本研究提出一套適用於產品測試天線量測系統，並以操作於 Ku 波段的陣列反射面作為系統核心。透過各個反射單元之間的相位補償設計，將饋源天線所產生的球面波轉換為指定觀測區域內的近似平面波，進而形成可供天線量測使用的有效靜區。
為評估所形成的有效靜區範圍，本研究結合機械手臂利用平面量測方法，以 0.39λ 的取樣間距，量測 30 cm × 30 cm 觀測平面內的振幅與相位分布。實驗結果顯示，所設計之陣列反射面可形成約占陣列反射面總面積 50% 的有效靜區。
此外，本研究進一步將陣列反射面整合至縮距遠場天線量測架構，並分別以線性極化天線、圓極化天線及陣列天線進行系統驗證。量測結果顯示，該系統於不同極化條件下皆能獲得穩定且合理的量測結果，證實其具備實際應用之可行性。綜合而言，本研究所提出之陣列反射面量測系統適合應用於固定工作頻率下的長期與重複性測試，可作為傳統天線量測系統之低成本替代方案，並有助於降低產品出廠校正及量測設備之建置成本。

This study proposes an antenna measurement system for product testing. The system employs a Ku-band reflectarray as its core component. Through phase compensation, the spherical wave generated by the feed antenna is converted into an approximately planar wave within a designated observation region, thereby forming an effective quiet zone for antenna measurements.
To evaluate the effective quiet-zone area, a robotic-arm scanning system measured the amplitude and phase distributions over a 30 cm × 30 cm observation plane with a sampling interval of 0.39λ. The results demonstrate that the designed reflectarray can generate an effective quiet zone corresponding to approximately 50% of the total reflectarray area.
The reflectarray was integrated into a compact antenna test range configuration and validated using linearly polarized, circularly polarized, and array antennas. The measurement results indicate that the proposed system provides stable and reasonable performance under different polarization conditions. In conclusion, the reflectarray-based measurement system offers a practical and cost-effective alternative for repetitive measurements at a fixed operating frequency, particularly for reducing equipment and implementation costs associated with factory calibration and product verification.

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