| 研究生: |
朱言主 Ju, Yen-Juu |
|---|---|
| 論文名稱: |
IC 封裝模具黏著效應之研究 A Study on the Adhesion Between EMC and IC Package Mold |
| 指導教授: |
李輝煌
Lee, Huei-Huang |
| 學位類別: |
碩士 Master |
| 系所名稱: |
工學院 - 工程科學系 Department of Engineering Science |
| 論文出版年: | 2002 |
| 畢業學年度: | 90 |
| 語文別: | 中文 |
| 論文頁數: | 104 |
| 中文關鍵詞: | 田口氏實驗設計法 、黏著力 、黏著效應 、IC構裝 |
| 外文關鍵詞: | IC Packaging, EMC, Mold Adhesion Force, Taguchi’s Method |
| 相關次數: | 點閱:119 下載:10 |
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在電子IC構裝封膠製程中,封膠材料(EMC;Epoxy Molding Compound)在熟化成型過程中會與IC模具表面產生黏著的現象,稱之為黏著效應(Adhesive Effects);而此黏著效應對於脫模作業過程會有所影響,甚至可能會造成封膠失敗、可靠度不佳與生產良率降低等結果。所以如何在不影響現有模具設計前提下,能夠藉由適當的表面處理以及鍍膜選擇,來有效改善封裝生產線產能,是目前產業界及研究單位所重視的主題。
本論文將利用已開發完成的一套電子構裝黏著力量測技術來進行界面科學的研究,並且配合田口氏實驗設計法,針對影響IC封裝模具與塑料膠體間黏著力之重要製程參數可控制因子,進行因子效應的研究。且進行各因子對黏著力的因子效應、因子與表面處理之交互作用等工作事項,進而得知各製程參數控制因子對黏著效應的關係。
同時,本論文也將利用自行發展的量測技術,配合膠體且搭配IC構裝製程中的製程參數來進行連續實驗,並觀察其黏著力量的趨勢,希望可以找出黏著效應發生的原因,確實掌握清模時機,進而增加產能,解決黏模問題,以減少黏模效應所產生的不良影響。
In IC packaging, when epoxy molding compound(EMC)is filling the mold cavity and cured in the mold, adhesion occurs in the interface between EMC and mold surface. Too large an adhesion force can damage an IC and lower the yield rate.
In this project, we will use the adhesion tester to measurement adhesion force in the interface between EMC and mold surface. By measuring the adhesion force, we can judge how much does a specific type of surface treatment help in reducing the amount of mold adhesion force. In this project, we also study the IC encapsulation mold adhesion force using Taguchi’s parameter design method. By using Taguchi’s method, we can determine what parameters are important for reducing the magnitude of adhesion force between EMC and mold surface.
In IC encapsulation process, some residue substance will adhere to the mold surface after 500 to 600 shots. Using the EMC adhesion force test technology, one can measure the adhesion force between mold surface and EMC continuously. By recording the adhesion force and analyzing the mold surface, we can understand more about what happened and key issues for mold adhesive effects in IC encapsulation process.
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