本篇論文提出了一種只需要單一掃描輸入之高效率測試資料壓縮方案，能夠以低面積成本實現低測試資料量。我們還提出了一種新的解壓縮器配置決策程序來決定解壓縮器的測試配置，以確保解壓縮器能提供高測試覆蓋率。此外，我們設計了一個fixed-to-fixed X-masking解碼器以及解壓縮器配置控制器，來進一步減少每個測試向量額外所需的控制資料量與測試時間。在多個基準電路下的實驗結果確認所提出的方案相對於現有的測試資料壓縮技術在測試資料量、測試覆蓋率以及面積開銷方面的優化效果。

This paper proposed an efficient test data compression scheme that can achieve low test data volume with a low area cost and only needs a single scan input. A novel configuration determination procedure is proposed to determine the appropriate test configurations of the test decompressor to ensure high test coverage. Furthermore, a fixed-to-fixed X-masking integrated decoder and configuration controller are designed to reduce additional control bits and cycles of each test pattern. The experimental results with benchmark circuits confirm the optimized effectiveness for test data volume, test coverage, and area overhead of the proposed scheme over existing techniques.

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