| 研究生: |
蔡慧嫺 Tsai, Hui-Hsien |
|---|---|
| 論文名稱: |
具可測試性架構之整合H.264/AVC二維轉換設計 Integrated 2-Dimensional Transform Designs with Design-for-Testability Scheme in H.264/AVC |
| 指導教授: |
楊家輝
Yang, Jar-Ferr 劉濱達 Liu, Bin-Da |
| 學位類別: |
碩士 Master |
| 系所名稱: |
電機資訊學院 - 電機工程學系 Department of Electrical Engineering |
| 論文出版年: | 2007 |
| 畢業學年度: | 95 |
| 語文別: | 英文 |
| 論文頁數: | 59 |
| 中文關鍵詞: | 二維轉換 、測試性 、H.264 |
| 外文關鍵詞: | H.264, 2-Dimensional Transform, testable |
| 相關次數: | 點閱:76 下載:1 |
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本論文主旨在於有效率地實現影像系統當中的離散餘弦轉換及使其能有自我測試的功能,其中包含了兩個部分,在第一個部分當中,我們針對目前H.264/AVC視訊壓縮標準的最高等級(high profile),提出了一個彈性的離散餘弦轉換架構。此架構能有效地將所有反轉換的電路架構整合在一起,並適用於H.264/AVC各等級的解碼器。此架構是利用 0.18 m之互補式金氧半製程技術,其合成的結果顯示,最快的時脈速度可達到125 MHz,可符合現行所有影像畫面所需的處理速度。而在第二部分當中,我們先針對H.264標準所訂定大小為4×4的轉換設計了一個有效測試的硬體架構。此架構是用C-testability的觀念來實現,較適用於規則性的硬體,用其觀念找出自我測試樣本,而此測試樣本並不會因為硬體架構的大小而有所改變。此架構只需八組測試樣本,就可以針對single stuck-at fault 測試模型,達到百分百的錯誤覆蓋率。
This thesis focuses on the efficient implementation of the transform coding with Design-for-Testability capability in video coding systems, including two parts. In the first part, we aim a flexible inverse transform structure at the high profile in H.264/AVC. This architecture is efficiently combined all inverse transforms together and suitable for all profile in H.264/AVC decoder. The proposed structure is synthesized with 0.18 m CMOS technology. The synthesized flexible transform architecture achieves 125 MHz clock frequency. In the second part, we firstly design a 2-D 4×4 transform architecture with a Design-for-Testability scheme for H.264/AVC. Its architecture is implemented by C-testability which fits for the more regular circuits with a constant test set regardless of the circuit size. The proposed architecture just needs eight test patterns for single stuck-at fault model to achieve 100% fault coverage.
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