簡易檢索 / 詳目顯示

研究生: 徐信祥
Hsu, Hsin-Hsiang
論文名稱: [IrMn/CoFe]n多層膜之交換異向性研究
Study of exchange bias in IrMn/CoFe multilayers
指導教授: 黃榮俊
Huang, Jung-Chun-Andrew
學位類別: 碩士
Master
系所名稱: 理學院 - 物理學系
Department of Physics
論文出版年: 2003
畢業學年度: 91
語文別: 中文
論文頁數: 123
中文關鍵詞: 鈷鐵合金銥錳合金反鐵磁材料交換異向性
外文關鍵詞: exchange bias, antiferromagnetic meterial, IrMn, CoFe
相關次數: 點閱:101下載:3
分享至:
查詢本校圖書館目錄 查詢臺灣博碩士論文知識加值系統 勘誤回報
  • 在[鐵磁/反鐵磁]多層膜中的交換耦合現象目前正逐漸引起許多研究團隊的興趣[43,44,77~79]。本實驗利用離子束濺鍍成長[IrMn/CoFe]單層、雙層、三層、四層及多層之交換耦合界面(EBIF)。在單層及雙層交換耦合界面中(同時成長),我們証明了在第二層的CoFe有較大的交換場而第一層CoFe的交換場則較小。在三層及四層的交換耦合界面中(同時成長),我們証明了交換場在第二層CoFe最大、第一層CoFe次之而第三層CoFe最小,如Fig.1(a)所示。另外,我們也觀察到對於交換耦合界面數目(N)大於4的多層膜而言,交換場隨著N的增加而遞減,如Fig.1(b)所示。藉由一個考慮在IrMn及CoFe層中之磁疇及結構因素的模型,我們對於交換場在[IrMn/CoFe]多層膜中的結果提出解釋。

    There is a growing interest in study of exchange biasing (EB) in antiferromagnetic(AF)/ ferromagnetic(F) multilayers (MLs).[43,44,77~79] By ion beam sputtering, we have prepared and studied single-,dual-,tri-, quadri-, and multi- EB interface (EBIF) of [IrMn/CoFe]. In the (simultaneously prepared) single- and dual- EBIF,we have identi-fied a large EB in the second CoFe layer and a small EB in the first CoFe layer. In the (simultaneously prepared) tri- and Quadri-EBIF,we have identified a large EB in the second CoFe layer, a medium EB in
    the first CoFe layer and a small EB in the third CoFe layer, as shown in Fig. 1(a). We have also observed that EB tends to decrease with the increase of the number of EBIF (N) for N>4 in the multi-EBIF, as shown for example in Fig. 1(b). The results of EB in IrMn/CoFe MLs are explained by a simple model considering factors of magnetic domain and structure in IrMn and CoFe layers.

    目錄 第一章 簡介 1-1 前言 ‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧1 1-2 研究動機 ‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧5 1-3 反鐵磁材料介紹 ‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧7 1-4 濺鍍理論與系統介紹 ‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧15 第二章 磁異向性介紹與量測 2-1 磁異向性介紹 ‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧29 2-2 交換異向性的理論機制 ‧‧‧‧‧‧‧‧‧‧‧‧‧‧40 2-3 磁異向性量測 ‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧45 第三章 實驗儀器介紹與實驗步驟 3-1 離子束濺鍍系統 ‧‧‧‧‧‧‧‧‧‧‧‧‧51 3-2 實驗量測儀器 ‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧59 3-3 實驗步驟 ‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧77 第四章 實驗結果與討論 4-1種子層Ta厚度對交換耦合場及矯頑場的影響 ‧‧‧‧‧‧‧81 4-2多層界面耦合效應 ‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧96 第五章 結論 ‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧117 參考文獻 ‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧‧119

