們利用ISCAS’89和IWLS’05電路進行實驗，結果顯示我們能辨認這兩類電路所有的延遲轉換錯誤，讓可分開的錯誤能有不同的響應或者辨認錯誤是否為等效錯誤。

In this thesis, we presents a diagnosis pattern generation procedure that not only can generate very compact diagnosis patterns to distinguish nonequivalent transition faults, but also can identify equivalent transition faults efficiently. This procedure mainly consists of two major methods. The first one is a user-defined-fault-based inactivation method (UDFIM) that transforms the problem of distinguishing all transition faults into that of detecting a set of user-defined faults (UDFs) and then deals with all these faults at a time by using an ATPG tool. The second one is a unified fault-pair transformation method (UFPTM) that transforms the problem of distinguishing two transition faults into the problem of detecting a transition fault and then process all these faults also in one ATPG run. By these two methods, very compact diagnosis pattern sets can be obtained. For the very few fault pairs that cannot be handled by these two methods when the backtracking limit of ATPG is low, we employ a SAT-based method to deal with these pairs and show that they are all equivalent-fault pairs. Experimental results on ISCAS’89 and IWLS’05 benchmark circuits show that this is the first work that can distinguish all distinguishable transition faults and identify all equivalent transition faults for ISCAS’89 and IWLS’05 benchmark circuits.

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