| 研究生: |
陳鎮宇 Chen, Zhen-Yu |
|---|---|
| 論文名稱: |
基於深度學習之電子實驗教學引導及評分方法 Learning Guide and Grading Method of Electronic Experiments Base on Deep Learning |
| 指導教授: |
賴槿峰
Lai, Chin-Feng |
| 學位類別: |
碩士 Master |
| 系所名稱: |
工學院 - 工程科學系 Department of Engineering Science |
| 論文出版年: | 2021 |
| 畢業學年度: | 109 |
| 語文別: | 中文 |
| 論文頁數: | 50 |
| 中文關鍵詞: | 深度學習 、電腦視覺 、物件辨識 |
| 外文關鍵詞: | Deep learning, Computer Vision, Object Detection |
| 相關次數: | 點閱:229 下載:0 |
| 分享至: |
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在國內的「教育4.0」政策的實施之際,藉由科技輔助學習來達成自我學習的現象日漸普遍。而電子電路實驗就非電機電子領域之學習者而言,並非容易入門之領域,而就電機電子本科系之師生而言,電子電路實驗之時間與人力上的負擔則較為沉重,複雜的實驗於評分階段並無法輕易完成,往往教師的評分便會由實驗能否運作作為評分之依據,造成分數非0即100之現象,因此該門學科常出現學生不易學習且教師不易審評之棘手問題。
得益於近幾年電腦視覺系統發展之勢,本研究之方法旨在利用電腦視覺系統改善電子電路實驗學習及審評不易之現況,利用Yolo即時影像辨識系統完成各種元件辨識及定位接著透過一連串演算法比對出學習者所操作之實驗評分,並且針對環境之雜訊進行影像之正規化,將電路板之影像進行分割與映射,於充滿各種元件的實驗環境依舊可以進行辨識、比對等流程。
於方法中亦利用語意之嵌入以及LSTM之深度神經網路對電子實驗種類進行分類,在教學雙方無法於當下取得實驗精簡電路圖之情況下利用電子實驗之元件種類及數量分辨出實驗項目,並進一步對其進行評分,以及向使用者告知元件有無缺失,是否該補上或移除缺少或多餘之元件。利用電腦視覺系統、深度神經網路以及一系列演算法達成科技輔助教育之目的。
With the implementation of the "Education 4.0" policy in Taiwan, it is becoming increasingly common to use technology to assist learning to achieve self-learning. For non-electrical and electronic students, electronic circuit experiments are not an easy field to enter, and for electrical and electronic faculty and students, the time and labor burden of electronic circuit experiments is relatively heavy. The subject is often difficult for students to learn and teachers to evaluate.
This study aims to improve the learning and evaluation of electronic circuit experiments by using computer vision systems, which have been developed in recent years. The image of the circuit board is divided and mapped, and the process of recognition and comparison can still be performed in an experimental environment full of various components.
The method also uses semantic embedding and deep neural networks of LSTM to classify the types of electronic experiments, and to distinguish the types and numbers of components of electronic experiments, and to further score them, and to inform the user whether there are missing components, and whether to replace or remove missing or redundant components. Computer vision systems, deep neural networks, and a series of algorithms are used to achieve the goal of technology-assisted education.
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