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研究生: 郭拱辰
Guo, Gong-Chen
論文名稱: 具邊緣偵測影像處理功能之CMOS影像感測晶片
A CMOS Imager with an Edge-Detection Image Processing Function
指導教授: 王俊智
Wang, Ching-Chun
學位類別: 碩士
Master
系所名稱: 電機資訊學院 - 電機工程學系
Department of Electrical Engineering
論文出版年: 2006
畢業學年度: 94
語文別: 中文
論文頁數: 83
中文關鍵詞: 交換式電容電路邊緣偵測CMOS影像感測器
外文關鍵詞: Switched-Capacitor Circuits, Edge-Detection, CMOS Image Sensor
相關次數: 點閱:157下載:11
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  •   影像分割為數位影像處理中相當重要之功能,而邊緣偵測為影像分割其中之一方法。本論文提出一硬體邊緣偵測架構,利用CMOS影像感測器高度整合性之優點,實作一包含影像感測器及硬體邊緣偵測電路之影像感測晶片。此架構將邊緣偵測電路獨立於影像感測器陣列,採平行處理運算,此架構具有的優點為高動態範圍輸入、高填充率、高速,且適用於大尺寸之應用。邊緣偵測電路中採用之交換式電容電路將有助於提高運算之解析度。
      本設計採用國家晶片中心(CIC)提供之TSMC 0.35 2P4M 3.3V製程,實際下線像素陣列50x50之影像感測晶片,以驗證其邊緣偵測功能。晶片架構包含像素陣列、相關性二次取樣電路及邊緣偵測電路。晶片面積為2.36mm x 1.358mm,像素尺寸為10mm x 10mm。本晶片輸出速度可符合HDTV 1080P規格,以50x50畫面輸出,每秒666頁,所消耗之功率為26.4mW。

      Image decomposition is one of the important functions of digital image  processing, and edge-detection is an issue of image decomposition. In this thesis, a new hardware’s structure of edge-detection function has been presented. With highly integrated image system, the implemented of the imager integrate the pixel array with edge-detect hardware. The edge-detection circuits with column-parallel output are not contained in the pixel array, and that with the advantages of high dynamic range input, high fill factor, and high speed output. By implementing the edge-detection circuits with switched-capacitor amplifiers are beneficial for the resolution of the system.
      The 50x50 pixel array imager that fabricated by TSMC 0.35 2P4M 3.3V process is proposed to verify the edge-detection function. The system contains pixel array, correlated double sampling array, and edge-detection hardware. The area of each pixel is 10mm x 10mm , and whole chip occupies 2.36mm x 1.358mm. The speed specification of the chip reaches HDTV 1080P, and power consumer is 26.4mW when the output of 50x50 resolution with 666 frames per second.

    第一章 簡介...... 1 1.1 研究動機..... 1 1.2 晶片規格..... 2 第二章 文獻回顧.. 4 2.1 邊緣偵測演算法[1]..... 4 2.2 CMOS影像感測器之原理與應用..... 6 2.2.1 感光元件原理[2]......7 2.2.2 像素電路架構........ 9 2.2.3 暗電流與固定圖像雜訊[2].......13 2.2.4 二次取樣電路架構(Correlated Double Sampling, CDS)....... 15 2.3 邊緣偵測之類比電路實現 .....15 2.3.1 二次取樣相減架構[4].......... 17 2.3.2 電流模式之空間濾波運算架構[5]......... 18 2.3.3 多感光二極體像素架構[6]...... 19 2.3.4 視網膜晶片架構[7]... 20 2.4 交換式電容電路(Switched-Capacitor Circuits)...... 22 2.4.1 交換式電容放大器[9]. 22 2.4.2 採樣開關之考量[9]... 24 第三章 系統架構與電路設計..30 3.1 邊緣偵測系統架構.......30 3.1.1 邊緣偵測演算法之類比電路實現..30 3.1.2 系統架構... 32 3.2 影像感測電路..34 3.2.1 對數形式影像感測電路......34 3.2.2 相關二次取樣電路(Correlated Double Sampling, CDS)........39 3.2.3 行列選擇開關........41 3.3 運算放大器.......46 3.3.1 電路分析.......46 3.3.2 運算放大器之共模回授(Common-mode feedback)電路......49 3.3.3 運算放大器之模擬結果 ......51 3.4 比較器.......55 3.5 邊緣偵測運算電路.......58 3.5.1 遮罩運算電路與相加單元......59 3.5.2 取決對值電路.........65 3.5.3 模擬結果......65 3.6 控制時脈......67 3-7 全晶片佈局考量及封裝......68 第四章 晶片量測.......72 4.1 量測系統架構......72 4.2 晶片測試板設計.......73 4.3 FPGA之控制訊號程式......77 4.4 遮罩運算電路量測結果.......78 第五張 結論.......80 5.1 論文貢獻.......80 5.2 未來展望.......80 參考論文......82

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