| 研究生: |
簡國晉 Chien, Kuo-Chin |
|---|---|
| 論文名稱: |
應用於互補式金氧半影像感測器之十位元行並列式單斜率類比數位轉換器 A 10-bit Column-Parallel Single-Slope ADC for CMOS Image Sensor |
| 指導教授: |
王俊智
Wang, Ching-Chun |
| 學位類別: |
碩士 Master |
| 系所名稱: |
電機資訊學院 - 電機工程學系 Department of Electrical Engineering |
| 論文出版年: | 2005 |
| 畢業學年度: | 93 |
| 語文別: | 中文 |
| 論文頁數: | 97 |
| 中文關鍵詞: | 積分形式 、斜波訊號產生器 、相關二次取樣 |
| 外文關鍵詞: | integrating-type, ramp generator, correlated double sampling |
| 相關次數: | 點閱:83 下載:5 |
| 分享至: |
| 查詢本校圖書館目錄 查詢臺灣博碩士論文知識加值系統 勘誤回報 |
在本篇論文中,介紹了一個整合類比數位轉換電路於單晶片的互補式金氧半影像感測器,影像感測器的設計規格為VGA,解析度640×480像素,輸出圖像速率為每秒三十張影像。每四行影像感測單元(Pixel)共用一個類比數位轉換器,且使用可消去固定圖像雜訊的二次取樣電路作為影像訊號擷取。類比數位轉換器使用單斜率架構因電路簡單可有效節省面積與功率消耗,並且具有良好的線性度表現。
包含影像感測器與二次取樣電路及十位元之類比數位轉換器的晶片實做使用供應電源為3.3伏特的TSMC 0.18μm 1P6M CMOS製程。在一般狀況下FFT模擬結果得到有效位元為9.2位元且功率消耗為88.6mW。每個像素大小為4μm×4μm,而晶片總面積為1.0176 mm2。全晶片包含單行64個影像感測單元、16個行類比數位轉換器、時脈產生電路、帶差電流源、十位元計數器、斜波訊號產生器及輸出級緩衝電路和接腳。
A CMOS image sensor with ADC on-chip has been designed. The sensor fits VGA specification with 640×480 image sensor resolution and outputs 30 frames per second. Every four columns of image sensor share one ADC, and CDS circuits are used to sample voltage signals from the pixel array and convert it from analog to digital by the on-chip ADC. The output signal of each pixel is sampled by a Correlated-Double-Sampling circuit that is implemented with a switch-capacitor subtractor in order to eliminate fixed pattern noise and increase the accuracy. The ADC is designed using a single-slope A/D conversion topology with a high linearity and simple circuit structure to effectively reduce the chip area and power consumption.
The implementation of the 10-bit ADC with a VGA pixel array and CDS circuits adopts TSMC 0.18μm 1P6M 3.3V CMOS technology. The FFT simulation results reveals ENOB of 9.2 bits for typical condition (TT, 55℃) and power consumption is 88.6 mW. The pixel size of the on-chip pixel array is 4μm×4μm. Total chip area is 1.0176 mm2 including 64 pixels in a row, 16 column ADCs, clock generator, bandgap current reference, 10-bit counter, ramp generator, output buffers, and pads.
[1] S. Kleinfelder, S. Lim, X. Liu, A. E. Gamel, “A 10 000 Frames/s CMOS Digital Pixel Sensor,” IEEE Journal of Solid-State Circuits, vol. 36, no. 12, Dec. 2001
[2] K. B. Cho, A. I. Krymski, E. R. Fossum, “A 1.5-V 550-μW 176 × 144 Autonomous CMOS Active Pixel Image Sensor,” IEEE Transaction of Electron Device, vol. 50, no. 1, Jan. 2003
[3] R. H. Nixon, S. E. Kemeny, B. Pain, C. O. Staller, E. R. Fossum, “256 × 256 CMOS Active Pixel Sensor Camera-on-a-Chip,” IEEE Journal of Solid-State Circuits, vol. 31, no. 12, Dec. 1996
[4] Kent H. Lundberg, “Analog-to-Digital Converter Testing,” 2002
[5] K. B. Cho, A. I. Krymski, E. R. Fossum, ” A 1.2V Micropower CMOS Active Pixel Image Sensor for Portable Applications,” IEEE Solid-State Circuits Conference, Feb. 2000
[6] E. R. Fossum, “Image Capture on a System,” VLSI Technology, Systems, and Applications, Proceedings of Technical Papers, pp. 52 – 57, June 3-5, 1997
[7] H. Tian, B. Fowler, A. E. Gamal, “Analysis of Temporal Noise in CMOS Photodiode Active Pixel Sensor,” IEEE Journal of Solid-State Circuits, vol. 36, no. 1, Jan. 2001
[8] Y. De?gerli, F. Lavernhe, P. Magnan, J. Farr’e, “ Non-Stationary Noise Responses of Some Fully Differential On-Chip Readout Circuits Suitable for CMOS Image Sensors,” IEEE Transactions on Circuits and Systems-II: Analog and Digital Signal Processing, vol. 46, no. 12, Dec. 1999
[9] S. K. Mendis, , S. E. Kemeny, R. C. Gee, B. Pain, C. O. Staller, Q. Kim, “CMOS Active Pixel Sensors for Highly Integrated Imaging Systems,” IEEE Journal of Solid-State Circuits, vol. 32, no. 2, 1997
[10] A. I. Krymski, N. E. Bock, N. Tu, D. van Blerkom, E. R. Fossum, “A High-Speed, 240-Frames/s, 4.1-Mpixel CMOS Sensor,” IEEE Transactions on Electron Devices, vol. 50, no. 1, Jan. 2003
[11] A. Krymski, D. Van Blerkom, A. Andersson, N. Bock, B. Mansoorian, E.R.Fossum, “A High Speed, 500 Frames/s, 1024 × 1024 CMOS Active Pixel Sensor,” VLSI Circuits, Digest of Technical Papers, pp. 137 – 138, Symposium on 17-19 June 1999
[12] O. B. Milgrome, S. A. Kleinfelder, “A monolithic CMOS 16 channel, 12 bit, 10 microsecond analog to digital converter integrated circuit,” Nuclear Science, IEEE Transactions on vol. 40, Issue 4, pp. 721 – 723, Aug. 1993
[13] D. X.D. Yang, B. Fowler, A. E. Gamal, “A Nyquist Rate Pixel Level ADC for CMOS Image Sensors,” IEEE Journal of Solid-State Circuits, vol. 34, Issue 3, pp.348 – 356, March 1999
[14] O. B. Milgrome, S. A. Kleinfelder, M. E. Levi, “A 12 Bit Analog to Digital Converter for VLSI Applications in Nuclear Science,” IEEE Transaction on Nuclear Science, vol. 39, no. 4, 1992
[15] A. Simoni, G. Torelli, F. Maloberti, “A Single-Chip Optical Sensor with Analog Memory for Motion Detection,” IEEE Journal of Solid-State Circuits, vol. 30, no. 7, July 1995
[16] A. E. Gamel, Image Sensors and Digital Cameras, 2001.
