| 研究生: |
胡邵喻 Hu, Shao-Yu |
|---|---|
| 論文名稱: |
電化學分析應用於半導體銅金屬化與銅化合物薄膜太陽能電池電沈積之探討 Investigation of electrochemical analyses applications on electrodeposition of semiconductor Cu metallization and thin film solar cell of Cu compounds |
| 指導教授: |
李文熙
Lee, Wen-Hsi |
| 共同指導教授: |
王英郎
Wang, Ying-Lang |
| 學位類別: |
博士 Doctor |
| 系所名稱: |
電機資訊學院 - 電機工程學系 Department of Electrical Engineering |
| 論文出版年: | 2012 |
| 畢業學年度: | 100 |
| 語文別: | 英文 |
| 論文頁數: | 208 |
| 中文關鍵詞: | 電化學 、銅電鍍 、添加劑 、太陽能電池 |
| 外文關鍵詞: | Electrochemical, Cu electrodeposition, Additive, Solar cell |
| 相關次數: | 點閱:101 下載:25 |
| 分享至: |
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本論文主要是利用電化學分析方法來研究半導體製程銅金屬化以及銅化合物薄膜太陽能電池吸收層的電沈積,藉此研究電沈積的機制來改善製程條件。由於電沈積優異的填孔能力以及高生產量,使其很有潛力成為成長金屬與半導體薄膜的方法,由於適合大面積生產以及無真空環境的需求讓他可以實現低成本的量產,但是要將其應用在先進的薄膜製程上有許多挑戰。
銅已經被廣泛應用在製造超大型積體電路的金屬導線,而由於在雙大馬士革結構中優秀的填洞能力以及高速的沈積效率使得電沈積成為製作銅金屬導線的主要工具,為了提升大馬士格法的填洞能力,需要使用許多添加劑來達到超級填充(superfilling)的高性能, 因此添加劑的行為探討是很重要的課題,添加劑裂解行為造成化學機械研磨後的缺陷數增加也在文中被探討。一些濕式接觸導通的電鍍機台需要透過反電鍍的步驟來維持接觸點的導電能力,然而電鍍液的組成對此步驟的效率有很大的影響,本文中利用各種電化學分析如動態極化法、循環伏安法、線性掃瞄伏安法、電化學交流組抗分析作為主要的研究工具來探討電鍍溶液的成分。
電沈積也是沈積複和材質的主要技術,他相對有高真空需求的技術來說有極佳的生產優勢,因此電沈積被應用於發展太陽能光電,二硒化銅銦(CIS)在薄膜太陽應用上頗受矚目,單步驟電沈積是生產CIS薄膜很有潛力的技術,但是三元素的電鍍液組成不易控制,電位的影響限制了各成分的濃度比例,線性掃瞄伏安法是用來研究銅銦硒競爭以及添加劑效用的重要方法,在傳統的方式,溶液濃度被相對的電壓控制來達到特定原子比例的CIS薄膜,而脈衝電鍍提供一種調整CIS薄膜原子比例的方式且可進一步提升薄膜品質。本論文用電化學分析的手法研究各種電鍍參數的機制並且可作為改善製程參數的索引。
In this thesis, electrochemical analyses were used to investigate the mechanism of electrodeposition process of semiconductor Cu metallization and thin film solar cell of Cu compounds. Electrodeposition is a promising method for forming metal and semiconductor thin films due to its excellent gap-filling capacity and high throughput. Low cost mass production can be achieved because of large area plating under non-vacuum circumstances. However, there are several challenges of applying electrodeposition to advanced thin film production.
Copper (Cu) has been used as the interconnection metal in the manufacturing of ultra-large-scale integrated devices (ULSI). Electroplating has been employed to form fine Cu interconnects due to its excellent gap-fill capability and high deposition rate for dual-damascene structures. In order to fill up the damascene structure, many additives are used to improve the performance of superfilling. The mechanisms of the additives are popular topics. The byproducts of additives which cause Cu defects after a chemical-mechanical-polishing (CMP) process were also investigate. Some plating devices, which use wetting-type wafer contact, require a deplating process to maintain the conductivity of the contact. The compositions of the plating solutions affect the deplating speed of the contact. Electrochemical analyses, such as potentiodynamic (PD) polarization, cyclic-voltammetry stripping (CVS), linear scan voltammetry (LSV) and electrochemistry impedance spectroscopy (EIS), are the major tools to investigate the composition of plating electrolytes.
Electrodeposition is a major technology to deposit complex metallic layers. It is scalable at low cost as compared to technologies requiring high vacuum. Therefore, electrodeposition has been developed for the applications of photovoltaics. CuInSe2 (CIS) has been spotlighted for its applications in thin film solar cells. Single step electrodeposition is the most promising electrochemical technique to produce the CIS film for solar cell applications. However, the composition of the CIS film is hard to control in a ternary solution. The variation of electrolyte concentrations is restricted for single potential electrodeposition. LSV is an important method to investigate the influences of additives and the competitions of the three Cu/In/Se. In the conventional deposition, the concentrations of electrolytes are restricted due to the correspondent plating potential of each ion to achieve a specific atomic ratio of the CIS film. A pulsed electrodeposition was used in the CIS deposition to improve the film quality and adjust the atomic ratio of the CIS film. Electrochemical analysis is an important tool to investigate the mechanism of electrodeposition process. It is also an index to improve the plating parameter.
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