一個好的診斷方法須準確地提供錯誤可能存在的位置，然而，在診斷多重錯誤時卻不容易做到。往往在針對一個含有多重錯誤的元件進行診斷後，大量的錯誤會被識別為錯誤候選人，其中包含著許多與實際錯誤存在測試等效性的錯誤，診斷分辨率因而受到了限制。本論文提出了一個基於掃描鏈且二維的修復型診斷架構，透過修復邏輯的方式，將具有測試等效性的錯誤彼此區分開。我們針對每一個目標錯誤加入可修復的設計，而所有的可修復設計由兩條額外的掃描鏈控制。利用所提出的診斷架構，我們能夠藉由輸入適當的控制資料進掃描鏈中，將特定的錯誤修復。透過在幾種組合的控制資料下應用測試向量，我們能夠基於所獲得的錯誤響應，將測試等效性的錯誤彼此區分開並找出其中實際的錯誤。實驗於ISCAS’89基準電路的結果顯示出我們所提出的方法應用於改善多重定值錯誤的診斷分辨率的效能。

A good diagnosis method should provide a few but most likely candidate locations of faults. However it is difficult to achieve when diagnosing multiple faults. Sometimes a large set of candidate faults is provided after applying a diagnosis procedure to a faulty unit that contains multiple faults. Such a set includes many candidates which are not actual faults but are test-equivalent to the actual faults. Diagnostic resolution is thus limited. This thesis proposes a scan-based two-dimensional repair-for-diagnosis architecture that can distinguish the faults which are mutually test-equivalent by means of logic repair. We add a repairable design for each of the targeted faults. All repairable designs are controlled by two additional scan chains. With this architecture, we can repair the specific faults by shifting the appropriate control data into the two scan chains. By applying tests under several combinations of control data, we can easily identify an actual fault from a set of test-equivalent faults based on the captured faulty responses. Experimental results on ISCAS’89 benchmark circuits demonstrate the efficacy of the proposed method to improve the resolution of diagnosing multiple stuck-at faults.

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