在本論文中，利用微量添加（0.25wt%~1wt%）的CuO和WO3的微量添加，來觀察對燒結及微波特性的影響。結果顯示，微量添加CuO和WO3，確實對BMT陶瓷的燒結和微波特性有明顯的影響。而添加CuO，從X-Ray上並沒有發現二次相的存在；但是相反的，而添加WO3的結果，從X-Ray就發現了二次相。添加CuO 0.5wt%燒的結溫度與持溫時間分別為1470 OC和4hr時，BMT材料的εr為24.2，Q x f值為173000，τf為1.5ppm/OC，理論密度為95%；而添加WO3 0.5wt%時，燒結溫度與持溫時間分別為1370 OC和4hr時，εr為24，Q x f值為148320，τf為1ppm/OC，理論密度為95%。
在本論文的另外一個部分是利用同軸型共振器，實現交錯耦合濾波器，使其頻率響應的波形擁有優良的止帶響應，在實驗上，藉著相互接觸的面來進行耦合，而共振器的頻率，相互之間的耦合係數，還有external Q 在設計時都必須精確的考量，最後再把四級組合起來，形成交錯耦合濾波器。結果顯示，濾波器表現出好的止帶響應和低的插入損。

The effect of CuO and WO3 addition on the microstructures and the microwave dielectric properties of barium magnesium tantalate Ba(Mg1/3Ta2/3)O3 ceramics has been investigated. It is found that low level-doping of CuO and WO3 (up to 1 wt%) can significantly improve their sintering and microwave dielectric properties. The second phase was not observed for ceramics with 0.25 to 1 wt% CuO additions. Respectively, the second phase was observed for ceramics with 0.25 to1 wt% WO3 additions. The nonloaded quality factors Q and sintering temperature were effectively promoted by CuO and WO3 addition. The value of 24.2 and 24, Q×f value of 173000 and 148000 (at 10 GHz) and value of 1.5 and 1 ppm/oC were obtained for Ba(Mg1/3Ta2/3)O3 ceramics with 0.5 wt% CuO addition sintered at 1470oC for 4 h, and 0.5 wt% WO3 addition sintered at 1370oC for 4 h.
On the other hand , this paper use cross-coupled mechanism to design a coaxial microwave filter which has better performance. The coupling of the electromagnetic energy is designed with a concept that is coupled to each other through apertures which were formed on the out side of the resonators. The resonator frequency of each resonator, coupling coefficients between adjacent resonators, and the external Q at both ends were adjusted before assembly. Finally, the microwave filter using corss-coupled has good performance in stop band and insertion loss.

[1].S. Nishigaki, H. Kato, S. Yano and R. Kamimure: Am. Ceram. Soc. Bull. 66 (1987) 1405.
[2].K. Wakino, K. Minai and H. Tamura: J. Am. Ceram. Soc. 67 (1984) 278.
[3].T. Takada, S. F. Wang, S. Yoshikawa, S. J. Yang and R. E. Newnham: J. Am. Ceram. Soc. 77 (1994) 1909.
[4].S. Kawashima, M. Nishida, I. Ueda and H. Ouchi ; J. Am. Ceram. Soc. 66 (1983) 421.
[5].K. Endo, K. Fujimoto and K. Murakawa ; J. Am. Ceram. Soc. 70 (1987) C215.
[6].H. Matsumoto, H. Tamura, K. Wakino, Jpn. J. Appl. Phys. 30 (1991) 2347.
[7].K. H. Yoon, D. P. Kim and E. S. Kim, J. Am. Ceram. Soc. 77 (1994) 1062.
[8].H. J. Youn, K. K. Kim, H. Kim, Jpn. J. Appl. Phys. 35 (1996) 3947.
[9].S. Nomura, K. Toyama, K. Kaneta, Jpn. J. Appl. Phys. 21 (1982) L624.
[10].C. L. Huang and M. H. Weng, Mater. Res. Bull. 35 (2000) 1881.
[11].D. W. Kim, K. H. Ko and K. S. Hong, J. Am. Ceram. Soc. 84 (2001) 1286.
[12].B. W. Hakki and P. D. Coleman, IEEE Trans. Microwave Theory & Tech. 8 (1960) 402.
[13].W. E. Courtney, IEEE Trans. Microwave Theory & Tech. 18 (1970) 476.
