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研究生: 戴暐哲
Tai, Wei-Che
論文名稱: 基於幾何光學之線性軸六自由度誤差量測系統開發與驗證
Development and Verification of Six-Degree-of-Freedom Error Measurement System Based on Geometric Optics for Linear Stage
指導教授: 劉建聖
Liu, Chien-Sheng
學位類別: 碩士
Master
系所名稱: 工學院 - 機械工程學系
Department of Mechanical Engineering
論文出版年: 2021
畢業學年度: 109
語文別: 中文
論文頁數: 120
中文關鍵詞: 幾何誤差歪斜光線追蹤六自由度誤差量測工具機線性軸誤差解耦合
外文關鍵詞: Geometric errors, Skew-ray tracing, Six-degrees-of-freedom measurement, Linear stage of machine tool, Error decouple
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  • 本論文提出利用幾何光學原理,來設計線性軸長行程六自由度誤差量測方法及裝置。本系統以一額外線性軸拖曳感測器,讓光點在感測器內來回移動,使其能夠突破以往幾何光學量測受到感測器大小的限制,完成長行程六自由度誤差量測。本系統對比昂貴的市售雷射干涉儀,本研究所提出的量測系統的成本更低,架構簡便,還可以同時量測六自由度誤差等優勢。
    本論文會先以Zemax光學模擬軟體模擬光路中六自由度誤差與感測器變化量的關係,再利用Matlab數學軟體利用歪斜光線追跡法建構出所有光路的正逆向數學關係,並使用曲線擬合來簡化數學模型,最後實際將系統架設起來,並實際架設到市售工具機進行量測。
    本論文也提出一能解決光學量測系統之系統誤差的方法,利用六軸史都華平台給予精確的六自由度運動,並透過數學關係計算得到真實的逆向方程式,最後將二種逆向數學進行實驗比較,確認此方法的可行性。

    In this study, a linear stage six-degree-of-freedom error measurement system based on geometry optics is provided. The proposed system utilizes an extra linear stage to drag the sensor on it, makes the light spot projected on the sensor shift back and forth when the moving stage moves. This method successfully makes long range six-degree-of-freedom error measurement become possible. Compared with commercial laser interferometers, the proposed measurement system has the advantage of lower cost, simple structure, and the capability of measuring six-degree-of-freedom error simultaneously.
    In the beginning of the study, Zemax is used to simulate the relationship between the six-degree-of-freedom error and the value of the position sensitive detectors (PSDs). After that, utilize Matlab to construct the forward and reverse mathematical kinematics model of all optical paths, and simplify the mathematical model by curve fitting. Last but not least, because of the installation error and the manufacturing error, the real reverse kinematics mathematics is obtained with the six-axis Stewart platform. In the experiment, the proposed system is set up on the commercial linear axis to measure the six-degree-of-freedom error, and verify by the commercial interferometer and electronic level.

    摘要 II ABSTRACT III 致謝 X 目錄 XI 圖目錄 XIII 表目錄 XVI 符號說明 XVII 第一章 緒論 1 1-1研究背景 1 1-2文獻回顧 3 1-2-1誤差源分析 3 1-2-2線性軸的誤差元素 6 1-2-3線性軸的誤差檢測方法 7 1-3研究動機與目的 15 1-4論文架構 18 第二章 基礎理論 19 2-1幾何光學基本原理 19 2-2齊次座標轉換 23 2-3歪斜光線追跡法 27 2-4幾何光學的折(反)射 32 2-5平坦邊界歪斜光線追跡 36 第三章 系統架構與量測原理 39 3-1系統架構 39 3-2設計原理 40 3-3光學模擬 46 3-4感測器訊號設定與確認 48 3-5趨勢與可行性分析 50 第四章 量測系統之數學模型推導 56 4-1系統參數定義及原理 56 4-2系統邊界坐標系轉換矩陣 58 4-3入射點與光線單位方向向量 64 4-4正向數學驗證 67 4-5移動軸誤差之影響 71 4-6逆向數學推導與驗證 75 第五章 系統架設與實驗 84 5-1系統元件介紹 84 5-2 LabVIEW量測程式 88 5-3量測系統之系統誤差討論 89 5-4實驗結果 96 第六章 結論與未來展望 105 6-1結論 105 6-2未來展望 105 參考文獻 110

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