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研究生: 潘韋翰
Pan, Wei-Han
論文名稱: 具數位輸出之全新電壓型類比乘法器
Novel Voltage-mode Analog Multiplier with Digital Output
指導教授: 魏嘉玲
Wei, Chia-Ling
學位類別: 碩士
Master
系所名稱: 電機資訊學院 - 電機工程學系
Department of Electrical Engineering
論文出版年: 2020
畢業學年度: 109
語文別: 中文
論文頁數: 56
中文關鍵詞: 類比乘法器數位乘法器電壓型乘法器
外文關鍵詞: Analog multiplier, Digital multiplier, Voltage-mode multiplier
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  • 類比乘法器至今已被用於許多的應用上,像是:通訊調變、影像處理。乘法器通常需要與其他電路做結合,因此與其他電路之相容性對於一個乘法器來說非常重要。基於此,本論文提出一個全新架構的乘法器,此乘法器能實現兩個電壓之間的乘法運算,且將結果直接轉為數位輸出。換句話說,此架構之乘法器結合了一個類比乘法器與一個類比數位轉換器(Analog-to-Digital Converter)的功能。
    本晶片採用台灣積體電路公司(TSMC)0.18μm 1P6M混和訊號製程製作,以32 S/B封裝,包含PAD部分的晶片總面積為953×823 μm2。此電路量測平均誤差在0.89%、最大誤差為1.63%。此外,在1.8V之靜態功耗為252μW、最大功耗為486μW。

    Analog multipliers have been utilized in many applications, such as modulators and image processing. Since the multipliers are usually integrated with other digital circuits, an analog-to-digital converter (ADC) is commonly used to convert its analog output signal to digital codes. Therefore, a novel architecture of analog multiplier is proposed in this thesis. The proposed multiplier can realize a multiplying function of two voltages and directly convert the result into digital codes. In other words, it combines the functions of an analog multiplier and an ADC.

    The proposed chip was fabricated by TSMC 0.18μm 1P6M CMOS/MEMS mixed signal process, and the chip size is 953×823 μm2. The average error of measurement result is 0.89%. The maximal error of measurement result is 1.63%. Moreover, the quiescent and maximum power consumptions are 252μW and 486μW at 1.8V, respectively.

    第一章 簡介 1 1.1 研究動機 1 1.2 論文架構 2 第二章 乘法器的文獻探討 3 2.1 電流型乘法器 3 2.2 差動式乘法器 6 第三章 系統架構與電路設計 8 3.1 類比乘法器的架構 8 3.1.1 類比乘法器採用電壓轉換時間之方法 8 3.2 電路設計與功能介紹 9 3.2.1 Clock1脈波產生器 9 3.2.2 校正參考電壓電路改善比較器轉態點 10 3.2.3 Clock2脈波產生器 12 3.2.4 論文核心公式與設計考量 14 3.2.5 全電路運作示意圖 15 3.2.6 SR栓鎖電路 16 3.2.7 電壓轉換電流電路圖 17 3.2.8 比較器 18 3.2.9 計數器 19 3.2.10 帶差參考電壓產生器 20 第四章 電路模擬結果與佈局設計考量 21 4.1電路模擬結果 21 4.1.1 V1 × V2全電路運作之模擬說明 21 4.1.2子電路模擬 23 4.1.3 TT27℃、FF0℃、SS100℃ 之V1 × V2 線性度模擬圖 26 4.2佈局設計考量 35 4.2.1電路佈局設計 35 4.2.2晶片打線圖 36 第五章 量測結果 37 5.1量測環境 37 5.2量測結果 39 5.2.1線性度量測結果 39 第六章 結論與未來展望 52 參考文獻 55

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