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研究生: 陳婧瑀
Chen, Ching-Yu
論文名稱: 利用電漿輔助式分子束磊晶成長層數可控制的大面積六方氮化硼薄膜
Large-area growth of layer-controlled hexagonal boron nitride by plasma-assisted molecular beam epitaxy
指導教授: 吳忠霖
Wu, Chung-Lin
學位類別: 碩士
Master
系所名稱: 理學院 - 物理學系
Department of Physics
論文出版年: 2021
畢業學年度: 109
語文別: 中文
論文頁數: 46
中文關鍵詞: 六方氮化硼 、電漿輔助式分子束磊晶 、石墨稀 、碳化矽 、二維材料
外文關鍵詞: hexagonal boron nitride(hBN), Plasma-assisted molecular beam epitaxy(PA-MBE), Graphene, Silicon carbide(SiC), 2D material
相關次數: 點閱:175  下載:0 
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  • 六方氮化硼(hexagonal boron nitride, hBN)薄膜在二維材料中有極佳的應用潛力,至今成功成長出大面積高品質 hBN 薄膜的團隊皆使用 CVD 系統以及金屬基板,後續若要應用需轉移至其他基板上,不僅可能產生缺陷也有與基板有晶格不匹配的問題。
    我們的目標是利用 MBE 系統將大面積高品質 hBN 直接成長在可應用的基板上,避免轉移造成薄膜品質下降。
    本論文利用不同錯切角的碳化矽以及不同退火溫度的成長條件,先在碳化矽基板上成長出不同表面形貌的石墨烯,使用 SEM、AFM 與 Raman 量測石墨烯特徵後再放入 MBE 系統中成長 hBN。成長完後從 SEM、AFM 與 Raman 量測中觀察到 hBN 薄膜在筆直且密集的石墨烯表面上有最高品質的六角型結晶,單晶石墨烯的台階表面幫助 hBN 沿基板的單一晶格方向生長並合併成薄膜,此結論在 MBE 系統中初次發現並驗證文獻中提出的二維材料生長模式。
    掌握大面積高品質 hBN 薄膜的生長關鍵後,我們進一步控制 hBN 的生長時間達成對 hBN 的層數控制,由 SEM、AFM、Raman 以及 ARPES 證實我們在石墨烯/碳化矽基板上成功長出單層與雙層的 hBN 薄膜。

    Hexagonal boron nitride (hBN) has great potential in 2D material application. Recent studies have shown the growth of single-crystal hBN on metal substrates by chemical vapor deposition (CVD) where transfer processes might contaminate the surface. Here, we successfully grow single-crystal hBN on high-quality epitaxial graphene by Plasmaassisted molecular beam epitaxy (PA-MBE) and achieve the layer control of hBN by controlling growth time. According to SEM and AFM measurement, it was found that the hBN is well-aligned with the Graphene surfaces, which verified the 2D materials epitaxy growth mechanism in MBE System. Our ARPES results show strong evidence of growing single-crystal hBN monolayer and bilayer on Graphene.

    中文摘要I 英文摘要II 誌謝VII 目錄VIII 表目錄X 圖目錄XI 第一章 緒論1 1.1 研究動機1 1.2 石墨烯2 1.3 六方氮化硼3 第二章 實驗儀器及原理4 2.1電漿輔助式分子束磊晶系統 Plasma-assisted Molecular Beam Epitaxy4 2.1.1 分子束磊晶 Molecular Beam Epitaxy (MBE)4 2.1.2 分子束磊晶蒸鍍源 Effusion Cell5 2.1.3 射頻電漿源 Radio Frequency Plasma (RF-Plasma)6 2.1.4 反射式高能電子繞射儀 Reflection High Energy Electron Diffraction (RHEED)7 2.2 掃描式電子顯微鏡 Scanning Electron Microscopy (SEM)10 2.2.1電子與原子的交互作用10 2.2.2掃描式電子顯微鏡 SEM11 2.3 原子力顯微鏡 Atomic Force Microscopy (AFM)12 2.4 拉曼光譜儀 Raman Spectroscopy15 2.4.1 拉曼散射 Raman Scattering15 2.4.2 拉曼光譜儀 Raman Spectroscopy16 2.5 光致發光光譜儀 Photoluminescence Spectroscopy (PL)17 2.6 角分辨光子能譜Angle-Resolved Photoemission Spectroscopy (ARPES)18 第三章 實驗方法與量測19 3.1 基板選擇19 3.2 標準清洗法(RCA Standard Clean)19 3.3 在碳化矽基板上製備石墨烯20 3.4 在石墨烯/碳化矽基板上製備六方氮化硼21 3.5 量測與分析22 3.5.1 掃描式電子顯微鏡量測與分析22 3.5.2 原子力顯微鏡量測與分析23 3.5.3 拉曼光譜量測與分析24 第四章 結果與討論25 4.1磊晶六方氮化硼薄膜的基板效應25 4.1.1 石墨烯成長在碳化矽基板上25 4.1.2 六方氮化硼成長在石墨烯/碳化矽基板上31 4.1.3 磊晶六方氮化硼薄膜的基板效應36 4.2 大面積六方氮化硼薄膜的層數控制39 4.2.1 掃描式電子顯微與原子力顯微鏡分析39 4.2.2 拉曼光譜分析40 4.2.3 角分辨光子能譜分析41 第五章 結論43 參考文獻44

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