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研究生: 陳燦文
Chen, Tsan-Wen
論文名稱: 殼核鎵粒子漿料之轉移與開殼製程優化
Optimization of transferring and releasing process for core-shell Ga-particle pastes
指導教授: 林士剛
Lin, Shih-Kang
學位類別: 碩士
Master
系所名稱: 工學院 - 材料科學及工程學系
Department of Materials Science and Engineering
論文出版年: 2019
畢業學年度: 107
語文別: 中文
論文頁數: 127
中文關鍵詞: 銅對銅接合次微米鎵基粒子漿料轉移開殼製程
外文關鍵詞: Cu-to-Cu interconnection, Submicron Ga particles, Paste transferring, Releasing process
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  • 本實驗室過去開發 Cu/Ni/Ga/Ni/Cu 的固溶型暫態液相接合技術[1] [2] [3],輔以聲化學合成法製備次微米 Ga 粒子基漿料,改善 Ga 基材料的保存性,最佳的接合條件為利用 Cu/0.1 μm Ni/酸性助銲劑/次微米 Ga 粒子/0.1 μm Ni /Cu 的三明治結構於 300 ℃、10 MPa 下熱壓接合 1 小時,得到接合界面為 FCC-(Cu, Ni, Ga) 固溶相接點,具有 13 MPa 的接合強度,且隨著長時間的高溫儲存後,其接合強度會逐漸提升,足以補足初始強度稍低的部分,為應用於功率元件的一大優勢,目前已在美國、日本、中國、台灣取得專利。但目前還沒有塗佈參數定量化之相關數據,而噴墨列印法為可靠的漿料轉移技術,不僅可精確控制漿料塗佈量,更可以快速轉移單點或單面的漿料,期許未來能投入工業級生產。漿料轉移製程使用壓電噴墨機,將波形參數固定為 Trise = 30 μs, Tdwell = 20 μs, TFall = 15 μs, TEcho dwell = 15 μs, Trise = 5 μs,脈衝電壓為 ±50 V,墨滴間距 200 μm,可形成穩定不分裂的墨滴,實際印製可得一規則的陣列。從微觀角度檢視,Ga 粒子於溶劑範圍中覆蓋率約 50%,厚度僅約 0.450 μm,較過往塗佈方式如微量滴管,其厚度降低一倍左右。漿料中之 Ga 粒子的開殼製程為一重要環節,透過合適的酸性助銲劑可以快速打破外圍氧化殼層,幫助液態 Ga 在更短時間內往兩側基板擴散,有助於之後往低溫、短時間的接合製程優化。我們期望 Ga 粒子與助銲劑在室溫不反應,維持設計的噴印陣列分布,避免 Ga bulk 被擠壓而分布不均。待闔上上板與下板後,升溫至 150˚C 以上才發生破殼。因此在不同溫度下的開殼臨界 pH 值是一重要資訊。以鹽酸與乙二醇混和溶液進行開殼實驗,當環境溫度為 30˚C,粒子開殼的臨界 pH 值為 0.7。當環境溫度上升至 90˚C,粒子開殼的臨界 pH 值為 1.2。另以鹽酸與去離子水混和溶液進行開殼實驗,當環境溫度為 30˚C,粒子開殼的臨界 pH 值為 1.4。當環境溫度上升至 90˚C,粒子開殼的臨界 pH 值為 1.6。比較使用不同溶劑 (乙二醇/水) 的開殼後形貌,發現以去離子水配置的鹽酸水溶液開殼效果較符合需求。在高溫 90˚C 時,當溶液 pH ≤ 1.6,只需 3 分鐘即可完全開殼,Ga bulk 的直徑僅約 0.5~5 μm,分布相當均勻且緊密。此部分可作接合溫度優化之參考。

