超高電容器電極材料之研發，近來深受注目，其中錳氧化物為相當可期待的電極材料之ㄧ。本研究旨在以定電位陽極沉積法及循環伏安陽極沉積法兩種製程，製備出應用於超高電容器之錳氧化物薄膜電極，並比較其擬電容特性。錳氧化物薄膜電極之擬電容特性，包括比電容值評估及擬電容穩定性之測試(擬電容穩定性以比電容值衰退率表示)，是利用循環伏安法於0-1V電壓範圍內，以0.1 M Na2SO4當測試電解液，在25℃下進行之，並分析不同測試圈數後之錳氧化物電極之材料特性，檢討影響擬電容穩定性之原因。
以定電位陽極沉積法及循環伏安陽極沉積法所製得之錳氧化物薄膜皆結晶性不佳，其表面形態皆為奈米纖維結構。以循環伏安沉積法製備之錳氧化物薄膜，其孔隙度、含水量、比電容值及擬電容穩定性皆高於以定電位陽極沉積法之錳氧化物薄膜；二者之比電容值分別為214.4 F/g及181.2 F/g，衰退率分別為 9.5%及19.6%。以循環伏安沉積法製備之錳氧化物薄膜，其擬電容穩定性等優於以定電位沉積法製備之薄膜，推測是在測試過程中其奈米纖維結構逐漸轉變產生片狀結構所致。此外兩種沉積法製備之錳氧化物薄膜經長時效充放電後，其錳氧化物表面形態變為更緻密，結晶性亦變佳，導致比電容值降低。

The research and development of capacitor’s electrode materials has got a lot of attention recently, especially manganese oxide, is one of the promising electrode materials. This study’s purpose was to prepare manganese oxides which were applied on capacitor by potentiostatic and cyclic voltammetric anodic deposition methods, and to compare the pseudo-capacitive characteristics. The pseudo-capacitive characteristics analysis including specific capacitance (SC value) and pseudo-capacitive stability (SC value decay rate was shown as stability) evaluation, were analyzed by cyclic voltammetry test which was proceeded in 0.1M Na2SO4 solution at 25℃ with voltage scan range of 0-1V. And the material characteristics of manganese oxide films tested with different cycle number were analyzed to realize the affect factors on the pseudo-capacitive stability.
Both of manganese oxide films prepared by different methods showed low crystallinity and fiber-like structures. The manganese oxide film prepared by cyclic voltammetric method had higher porosity, water content, SC value and pseudo-capacitive stability than that of the film prepared by potentiostatic method. The SC value were 214.4 F/g and 181.2 F/g respectively, and the SC value decay rates were 9.5％ and 19.6％ respectively. The reason that the pseudo-capacitive stability of the manganese oxide film prepared by cyclic voltammerty method was better than that of the film prepared by potentiostatic method, was conjectured to be the sheet-like structure formed during cyclic voltammetry test. Beside, the surface morphology was denser and the crystallinity was better for the manganese oxide films after charging-discharging test, and then that induced the decrease of SC value.

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