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研究生: 蔡宗傑
Tsai, Tzung-Jie
論文名稱: 自成份硫化物中間層對銅鋅錫硫太陽能電池吸收層之影響
Comparative study of self-constituent intermediate layers(CuS,SnS,ZnS) for synthesis Cu2ZnSnS4 thin films
指導教授: 施權峰
Shih, Chuan-Feng
學位類別: 碩士
Master
系所名稱: 電機資訊學院 - 電機工程學系
Department of Electrical Engineering
論文出版年: 2016
畢業學年度: 104
語文別: 中文
論文頁數: 89
中文關鍵詞: 銅鋅錫硫薄膜太陽能電池介面接合性
外文關鍵詞: Cu2ZnSnS4 (CZTS), Thin film solar cell, Adhesion
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  • Cu2ZnSnS4(CZTS)是一種有潛力的吸收材料,因為它的成分在地表含量豐富且無毒,它主要的難題是在製程高效率的太陽能電池中,吸收層與鉬基板之間接觸面的接合性不佳,易造成孔隙與裂縫,為了解決這個問題,我們嘗試在鉬基板與吸收層之間摻入一層自成份硫化物中間層CuS、SnS、ZnS來改善接觸面特性,藉由XRD、SEM、TEM等量測分析。
    本研究發現當摻入自成份硫化物中間層時將有效改善鉬基板與吸收層之間的接觸面特性,然而一些問題卻會浮現,譬如當摻入CuS中間層時,底部的銅空缺問題將會嚴重擴大,當摻入ZnS中間層時則將ZnS這個二次相存留下來;最有潛力的選擇是SnS中間層,在結晶性、接觸面特性都有明顯改良,且在元件的效率上有所提升,將是CZTS太陽能電池中間層的有利選擇之一。

    Cu2ZnSnS4 (CZTS) is a promising absorber material because of its earth abundant and non-toxic constituents. The major challenge for synthesis the high-efficiency CZTS solar cell is the high-density voids and secondary phases at the interface of the CZTS absorber and the Mo back contact. To overcome this problem, we comparatively study the effect of inserting a self-constituent intermediate layer such as CuS, SnS and ZnS between the CZTS and Mo substrate. Influences of these interlayer materials on the phase purity, crystallinity, interface quality and elementary segregation of the CZTS films made by metal precursors were presented. A crack-free, pinhole-free, and high quality CZTS thin film was obtained by insertion of a SnS buffer layer.

    目錄 第一章 緒論 1 1-1 前言 1 1-2單晶太陽能電池 2 1-3薄膜太陽能電池 2 1-4銅鋅錫硫太陽能電池 3 第二章 理論基礎 4 2-1 半導體 4 2-2 P-N接面特性 6 2-3 異質接面(Heterojunction) 8 2-4 金屬半導體接觸 9 2-4-1 蕭基特接觸 11 2-4-2 歐姆接觸 11 2-5 太陽能電池 13 2-5-1 操作原理 13 2-5-2 轉換效率[10] 16 2-6銅鋅錫硫 (CZTS)太陽能電池文獻回顧 19 2-6-1 材料特性及製程方式 19 2-6-2 分解反應 20 2-6-3 CZTS與鉬基板之接觸特性 21 2-7 研究動機 23 第三章、實驗流程與儀器量測 24 3-1 CZTS太陽能電池結構簡介 24 3-1-1 基板 25 3-1-2 背電極 25 3-1-3 吸收層 26 3-1-4 緩衝層 26 3-1-5 前電極 27 3-2 實驗流程與方法 28 3-2-1 實驗流程架構 28 3-2-2 鉬基板準備與清洗 29 3-2-3 中間層鋅硫、錫硫、銅硫化合物製備 29 3-2-4 中間層硫化爐管製程 30 3-2-5 吸收層前驅物製備 30 3-2-6 吸收層硫化爐管製程 30 3-2-7緩衝層硫化鎘(CdS)製備 31 3-2-8 透明導電模製備 31 3-2-9金屬導電電極製備 31 3-3設備儀器介紹 32 3-3-1 X-ray繞射儀(XRD) 32 3-3-2 掃描式電子顯微鏡(SEM) 33 3-3-3 拉曼光譜分析(Raman Spectroscopy) 34 3-3-4 穿透式電子顯微鏡(TEM)分析 35 第四章 結果與討論 37 4-1自成份硫化物作為中間層在CZTS吸收層與鉬基板接觸面之分析 37 4-1-1自成份硫化物對CZTS結晶的影響 38 4-1-2自成份硫化物對於CZTS吸收層與鉬基板之間的影響 45 4-1-3 結論 69 4-2 SnS中間層對於CZTS元件的影響 70 4-2-1 SnS中間層對於CZTS吸收層的影響 70 4-2-2元件電特性分析 79 4-2-3 結論 83 第五章 總結及未來規劃 84 5-1 總結 84 5-2 未來規劃 84 參考文獻 86

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