在科技快速變遷的時代，產品的生命週期逐漸縮短，產品從研發試作至量產上市的時間愈縮愈短，如何由產品先行試作至快速量產，並確保產品可靠度無虞是企業的核心競爭力之一。因此，如何在短時間內了解產品的壽命狀況與其可靠度的變化行為，必須擬定一套方法，而加速壽命試驗則成為業界之重要對策。
本文將Prokopowisz 和 Vaskas提出的加速壽命試驗理論，應用於積層陶瓷電容器（Multi-layer Ceramic Capacitor, MLCC）的加速壽命測試與可靠度分析之研究。配合有限元素法模擬其電容器內部結構應力大小與產品壽命之可靠度關係，以建立應力與壽命關係，並應用於其它尺寸與電容量的電容器，即先以有限元素法分析新結構體的應力，再推估產品之壽命，以縮短產品試作至量產的時間。總之，藉此可預測高應力低壽命之問題，進而提升產品之可靠度。

Living in an era when technology advances fast, product life cycle becomes

shorter and shorter. From R&D trail run to mass production, one of the core

competitive strength for any industry, depends on how fast it takes to advance a

product from trail run, to the final mass production stage. Therefore, to

understand the transformation on product life cycle and product reliability, it is

necessary to mark plans accordingly. One of the important strategy is to conduct

the Highly Accelerate Life Test(HALT).

This article will present the research on HALT and product reliability

analysis, using the theory suggested by Prokopowisz and Vaskas which applied

on Multi-layer Ceramic Capacitor(MLCC). To establish the relation between

stress and life cycle, and using it on other sizes of the MLCC, is to model the

inner structural relation between stress effects with the reliability of product life

cycle on MLCC .In other words, by using Finite Element Method(FEM) to

analysis the stress within the new structure the product life cycle can be

predicted in order to shorter the duration from trail run to mass production.

Above all, this could predict the problem of higher stress and shorter life

cycle, making one step forward to increase product reliability.

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