    For the paste transfer, we are trying to confirm and control the Ga amount by inkjet printing. The transfer method using now can provide a thin Ga SMPs layer with the help of UV light cleaning. Fix the waveform parameters as Trise = 30 μs, Tdwell = 20 μs, TFall = 15 μs, TEcho dwell = 15 μs, Tr ise= 5 μs, and pulse voltage is ±50 V, which can form stable ink drops and obtain a regular array. The coverage of Ga particles in solvents is nearly 50%, and the thickness is only about 0.450 μm. Compared with the previous coating methods such as micropipette and spin coating, the thickness is reduced by about one time. For another subject, we try to figure out the releasing process between the pH value and releasing ability. Mixing a solution of hydrochloric acid and ethylene glycol. When the temperature is 30 ̊C, the critical pH is 0.7. When the temperature rises to 90 ̊C, the critical pH is 1.2. In addition, a mixture of hydrochloric acid and deionized water is used for the experiment. When the temperature is 30 ̊C, the critical pH is 1.4. When the temperature rises to 90 ̊C, the critical pH is 1.6, it takes only 3 minutes to completely release. Diameter of Ga bulk is about 0.5~5 μm, and the distribution is uniform and close. This section could be the reference for the critical pH value at 150 ̊C and the optimization of bonding temperature.With the check on transferring and releasing process for core-shell Ga-particle pastes, we are looking forward to the reproducibility of good bonding interface.

    摘要 i Abstract ii 誌謝 xvii 目錄 xviii 圖目錄 xxi 表目錄 xxviii 第一章 前言 1 第二章 文獻回顧 3 2.1 電子構裝技術 3 2.1.1 三維度積體電路 3 2.2 銅對銅接合技術 6 2.2.1 暫態液相接合 6 2.2.2 Cu/Ga 介面反應 8 2.2.3 Cu/Pt/Ga/Pt/Cu 接合 10 2.2.4 Cu/Ni/Ga/Ni/Cu 固溶型暫態液相接合 11 2.2.5 GaSMPs 合成與性質 13 2.2.6 Cu/Ni/flux/Ga SMPs/Ni/Cu 接合 19 2.3 噴墨印刷技術 21 2.3.1 技術演進 21 2.3.2 連續式噴墨列印 22 2.3.3 自控式噴墨列印 22 2.3.4 壓電式噴墨列印 22 2.4 粒子開殼方式及優化機制 24 2.4.1 膏狀助銲劑 24 2.4.2 液態助銲劑 25 2.4.3 酸性溶劑 (鹽酸) 26 2.4.4 酸性溶液 pH 值與溫度之關係 27 第三章 實驗步驟 30 3.1 鎵基粒子合成與分析 30 3.2 電鍍鎳 31 3.3 漿料與基板接觸角量測 (最佳時間&持續時間) 31 3.4 鎵粒子基漿料轉移 31 3.5 塗佈漿料之覆蓋率及厚度 33 3.6 鎵粒子與酸性溶液之反應 33 第四章 結果討論 35 4.1 鎵粒子基漿料 35 4.1.1 鎵粒子表面形貌及性質 35 4.1.2 電鍍 Ni 鍍率 37 4.1.3 紫外光清潔時間對漿料與 Ni 表面潤濕性影響 39 4.2 噴墨列印法進行漿料轉移 41 4.2.1 噴墨列印機校正 41 4.2.2 不同脈衝電壓之墨滴基本性質 43 4.2.3 不同脈衝電壓之塗佈厚度與覆蓋率 46 4.3 鎵粒子基漿料與開殼臨界 pH 值探討 (鹽酸水溶液) 61 4.3.1 在室溫 30˚C 下之開殼狀況 62 4.3.2 在高溫 90˚C 下之開殼狀況 78 4.4 鎵粒子基漿料與開殼臨界 pH 值探討 (鹽酸+乙二醇) 86 4.4.1 在室溫 30˚C 下之開殼狀況 86 4.4.2 在高溫 90˚C 下之開殼狀況 96 第五章 結論與未來展望 105 第六章 參考文獻 107 第七章 附錄 111 7.1 接合材料之機械性質與熱傳性質 111 7.1.1 Cu/Sn/Cu 接合實驗 113 7.1.2 微結構分析 113 7.1.3 剪切強度量測及破斷面分析 114 7.1.4 熱擴散係數量測 117 7.1.5 比熱容量測 119 7.2 噴墨列印之補充數據 120 7.2.1 不同固含量之噴印狀況 120 7.2.2 固定脈衝電壓 50 V 之噴印情況 123 7.3 開殼後 Ga bulk 分析 126

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