[14].邱碧秀：電子陶瓷材料 徐式基金會出版,p.81,1997
[15].G.Burns:Solid State Physics p.461,1985
[16].K.Wankino,H.Murata,H.Tamura: J.Am.Cream.Soc.,Vol.69,pp34, (1986)
[17].W.E.Courtney:IEEE.Trans.MTT,Vol.MTT-8,pp.476-485,1970
[18].David K.Cheng”Field and Wave Electromagnetic”pp407-412,1989
[19].D.Kajfez”Computed Modal Field Distribution for Isolated Dieletric Resonators”IEEE.Trans.MTT,Vol.MTT-32,pp.1609-1616,1984
[20].D.Kajfez”Basic Principle Give Understanding of Dielectric Wave- guides and Resonators”Microwave System News,Vol.13,pp.152-161 ,(1983)
[21].D.Kajfez and P.Guillon”Dielectric Resonators”,1989
[22].W.J.Huppmann and G.Petzow”The Elementary Mechanisms of Liquid Sintering”,Sintering Processes,Plenum Press,pp.189-202, (1979)
[23].H.S.Cannon and F.V.Lenel in “Proceedings of the Plansee Seminar”, Edited by F.Benesovsky Metallwerk Plansee,Reutte,p.106,1953
[24].V.N.Eremenko,Y.V.Naidich and I.A.Lenko,”Liquid (Consolation New York,1970,ch4)
[25].K.S.Hwang,Phd Thesis,Rensselaer Ploytechnic in Troy(1984)
[26].J.W.Cahn and R.B.Heady,J.Am.Ceram.pp.406,1970
[27].W.J.Huppmann and G.Petzow:Sintering process,Edited by G.C.
Kuczynski(Plenum Press,New York,pp.189,1980)
[28].W.J.Huppmann and G.Petzow,Ber.Bunnsenges Phys.Chem.82,
pp.308(1978)
[29].R.M.German:Liquid Phase Sintering,(Plenum Press, New York 1985,ch4)
[30].J.H.Jean and C.H.Lin:J.Mater.Sci.24,pp500,1989
[31].Y.Kobayashi and N.Katoh”Microwave Measurement of Resonator Method”IEEE.Trans.MTT,Vol.MTT-33,pp586-592,1985
[32].B.W.Hakki and P.D.Coleman”A Dielectric Resonator Method of Measuring Inductive Capacities in the Millimeter range”IEEE.Trans.MTT,Vol.MTT-8,pp.402-410,1960
[33].O.V.Karpova:Soviet Phys.Vol.1,pp.220,1959
[34].S.H.Cha:IEEE.Trans.MTT,Vol.MTT-33,pp.519,1985
[35].P.Wheless and D.Kajfez”The Use of Higher Resonant Modes in Measuring the Dielectric Constant of Dielectric Resonators”IEEE.MTT-S,Symposium Dig.pp.473-476,1985
[36].Y.Kobayashi and S.Tanaka”Resonant Modes of a Dielectric Resonator Short-Circuited at Both Ends by Parallel Conducting
Plates”IEEE.Trans.MTT,Vol.MTT-28,pp.1077-1085,1980
[37].E.L.Ginztin”Microwave Measurement”pp.403-405,1957
[38].T.Higashi and T.Makino”Resonant Frequency Stability of the
Dielectric Resonator on a Dielectric Substrate”IEEE.Trans.MTT, Vol.MTT-29,pp.1048-1052,1981
[39]R.L.Geiger,P.E.Allen,N.R.Strader, “VLSI Design Techniques for Analog and Digital Circuits” ,McGraw-Hill,p.674-685,1990
[40] J.S.Hong and M.J.Lancaster “Couplings of Microstrip Square Open- Loop Resonators for Cross-Coupled Planar Microwave Filters” ,IEEE Transactions on Microwave Theory and Techniques,vol.44,p.2099- 2109,1996
[41]J.Helszajn “Microwave Engineering: Passive, Active, and Non-
reciprocal Circuits.” ,McGraw-Hill,1992
[42]J.S.Hong and M.J.Lancaster ”Design of Highly Selective Microstrip Bandpass Filters with a Single Pair of Attenuation Poles at Finite Freqencies” IEEE Transactions on Microwave Theory and Techniques ,vol.48,p.1098-1107,2000
[43]P. Wheless and D.Kajfez,IEEE.MTT-S ,Symposium Dig. ,p.473-476,1985
[44]B.W.Hakki and P.D.Coleman,IEEE.Trans.MTT ,vol.MTT- 8 ,p.402-410,1960
[45]Y. Kobayashi and S.Tanaka, IEEE.Trans.MTT,vol.MTT-28,p. 1077-1085,1980
[46]江國豪 “LaAlO3陶瓷微波特性之研究” ,2001