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研究生: 黃郁文
Huang, Yu-Wen
論文名稱: 運用聚焦離子束製作柱狀氮化銦鎵/氮化鎵發光二極體之研究
Study of Rod-typed InGaN/GaN Light Emitting Diodes by Focused Ion Beam Milling
指導教授: 劉全璞
Liu, Chuan-Pu
學位類別: 碩士
Master
系所名稱: 工學院 - 材料科學及工程學系
Department of Materials Science and Engineering
論文出版年: 2010
畢業學年度: 98
語文別: 中文
論文頁數: 91
中文關鍵詞: 聚焦離子束氮化銦鎵/氮化鎵多重量子井濕式蝕刻柱狀發光二極體
外文關鍵詞: focused ion beam (FIB), InGaN/GaN multiple quantum wells, wet etching, rod-typed LED
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  • 本研究運用聚焦離子束(FIB)在不同的離子束蝕刻深度、電流滯留時間和不同密度二維的點陣圖,於傳統的薄膜式發光二極體表面製作出三維的柱狀發光二極體結構。因FIB高能量的鎵離子束易破壞柱狀發光二極體表面氮化鎵結晶性,產生具有缺陷的非晶層,吾人使用氫氧化鉀/乙二醇溶液,運用其對氮化鎵材料的方向有選擇性蝕刻,進而去除柱狀發光二極體表面的非晶層,留下結晶性良好的柱狀發光二極體,使得從主動層放出的光子能夠有效釋放至空氣中。由陰極射線螢光光譜(CL)可觀察到柱狀發光二極體發光強度較傳統薄膜式發光二極體增強2.85倍。
    於微米級的光致發光光譜(micro-PL)可觀察到氮化銦鎵的發光波長會有藍移117 meV的現象且發光強度會增強1.5倍。前者是因為柱狀發光二極體能夠釋放因磊晶過程中產生的應力,使壓電場極化效應減弱。此外受到內部電場影響,電子的波函數減弱,因此電子需要更大的能量才能從價帶跳到傳導帶,而使得空間的量子侷限效應增強。後者為當發光二極體為柱狀結構時,其表面為拋物線狀,則光較易從柱狀結構表面釋放,而不似薄膜結構易在發光二極體內部產生全反射。
    從發光二極體從薄膜製作成柱狀結構,不僅受到離子束轟擊和濕式蝕刻的影響,也受到後續填入SOG、ITO以及電極的覆蓋等不同材料,然而光萃取效率卻有顯著的提昇,這些原因將會影響元件的理想因子、串聯電阻、光輸出功率和外部量子效應的表現。

    The research utilized focused ion beam (FIB) fabricating rod-typed light emitting diodes (LED) by changing the ion beam milling depth, dwell time, and the bitmap patterns on the conventional thin film LED. However, FIB had high energy of gallium ions which damaged the GaN crystallinity on the surface of rod-typed LED. We used the KOH/ Ethyl Glycol etchant in order to remove the amorphous layer and remain high crystal quality of the rod-typed LED. This etchant was able to practice selective etching on z-axis of GaN. Due to chemical wet etching, photons from the active layer of the rod-typed LED emitted easier than conventional LED, and the intensity increased by the factor up to 2.85 in CL spectrum.
    It is observed in the micro-photoluminescence (micro-PL) spectrum that there was a blue shift of 117meV on the InGaN wavelength and the intensity enhancement of light emission by a factor of 1.50. The former was caused by the reduction of piezoelectric field polarization because rod-typed LEDs were able to release the stress which formed by MOCVD epitaxial technology. Besides, the electronic wave functions of internal electron field diminished that electrons needed more energy to jump from the valence band to the conduction band, and the quantum confinement effect increased. The latter was formed by parabolic surface on the rod-typed LEDs. The light escaped from the surface of the rod-typed LEDs easier than from thin film, and the light had not tendency to total reflection comparing to the thin film LED.
    The rod-typed LED was built on the conventional LED, and it was not only affecting by ion beam milling and chemical wet etching, but also by capping different materials, such as SOG, ITO, and pads. Those reasons played important roles on the ideality factor, series resistance, light output power, and external quantum efficiency.

    目錄 摘要 I Abstract III 致謝 V 目錄 VII 表目錄 X 圖目錄 XI 第一章 前言與研究目的 1 1-1前言 1 1-2 研究目的 5 第二章 理論基礎與文獻回顧 9 2-1 三五族氮化物半導體 9 2-2 極化效應 12 2-2-1壓電場極化效應(Piezoelectric field) 12 2-2-2量子侷限效應(Quantum confined effect) 15 2-3量子結構簡介 17 2-3-1由下往上(Bottom up) 17 2-3-2由上往下(Top down) 20 2-3發光二極體出光性質 23 2-3-1出光效率 23 2-3-2光強度和光型圖 26 2-4 p-n接面二極體的電流-電壓特性 29 第三章 實驗方法及分析 31 3-1 實驗流程圖 31 3-2氮化銦鎵/氮化鎵發光二極體多重結構之成長 32 3-3 氮化銦鎵/氮化鎵柱狀結構的發光二極體元件製作 35 3-4 雙束型聚焦離子束(Focused ion beam, FIB) 37 3-5 微結構成份及表面分析: 41 3-5-1高解析場發射掃描穿透式電子顯微鏡 41 (High-resolution transmission electron microscopy, HR-TEM) 41 3-5-2 高解析熱場發射掃描式電子顯微鏡(High-resolution thermal field emission scanning electron microscopy, FE-SEM 7000F ) 43 3-5-3 高解析度X光繞射儀(High-resolution X-Ray diffractometer, HR-XRD) 46 3-6 光電性分析 49 3-6-1光致發光(Photoluminescence, PL) 49 3-6-2陰極射線螢光(Cathodoluminescence, CL) 52 3-6-3電致發光(Electroluminescence, EL) 53 第四章 結果與討論 55 4-1 柱狀發光二極體之表面形貌 55 4-2 氮化銦鎵發光二極體之銦含量和發光波長之估算 62 4-2-1氮化銦鎵/氮化鎵多重量子井之平均週期厚度計算 62 4-2-2氮化銦鎵/氮化鎵多重量子井之銦含量和發光波長計算 65 4-3 氮化銦鎵/氮化鎵多重量子井之柱狀發光二極體光性 68 4-4 發光二極體薄膜與柱狀發光二極體結構之電性 73 4-4-1 氮化銦鎵發光波長與電流之關係 73 4-4-2 發光二極體的電流、電壓特性以及理想因子和串聯電阻之關係 76 第五章 結論 81 第六章 參考文獻 84

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