在本實驗中，我們利用新的檢測方法最佳化石墨烯薄膜。傳統量測技術如電阻量測及顯微鏡觀測僅能顯示出粗略或局部的特性，如均勻性或特定區域的表面形貌。然而藉由應變量測，我們可以得知石墨烯微片之間重疊的平均變化，而阻抗量測可以提供更多有關微片彼此重疊多寡的資訊。藉由沉積方法、溶劑與材料的調整，以及新的檢測方法之應用，使我們得以提升石墨烯薄膜的品質。
這些實驗結果提供了未來應用上的更多可能性，包含石墨烯微片重疊之無線讀取以及遙測應變計之應用。

We have applied novel characterization methods to the optimization of graphene thin films. Traditional measurement techniques such as resistance measurements and microscopy can only reveal global or local properties, such as uniformity or selected morphologies. Strain measurements, on the other hand can yield information on the average change in overlap between flakes. Impedance measurements can complement this information by providing information on the magnitude of the overlap. Our method was applied to improving the quality of graphene films by varying deposition, solvent, and material.
These results open up a route to wirelessly reading out graphene overlap for application in remote strain sensors.

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