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研究生: 林承翰
Lin, Chen-Han
論文名稱: 結構照明於時域聚焦多光子激發顯微術之提升
Improvements of Temporal Focusing-based Multiphoton Excitation Microscopy by Using Structured Illumination
指導教授: 陳顯禎
Chen, Shean-Jen
學位類別: 碩士
Master
系所名稱: 工學院 - 工程科學系
Department of Engineering Science
論文出版年: 2016
畢業學年度: 104
語文別: 中文
論文頁數: 47
中文關鍵詞: 廣視域多光子激發數位微型反射鏡元件結構照明顯微術空間解析度軸向激發侷限
外文關鍵詞: Widefield multiphoton excitation microscopy, digital micromirror device, structure illumination microscopy, spatial resolution, axial excitation enhanced
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  • 時域聚焦多光子激發顯微術(temporal focusing multiphoton excitation microscopy,TFMPEM)能達到大面積的激發,提高幀速度,且保留了多光子的激發特性。TFMPEM中主要的元件有鈦藍寶石雷射再生放大器超快雷射(Ti:sapphire regenerative amplifier)為激發光源(重複率為10 kHz,脈衝能量在100 fs的脈衝寬度下高達400 μJ/pulse),使用高靈敏度的電子倍增電荷耦合元件(electron multiplying charge-coupled device,EMCCD)來取像,在60 × 60 μm2的面積下,可得到幀速度高於100 Hz的大面積螢光影像。然影像的側向空間解析度(lateral spatial resolution)受限於光學繞射極限(diffraction limit),被侷限在數百奈米以上,而軸向激發侷限(axial excitation confinement)受限於光學繞射極限與後焦平面(back-focal plane)光束能量分布問題,被限制在數個微米等級。為了突破影像側向空間解析度限制,採用了超高解析度非線性結構性照明顯微術來處理(super-resolution nonlinear structured-illumination microscopy,SRNSIM),論文中利用數位微型反射元件(digital micromirror device,DMD)取代傳統光柵,同時作為繞射元件以及產生結構圖案,其側向解析度由420 nm減至230 nm,約提升1.82倍。
    軸向激發侷限的突破,先以結構光繞射方向與不同光軸夾角方式實驗,再以不同空間頻率圖案進行,了解軸向激發侷限變化情形。因此設計出軸向激發侷限提升較多的結構照明來疊加和調變,可使系統軸向激發侷限由2.8 μm 提升到1.4 μm,約增進了2倍。最後,利用軸向激發侷限相差較大的結構照明打在樣品上做分析比較,驗證在軸向激發侷限提升較多的結構照明下,因所激發的軸向區域較小,所擷取到的雙光子螢光影像的結構圖案較清晰不模糊。

    Temporal focusing multiphoton excitation microscopy (TFMPEM) has a larger excitation area. Moreover, it not only has high frame-rate capability but also holds the advantage of two photon excitation. In our lab-made TFMPEM system, the key components include a titanium-sapphire regenerative amplifier, a titanium-sapphire ultrafast oscillator as the seed beam of the amplifier, an upright optical microscope, an electron multiplying charge-coupled device (EMCCD) camera. The regenerative amplifier has a peak power of 400 μJ/pulse, with a pulse width of 90 fs and a repetition rate of 10 kHz. Based on the above configuration, the ability of axial resolution and the multiphoton excitation area is larger than 60 × 60 〖μm〗^2. Furthermore, the frame rate higher than 100 Hz can be achieved. Due to the spatial resolution restricted by the diffraction limit, the lateral resolution is limited in sub-nanometers and the axial resolution is limited in submicrons. Dealing with the diffraction limit, the super resolution linear/nonlinear structured illumination microscopy (SR-SIM/NSIM) has been adopted.
    In this thesis, first, we tried different diffraction angles combine with different spatial frequency sinusoidal patterns to estimate the characteristic of axial resolution. Due to the observation, we designed structured patterns with different orientation and changed spatial frequency. In the result of our experiments, we can design a pattern to achieved the axial resolution from 2.8 μm to 1.4 μm, it increased two times effect than before. Finally, we demonstrated that the different axial confined enhancement will affect the contract of images when we focused on the same depth in a temporal focusing setup.

    摘要 I Extended Abstract III 誌謝 VII 圖目錄 X 第一章 序論 1 1-1前言 1 1-2文獻回顧 2 1-3研究動機與方法 3 1-4論文架構 4 第二章 超快雷射激發與時域聚焦機制 5 2-1多光子激發 5 2-2空間聚焦與時域聚焦 6 2-3系統架構 9 2-4麥克森干涉儀與色散補償 11 第三章 超高解析度非線性結構照明顯微術 與其側向解析度提升 16 3-1超高解析度結構性照明 16 3-1-1理論架構 17 3-1-2模擬分析 17 3-2超高解析度非線性結構性照射顯微術 21 3-2-1理論架構 21 3-2-2模擬分析 23 3-3實驗結果 25 3-3-1結構性照射空間頻率 25 3-3-2SR-NSIM於側向解析度的提升 28 第四章 結構照明於軸向激發限制的突破 30 4-1於後焦平面光束分佈對於軸向激發侷限的影響 30 4-2結構照明之結構方向與空間頻率 31 4-3不同頻率疊加的軸向激發侷限能力效果 35 4-4飽和結構的軸向激發侷限能力效果 36 4-5軸向激發侷限增進實際效果 39 第五章 結論與未來展望 42 參考文獻 45

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