    [1] Veronique Gehanno,Paulo P, Anabela Veloso, IEEE Tran. Magn. 35,
    No’5,4361 (1999)------A
    [2] Haohua Lia,P. P. Freitas, J. Appl.Phys.89,6904--------A
    [3] M.Mao,S.Funada,C.y,Hung,T.Schneider,M.Miller, IEEE Tran.
    Magn.35,3913
    [4] M. Tsunoda, M. Konoto, M. Takahashi, IEEE Trans. Magn. 33
    (1997) 3688.
    [5] M. Tsunoda, Y. Tsuchiya, M. Konoto, M. Takahashi, J. Magn. Magn.
    Mater. 171 (1997) 29.
    [6] M. Tsunoda, M. Konoto, K. Uneyama, M. Takahashi, J. Magn. Soc.
    Japan 21 (1997) 513.
    [7] R. Nakatani, H. Hoshiya, K. Hoshino, Y. Sugita, J. Magn. Magn.
    Mater. 173 (1997) 321.
    [8] Y. Tsuchiya, Rec. Elec. Commun. Eng. Conver. Tohoku Univ. 65
    (1996) 153.
    [9] D. Guarisco, E. Kay, S.X. Wang, IEEE Trans. Magn. 33 (1997) 3595.
    [10] K. Watanabe, S. Tadokoro, T. Kawabe, M. Fuyama, H. Fukui, S. Narishige, J. Magn. Soc. Japan 18 (Suppl. S1) (1994) 355.
    [11] L. Tang, D.E. Laughlin, S. Gangopadhyay, J. Appl. Phys. 81 (1997) 4906.
    [12] H. Uyama, Y. Otani, K. Fukamichi, O. Kitakami, Y. Shimada, J. Echigoya, Appl. Phys. Lett. 71 (1997) 1258.
    [13] C.M. Park, D.G. Hwang, S.S. Lee, K.A. Lee, in: Digest of INTERMAG, IEEE, New York, 1996, p. EA-10.
    [14] K. Takano, R.H. Kodama, A.E. Berkowitz, W. Cao, G. Thomas, Phys. Rev. Lett. 79 (1997) 1130.
    [15] T. Umemoto, A. Maeda, S. Takahashi, T. Tanuma, M. Kume, Jpn. J. Appl. Phys. 36 (1997) 6746.
    [16] H. Uyama, Y. Otani, K. Fukamichi, O. Kitakami, Y. Shimada, J. Echigoya, J. Magn. Soc. Japan 21 (1997) 911.
    [17] C.H. Lai, T.C. Anthony, R. Iwamura, R.L. White, IEEE Trans. Magn. 32 (1996) 3419.
    [18] C.H. Lai, H. Matsuyama, R.L. White, T.C. Anthony, IEEE Trans. Magn. 31 (1995) 2609.
    [19] J. van Driel, F.R. de Boer, K.-M. H. Lenssen, J. Appl. Phys.88,(2000),975

