研究生: |
賴啟弘 Lai, Chi-hung |
---|---|
論文名稱: |
實作以最早截止優先演算法為基準之節能排程 Implementation of an EDF-based low energy scheduling algorithm |
指導教授: |
楊竹星
Yang, Chu-sing |
學位類別: |
碩士 Master |
系所名稱: |
電機資訊學院 - 電腦與通信工程研究所 Institute of Computer & Communication Engineering |
論文出版年: | 2008 |
畢業學年度: | 96 |
語文別: | 中文 |
論文頁數: | 35 |
中文關鍵詞: | 可靠度 、靜態功率 、熱循環 、動態功率 、漏電流 |
外文關鍵詞: | dynamic power, static power, leakage current, reliability, thermal cycling |
相關次數: | 點閱:148 下載:3 |
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隨著嵌入式手持裝置的普及,對人類的生活帶來相當大程度的便利性,然而隨著嵌入式系統的功能越來越多、越來越強大,對於只依賴電池完成工作任務的手持式裝置,首當其衝的便是電力的蓄航力。
目前有許多的相關研究在於改善動態功率的消耗,只有少部份的研究在於因漏電流而產生的靜態功率損耗。這是由於漏電流是半導體元件在運作時所產生的物理現象,因此漏電流現象的改善大多是由製程技術來改進。
本論文的內容,提出一個在週期性的工作任務中,同時改進動態功耗與靜態功耗的排程演算法。並為了加強硬體的可靠度,在同時改善動態功耗與靜態功耗的情況下,再進一步的降低因排程演算法使處理器在狀態改變時所產生的熱循環。
With the popularity of embedded handheld device, human’s life can be greatly convenient. However, with the more and more functions attached to the embedded system, the great impact is that the energy on which the handheld devices depend may not be enough.
There is a lot of research that focus on improving the dynamic power consumption, but only few research is concerning static power consumption owing to the leakage current. Leakage current is the physical phenomenon and occurs when the semiconductor element active, therefore the leakage current phenomenon is mostly improved by process technology.
It is proposed that a scheduling algorithm to improve both dynamic and static power consumption under the condition of periodic tasks in the paper. And also in order to enhance the reliability of the hardware following the reduction of dynamic and static power consumption, the scheduling algorithm reduces the thermal cycling owing to the change of the CPU state.
參考文獻
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