電子通道對比影像(ECCI)技術為掃描式電子顯微鏡(SEM)中的一項技術，可直接觀測到在晶體材料上，奈米層級的表面缺陷，例如：差排、疊差及奈米雙晶等。此篇論文使用Crofer 22 H不鏽鋼為實驗材料，藉由ECCI分別觀測不同變形量以及退火處理時間對差排組織之影響。並使用穿透式電子顯微鏡(TEM)中之不可見判定公式(Invisibility criteria)，分析差排之滑移系統以及判斷其種類。最後藉由比較不同退火階段之ECCI觀測了到由差排組織到析出物組織之間的演化過程。

Electron channeling contrast imaging (ECCI) is a powerful technique in the scanning electron microscope (SEM), which can be used to observe crystal defects near the surface of bulk materials in nano-scale, such as dislocations, stacking faults and nano-twins. In this study, we used Crofer 22 H stainless steel to observe the microstructure after deformation and annealing in a bcc structure. By the invisibility criteria of transmission electron microscope (TEM), it is possible to analyze the slip system with ECCI taken at different g vectors. By comparing ECCI after different steps of annealing, we observed the evolution of dislocation structure and the precipitation.

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