    [20] J.Nogues, Ivan K. Schuller, J. Magn. Magn. Mater. 192 (1999)
    203
    [21] Masakiyo Tsunoda, Kazuhiro Nishikawa, Satoshi Ogata,Appl.Phys.Lett.80,(2002)3135
    [22] G. Wang, T. Yeh, C.L. Lin, J.M. Sivertsen, J.H. Judy, IEEE Trans. Magn. 32 (1996) 4660.
    [23] H.Fujiwara,C.Hou, M. Sun, IEEE Trans. Magn. 35 (1999) 3082
    [24] H.S.Jung, W.D.Doyle, J. Appl. Phys.91,(2002),6899
    [25] E. Fulcomer and S. H. Charap, J. Appl. Phys. 43, 4190 ~1972!.
    [26] 10M. D. Stiles and R. D. McMichael, Phys. Rev. B 60, 12950 (1999).
    [27] H. Fujiwara, C. Hou, M. Sun, H. S. Cho, and K. Nishioka, IEEE Trans. Magn. 35, 3082 (1999).
    [28] C. Hou, H. Fujiwara, F. Ueda, and H. S. Cho, Mater. Res. Soc. Symp. Proc. 517, 37 (1998).
    [29] A.P. Malozemo, Phys. Rev. B 35 (1987) 3679.
    [30] A.P. Malozemo, Phys. Rev. B 37 (1988) 7673.
    [31] A.P. Malozemo, J. Appl. Phys. 63 (1988) 3874.
    [32] M. Tsunoda, Y. Tsuchiya, T. Hashimoto, and M. Takahashi, J. Appl. Phys.87, 4375 (2000)
    [33] M. Tsunoda, Migaku Takahashi, J. Appl. Phys.87, 6415 (2000)
    [34] D. Mauri, H.C. Siegmann, P.S. Bagus, E. Kay, J. Appl. Phys. 62 (1987) 3047.
    [35] N.C. Koon, Phys. Rev. Lett. 78 (1997) 4865.
    [36] M. Ali, C. H. Marrows, and B. J. Hickey, PHYSICAL REVIEW B 67, 172405 (2003)
    [37] Nolting, A. Scholl, J. Sto¨hr, J.W. Seo, J. Fompeyrine, H. Siegwart, J.P. Locquet, S. Anders, J. Luning, E.E. Fullerton, M.F. Toney, M.R. Scheinfein, and H.A. Padmore, Nature(London) 405, 767 (2000)
    [38] 17W. Kuch, F. Offi, L.I. Chelaru, M. Kotsugi, K. Fukumoto, J. Kirschner, M. Ali, C.H. Marrows, and B.J. Hickey(unpublished)
    [39] 18C.H. Marrows, S. Langridge, M. Ali, A.T. Hindmarch, D.T. Dekadjevi, S. Foster, and B.J. Hickey, Phys. Rev. B 66, 024437(2002)

    [40] J.A. Borchers, Y. Ijiri, D.M. Lind, P.G. Ivanov, R.W. Erwin, AronQasba, S.H. Lee, K.V. O’Donovan, and D.C. Dender, Appl. Phys. Lett. 77, 4187 (2000).
    [41] P. Milte´nyi, M. Gierlings, J. Keller, B. Beschoten, G. Gu¨therodt, U. Nowak, and K. Usadel, Phys. Rev. Lett. 84, 4224 (2000).
    [42] Taras Pokhil, Dian Song, and Eric Linville , J. Appl. Phys.91, 6887 (2000)
    [43] L. Suna, S. M. Zhou, P. C. Searson, C. L. Chien, J. Appl. Phys.93, 6841 (2003)
    [44] S. Maat, K. Takano, S. S. P. Parkin, and E. E. Fullerton, Phys. Rev. Lett. 87, 087202 (2001)
    [45] 1 A. J. Devasahayam and M. H. Kryder, IEEE Trans. Magn. 35, 649 (1999).
    [46] H. Hoshiya, S. Soeya, Y. Hamakawa, R. Nakatani, M. Fuyama, H. Fukui, and Y. Sugita, IEEE Trans. Magn. 33, 2878 (1997).
    [47] M. Saito, N. Hasegawa, F. Koike, H. Seki, and T. Kuriyama, J. Appl. Phys. 85, 4928 (1999).
    [48] H. N. Fuke, K. Saito, Y. Kamiguchi, H. Iwasaki, and M. Sahashi, J. Appl. Phys. 81, 4004 (1997).
    [49] V. Gehanno, P. P. Freitas, A. Veloso, J. Ferreira, B. Almeida, J. B. Sousa, A. Kling, J. C. Soares, and M. F. de Silva, IEEE Trans. Magn. 35, 4361 (1999).
    [50] K. Yagami, M. Tsunoda, S. Sugano, and M. Takahashi, IEEE Trans. Magn. 35, 3919 ~1999!. Magn. 35, 3919 (1999).
    [51] M. Mao, S. Funada, C. Y. Hung, T. Schneider, M. Miller, H.-C. Tong, C. Qian, and L. Miloslavsky, IEEE Trans. Magn. 35, 3913 (1999).
    [52] G. Anderson, Y. Huai, and L. Miloslawsky, J. Appl. Phys. 87, 6989 (2000).
    [53] M. Pakala, Y. Huai, G. Anderson, and L. Miloslavsky, J. Appl. Phys. 87, 6653 (2000).
    [54] J. Van Driel, F. R. de Boer, K.-M. H. Lenssen, and R. Coehoorn, J. Appl. Phys. 88, 975 (2000).
    [55] H. N. Fuke, K. Saito, Y. Kamiguchi, H. Iwasaki, and M. Sahashi, J. Appl. Phys. 81, 4004 (1997).
    [56] V. Gehanno, P. P. Freitas, A. Veloso, J. Ferreira, B. Almeida, J. B. Sousa, A. Kling, J. C. Soares, and M. F. de Silva, IEEE Trans. Magn. 35, 4361(1999).
    [57] K. Yagami, M. Tsunoda, S. Sugano, and M. Takahashi, IEEE Trans. Magn. 35, 3919 (1999).

