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研究生: 陳璋琪
Chen, Chain-chi
論文名稱: 應用小波理論於印刷電路板缺點之檢測
The Application of Wavelet Theory to the Defect Detection in Printed Circuit Board
指導教授: 毛齊武
Mao, Chi-Wu
學位類別: 碩士
Master
系所名稱: 電機資訊學院 - 電機工程學系
Department of Electrical Engineering
論文出版年: 2003
畢業學年度: 91
語文別: 中文
論文頁數: 86
中文關鍵詞: 數位影像處理缺點檢測印刷電路板小波轉換
外文關鍵詞: haar, wavelet, pcb, dip, defect, labview
相關次數: 點閱:102下載:3
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  • 台灣為電子資訊大國,舉凡各種電子產品如主機板、數位相機、手機乃至於晶片產品,台灣皆有製造。在其生產流程中,必有產品缺陷檢測。如晶片封裝時的印字不清、引腳斷裂,主機板元件如電容、電阻焊接不良,產品外殼烤漆不佳…等等,都必須及時發現,期能在產品出貨前,發現缺點、提升良率。
    數十年來有關電腦視覺應用的論文不斷被提出,從人臉辨識、物體追蹤、數位影像處理乃至各種缺陷檢測自動化,各領域的研究人員無不費盡心思,在講求成本降低的工業生產領域中,各廠商亦紛紛投入電腦視覺研究,期望以此取代部份人工。台灣為一電子產品生產大國,對此一問題之重視自不在話下,本論文著眼於此,特別專注於一般電子產品生產流程中最需要的印刷電路板缺陷檢測。
    本論文以有別於以往的檢測方式,使用最近廣為使用的”小波轉換”理論,作為演算法基本架構,該法可將空間域信號轉為頻率域信號,提供使用者可針對某特定頻率範圍做處理之能力,而演算法亦根據此特性將屬較低頻信號的缺陷分離出來。其最大優點是運算簡易、執行快速,只需將經過影像處理及閥值化後正確的影像與含有缺陷的影像同時輸入本演算法,便可求得缺陷之所在位置。

    Taiwan is a well-known country of affluent electrical information; electronic products such as main board, digital camera, mobile phone, and SOC chip, can all be made by the technique in Taiwan. In the process of manufacturing, the need of defect checking has always been inevitable. Product defects might occur in the following cases, the blurred print, the splitting connector during the packing of the chip, and the ill-welding of those main board components such as the capacitor and the resistor. Those defects must be detected before being sent to the market so that good quality can be maintained.

    In recent years, papers pertaining the applications of computer vision have been submitted. From the recognition of the human face, the object tracing, the digital image processing, as well as the automation of various defect checking, the researchers of all fields have tried their best to explore every possibility to their applications. In the fields of industrial manufacturing in which the reduction of the cost is strongly stressed, factory owners have invested in the research work of computer vision which can take over the human labor. Taiwan, as a major country in electronic manufacturing, puts no less stress on these fields of research. Having witnessed such a tendency of industrial manufacturing, we devote ourselves to the defect defection in printed circuit board that is one of the most important steps during the general process of producing electrical products.

    Our research work uses special methods which are different from those former ones through the use of the current widely used theory, the wavelet transformation. As a basic construction of algorithm, this method can transform signals in time domain into signals in frequency domain, and can also provide the users the processing abilities for a specific range of frequency. Based on these properties, algorithm can be designed to pick up the defects of lower frequencies. Its excellency lies in its easy operation and speedy performance. Only when the two images, i.e. the processed thresholded image and the image with defects, are manipulated simultaneously by the algorithm, can we be certain to locate where the defects are.

    中文摘要 ……………………...………………………………………………………Ⅰ 英文摘要 ………………………………...……………………………………………Ⅱ 謝誌 ………………………………………..………………………………….……….Ⅲ 目錄 ……………………………………………..………………………………….….Ⅳ 表目錄 …………………………………………..…………………………………….Ⅵ 圖目錄 …………………………………………..…………………………………….Ⅶ 第一章 緒論 …………………………………………..………………………..…...1 1.1前言 ……………………………………………..………………………….…1 1.2文獻討論 ………………………………………..………………………..…..3 第二章 原理介紹 ………………………………………..…………………….…...6 2.1小波轉換簡述 ……………………………………..………………………...6 2.2 Haar小波轉換 ……………………………………..……………………….9 2.3 反Haar小波轉換 ..………………………………..……………………..20 2.4小波用於電路板缺點檢測 ……………………………………………...23 2.5本論文所使用影像處理技術 …………………………………………...26 第三章 系統介紹 …………………………………………………………………42 第四章 系統測試 …………………………………………………………………53 4.1執行步驟 ……………………………………………………………….…...53 4.2測試結果 …………………………………………………………………....60 4.3結果討論 …………………………………………………….……………...77 第五章 結論與展望 ………………………………………………………………80 參考文獻 …………………………………………………………………………..….83 自述 …………………………………………………………………………………....86

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