本論文探討IGBT受到電氣過應力與熱應力衝擊後的可靠度變化情況，並分析不同的閘極驅動條件，對於損失、溫度與運作壽命的影響。
由於馬達驅動器中的IGBT於生產線或應用端時，可能會受到電氣過應力或熱應力衝擊而損傷，並導致馬達驅動器的生產良率或耐用性下降，因此，本論文參照實際案例，對IGBT進行突波電流、靜電放電與熱應力的衝擊，並以雙脈衝檢測、漏電流檢測與導通電壓檢測，進行可靠度診斷。
從可靠度診斷的結果發現，IGBT受到突波電流與靜電放電衝擊時，其損傷較不明顯，而受到熱應力衝擊時，則有明顯受損的跡象，故本論文接著透過調高閘極驅動電壓，減少開關的切換損與導通損，以降低開關受到的熱衝擊，並經由實測得證，此方式可降低IGBT的操作溫度，並延長開關運作壽命，其有助於提升馬達驅動器的耐用性。

In this thesis, changes in the reliability behavior of an IGBT as it encounters electrical overstress or thermal stress are studied, and the influence of different driving conditions on operating loss, temperature, and lifetime are also in-vestigated. This situation is quite common in IGBT-embedded motor drives and can degrade the durability of these drives. Therefore, the actual conditions that IGBTs encounter were examined, including the inrush current, electro-static discharge, and the impacts of thermal stress. After conducting the aforementioned experiments on the IGBTs, several diagnoses of the IGBT, such as double pulse, leakage current, and conduction voltage tests were car-ried out. The experimental results showed that impacts on the IGBT due to the inrush current and electrostatic discharge are minor, but are heavily affected by thermal stress. To mitigate such impacts, a temporal increase in the gate drive voltage is proposed to reduce the switching loss and conduction loss, in turn reducing the impact of thermal stress. The experimental results also con-firmed that the aforementioned method reduced the operating temperature of the IGBT, in turn extending the durability and lifetime of the motor drive.

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