    [58] M. Mao, S. Funada, C. Y. Hung, T. Schneider, M. Miller, H.-C. Tong, C. Qian, and L. Miloslavsky, IEEE Trans. Magn. 35, 3913 (1999).
    [59]胡裕民、黃榮俊,鐵磁/反鐵磁金屬薄膜之間的交換磁異向性,物理雙月刊(二十二卷六期)2000年12月。
    [60] R.D. Hempstead, S. Krongelb and D.A. Thompson, IEEE Trans. Magn. MAG-14,521(1978)
    [61] R.Jungblut, R. Coehoorn, M. T. Johnson, J. aan de Stegge and A. Reinders, J. Appl. Phys. 75,6659(1994)
    [62] T.Liin, D. Mauri, n. Staud, C. Hwang, J.K. Howard and G. Gorman, App;l. Phys. Lett. 65,1183(1994)
    [63] A.Tanaka, Y. Shimizu, H. Kishi, K. Nagasaka, H.Kanai and M. Oshiki, IEEE Trans. Magn. 35, 700(1999)
    [64] Cullity,”Introduction to magnetic materials”.
    [65] E .H. Meiklejohn and C.P.Bean,Phys.Rev.102,1413 (1956) ; Phy .
    Rev.105 , 904(1957)
    [66] G.Binnig,C.F.Quate,and Ch.Gerber,”Atomic Force Microscope”,
    Phys.Rev.Lette. 56 (1986) 930。
    [67] J.P.Qian and G.C.Wang,J.Vac.Sci.Technol. A 8,(1990) 4117。
    [68] Voigt.W,”Magneto and Electro Optic”,Teubner,Leiptig (1908)。
    [69] Hulme,H.R.”Farady effect in ferromagnetics”,Pro.Roy.Soc.,
    A135,(1932) 237。
    [70] M.J,Freiser,IEEE.Trans.On Magn.,MAG-4(2),(1968) 152。
    [71] Y.Souche,J.M.Alameda,Materials Research Society,v150,165。
    [72] 楊錦章譯,"基礎濺鍍電漿", 電子發展月刊,第68 期,(1983) 13
    [73] 賴耿陽," IC 製程之濺射技術",復漢出版社,(1997)
    [74] H. Kashani, " The signification of parallel electric field on the
    preferred orientation and surface morphology of ZnO thin films "
    Journal of Material Science Letters, 18 (1999) 1043-1045
    [75] Akahoshi, H, " Process for Electroless Copper Plating " U.S. Patent 4,632, 852 (1986)
    [76] Kikuchi, H, " Electroless Copper Plating Solution " U.S. Patent 4, 563,217 (1986)
    [77] H. S. Jung and W. D. Doyle, Fellow, IEEE Trans.Magn.38, 2015
    (2002)
    [78] H. S. Jung and W. D. Doyle, Fellow, IEEE Trans. Magn.39, 679 (2003)
    [79] H. S. Jung and W. D. Doyle, Fellow, IEEE Trans. Magn.37, 2294 (2001)

    下載圖示 校內:2004-08-11公開
    校外:2004-08-11公開
    QR CODE