本論文研究水平配向液晶盒做為純相位調制器的性能。在此實驗當中，光路的微幅調整對於液晶當做調制器來說相當的敏感，可能導致在不同的測試中實驗結果無法重複，我們架設了一個包含液晶盒電壓-穿透率曲線測量、電壓-相位校正以及數位移相式全像術之系統，以達到最少光學元件的移動之目的。
我們討論了一個使用電壓-穿透率曲線測量來擷取相位分佈曲線的方法，並使用曲線反轉斜率的法則來實現。為確認相位分佈曲線的正確性，我們提出一個校正方法，利用液晶產生之未知相位補償致動器所產生的已知相位，以得知正確的液晶盒電壓-相位分佈曲線。
校正結果與實驗預期差距甚大。經由數值運算以及模擬測試的評估，發現樣品扭角、測量厚度以及實驗溫度對於結果影響有限，其誤差來自於系統本身而非液晶。

The characteristics of a homogeneous liquid crystal (LC) cell used as an optical component with phase-only modulation were studied. In this study, a little positional difference of liquid crystal cell sensitively induced the changed results even in same experimental conditions. It was difficult to get repetitive results if no fixation of liquid crystal cell. A multi-function experimental setup is constructed in order to many measurements are processed including voltage versus transmission (V-T) curve measurement, voltage versus phase calibration system and digital phase-shifting holography. Therefore, minimum movement of optical elements can be achieved.
A method is also studied to retrieve phase map from homogeneous liquid crystal cell, which is V-T curve calculation due to a slope-converting method. To demonstrate the correction of phase map, a calibration method is claimed that uses an unknown phase step produced by liquid crystal cell to compensate a known phase generated by actuator, which can get correct distribution of voltage versus phase curve on LC cell.
The result of calibration is much difference from predicted one. We discover that effects of twisted angle, measured thickness of LC cell and experimental temperature are not the main resource of error, which are evaluated by some numerical method and simulated tests. The source of error comes from an intrinsic shift by system itself nor LC cell.

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