同一個元件在不同的已校正過之微波量測系統下，通常仍會有不一致的量測值，因此往往造成爭議。若能找出這些量測值間不同的原因，並提出有效的轉換方法，則可以用來作為對結果判斷的重要依據。這方面的初步研究已經被發表，但若應用在雙埠或多埠元件量測時，因為目前的方法並沒有考慮到網路分析儀殘餘誤差的影響，因此轉換結果可能會出現錯誤。
　　本論文主要在針對前述方法的缺失進行改良。首先針對一台雙埠的網路分析儀配置不同測試夾具的情形進行研究，經過徹底分析殘餘誤差對轉換結果造成的影響之後，提出了一個更正確的轉換方法。此外，由於多埠元件的量測需求增多，本論文也將雙埠轉換方法延伸成適用於多埠量測值間的轉換；因為此時儀器的埠數可能會少於元件的埠數，本研究也特別討論了在這種狀態下的轉換問題，並提出解決方法。上述的這些結果，適用在單一儀器配用不同測試夾具的情形下。實際上，公司內部或是公司與公司之間，經常會是使用不同儀器配用不同測試夾具，形成許多不同的量測系統。本論文最後，即在研究並提出這些不同系統之量測值間的轉換方法。這個方法的使用，不僅可以大幅地移除量測值間的差異，並且可以降低購置高精密校正與量測設備的成本，對工業界會有相當大的助益。

　A device tested under different microwave measurement systems usually gives different and arguable results. It would be a great help if the cause of this inconsistency could be found and a transformation between the results could be established. A primary research on this had been reported recently. However, it is found that the method loses its accuracy when applied to measurements from network analyzers with inevitable residual errors.

　The purpose of this research is to improve and extend this method. Firstly, the effects of residual errors on the transformation, betweens results from a two-port network analyzer with different test fixtures, are thoroughly studied. A more accurate transformation has been derived. Since the demand of measurements of multi-port devices is increasing, the method has also been extended to multi-port measurements. Usually, a network analyzer has only two available ports. Therefore, multi-port measurements and transformation are different and more difficult. A solution has been proposed particularly for this situation.

　The above results apply to the measurements from one network analyzer with different test fixtures. In real world, the measurement systems in a company, or among companies, are usually based on different network analyzers with different test fixtures. At the end of this thesis, a transformation between the results from these different systems has been proposed. This not only reduces the differences between measurements, but also reduces the requirement of using high-accurate calibration kits and instruments. Therefore, this method should be very useful to the industry.

[1.1] Scott A. Wartenberg, “RF Measurements of Die and Packages,” Artech House, pp. 97, June 2002.

[1.2] Agilent Technologies, “In-Fixture Measurements Using Vector Network Analyzer,” Agilent AN 1287-9 Application Note, pp. 6-11, 1999.

[1.3] J. P. Dunsmore and L. Betts, “New methods for correlating fixtured measurements,” 2003 Asia-Pacific Microwave Conference, WEP 63, pp. 568-571.

[1.4] Gaku Kamitani, “A method to correct difference of in-fixture measurements among fixtures on RF devices”, 2003 Asia-Pacific Microwave Conference, TD5 03, pp. 1094-1097.

[3.1] Scott A. Wartenberg, “RF Measurements of Die and Packages,” Artech House, pp. 19-23, June 2002.

[3.2] Chien-Chih Chen, “Modified TRL Calibration for Three-Receiver Network Analyzer,” Master Thesis of Department of Electrical Engineering, National Cheng Kung University, Taiwan, R.O.C, pp. 16, July 2003.

[3.3] Hewlett Packard, “HP 8719D/8720D/8722D Network Analyzers User’s Guide,” section 7, pp. 9, March 2000.

[3.4] Guillermo Gonzalez, “Microwave Transistor Amplifiers: Analysis and Designer,” Prentice-Hall Inc., second edition, pp. 25-26, June 1996.

[3.5] Scott A. Wartenberg, “RF Measurements of Die and Packages,” Artech House, pp. 21, June 2002.

[4.1] John C. Tippet and Ross A. Speciale, “A rigorous technique for measuring the scattering matrix of a multiport device with a 2-port network analyzer,” IEEE Trans. on Microwave Theory Tech., vol. MTT-30, No. 5, pp. 661-666, May 1982.

[4.2] E. Van Lil, Comments on “A rigorous technique for measuring the scattering matrix of a multiport device with a 2-port network analyzer,” IEEE Trans. on Microwave Theory Tech., vol. MTT-33, No. 3, pp. 286-287, March 1985.

[4.3] E. Wilkinson, “An N-way hybrid power divider,” IEEE Trans. on Microwave Theory Tech., vol. MTT-8, pp. 116-118, January 1960.