[17] G. M. Yin, F. Op’t Eynde, and W. Sansen, “A High-Speed CMOS Comparator with 8-b Resolution,” IEEE Journal of Solid-State Circuits, vol. 27, no. 2, Feb. 1992
[18] C. Eichenberger, W. Guggenbuhl, “Dummy Transistor Compensation of Analog MOS Switches,” IEEE Journal of Solid-State Circuits, vol. 24, no. 4, Aug. 1989
[19] P. T. Balsara, CMOS Circuit Design, Spring 2005
[20] H. Tian, B. Fowler, A. E. Gamal, “Analysis of Temporal Noise in CMOS APS,” IEEE Journal of Solid-State Circuits, vol. 36, no. 1, Jan. 2001
[21] W. Yang, O. B. Kwon, J. Lee, G. T. Hwang, S. J. Lee, “An Integrated 800×600 CMOS Imaging System,” ISSCC Digest of Technical Papers, 1999
[22] A. J. Blanksby, M. J. Loinaz, D. A. inglis, B. D. Ackland, “Noise Performance of a Color CMOS Photogate Image Sensor,” Electron Devices Meeting, pp. 205 – 208, Dec. 1997
[23] K. B. Cho, A. I. Krymski, E. R. Fossum, “A 1.2V Micropower CMOS Active Pixel Image Sensor for Portable Applications,” ISSCC/Image Sensors/Technical Papers, pp. 115, 2000
[24] S. K. Hoon, J. Chen, F. Maloberti, “An Improvement Bandgap Reference with High Power Supply Rejection, ” IEEE Circuits and Systems, vol. 5, pp. 833-836, May 2002
[25] D. X. D. Yang, A. E. Gamal, B. Fowler, “ A 640×512 CMOS Image Sensor with Ultrawide Dynamic Range Floating-point Pixel-level ADC, ” IEEE Journal of Solid-State Circuits, vol. 34, no. 12, Dec. 1999
[26] J. L. Cura, D. M. Santos, “ A Novel 12-Bits, 3μs, Integrating Type CMOS Analog-to-Digital Converter, ” IEEE Proceedings XI Brazilian Symposium on 30th Sep.t-3rd, pp. 74-77, Oct. 1998
[27] B. J. McCarroll, C. G. Sodini, H. S. Lee, “ A High Speed CMOS Comparator for Use in An ADC, ” Journal of Solid-State Circuits, vol. 23, no. 1, Feb. 1988
[28] C. Eichenberger, W. Guggenbuhl, “ Dummy Transistor Compensation of Analog MOS Switches, ” IEEE Journal of Solid-State Circuits, vol. 24, no. 4, Aug. 1989
[29] S. Decker, R. D. McGrath, K. Brehmer, C. G. Sodini, “ A 256×256 CMOS Imaging Array with Wide Dynamic Range Pixels and Column-Parallel Digital Output,“ IEEE Journal of Solid-State Circuits, vol. 33, no. 12, Dec. 1998
[30] http://www.play-hookey.com/digital/
[31] L. Luh, J. Choma Jr., J. Draper, “ A High-Speed High-Resolution CMOS Current Comparator,” Electronics, Circuits and Systems, 1999. Proceedings of ICECS '99, vol. 1, pp. 303-306, 1999
[32] B. Razavi, “Principles of Data Conversion System Design, ” IEEE Press
[33] P. Mandal, V. Visvanathan, “ A Self-Biased High Performance Folded Cascode CMOS Op-Amp , ” IEEE 10th International Conference on VLSI Design, Jan. 1997
[34] K. Bult, J. G. M. Geelen, “ A fast-Settling CMOS Op Amp for SC Circuits with 90dB DC Gain, ” IEEE Journal of Solid-State Circuits, vol. 25, no. 6, Dec. 1990
[35] 湯小慧, “金氧半影像感測陣列固定圖像雜訊消除電路之設計,” 國立清華大學 碩士論文, 民國九十二年六月