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研究生: 黃勁華
Huang, Chin-Hua
論文名稱: EMC與金屬介面剪向及正向黏著力測試機之設計與改良
Design and Improvement of a Testing Machine for Shear and Normal Adhesion Force between EMC and Metal
指導教授: 李輝煌
Lee, Huie-Huang
學位類別: 碩士
Master
系所名稱: 工學院 - 工程科學系
Department of Engineering Science
論文出版年: 2004
畢業學年度: 92
語文別: 中文
論文頁數: 80
中文關鍵詞: 封膠材料黏著效應電子封裝
外文關鍵詞: EMC, Adhesion, IC Packaging
相關次數: 點閱:58下載:2
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  •   在電子構裝製程中,封膠材料在熟化成型過程中會與其他異質材料如模具表面、基板(Substrate)以及導線架(Leadframe)之間產生黏著的現象,稱為黏著效應(Adhesive Effects),而此黏著效應對於不同材料有不同的效果。對於模具而言,黏著效應會造成產品的黏模,而影響產品的品質。但對於基板或導線架而言,黏著的效應越大,所達到的可靠度就越高。但黏著力的形式分為的正向黏著力與剪向黏著力,因此希望能夠準確的得知此兩種力之大小,進而找出一些方法來改善產品的品質。
      本研究針對此黏著效應,承接一套由本實驗室學長 林俊宏先生所研發的自動化電子封裝黏著力測試儀器並改善其模具和機台相關設備,使此測試機台更加完善。希望藉由發展此套的黏著力量測設備和技術,能確實量測在封裝過程中所產生的正向及剪向黏著力。

      In IC packaging, when epoxy molding compound(EMC)is filling the mold cavity and cured in the mold, adhesive effects occur in the interface between mold surface, substrate, leadframe and EMC. Adhesive effects are good for leadframe and substrate, because the larger adhesion causes the better reliability. But, the adhesion between mold and EMC will affect the products quality. Normal and shear adhesion force exist in the IC packaging. So we want to understand the exact value and avoid the problems.
      This study is focus on adhesion effects. We improve the mold and equipments of the auto IC packaging testing machine which was made by Lin, Jin-hon. We must make it better and hope to measure the exact normal and shear adhesion force during IC packaging process.

    摘要 I Abstract II 誌謝 III 目錄 IV 圖目錄 VIII 表目錄 XI 符號說明 XII 第一章 緒論 1 1.1 前言 1 1.2 IC封膠製程簡介 3 1.3 封裝製程中的黏著問題 4 1.4 研究目的 6 1.5 文獻回顧 7 1.5.1 EMC黏著相關文獻 7 1.5.2 量測方式 9 1-6 本文架構 13 第二章 黏著強度量測原理 14 2.1 黏著原理 14 2.2 量測原理 16 2.3 固化原理 18 2.4 黏著強度量測資料之擷取 21 2.4.1 A/D(類比/數位) 訊號轉換 21 2.4.2 訊號解析度 22 2.5 伺服控制 23 第三章 模具與剪力檢測機構之設計 24 3.1 模具設計 24 3.1.1 模具 24 3.1.2 模穴設計 26 3.1.3 Plunger與Pot的選用 29 3.2 剪向檢測機構之設計 29 3.3 剪向檢測機構各元件之選用 31 3.4剪向檢測機構爆炸圖和組合圖 33 3.5剪向檢測機構設計圖 34 3.6 機台實體圖 35 3.7剪向檢測機構零件表 36 3.8 剪向及正向檢測模組介紹 37 3.8.1 剪向量測方式說明 38 3.8.2 正向量測方式說明 39 第四章 控制系統 40 4.1 控制系統簡介 40 4.2 人機介面控制 40 4.3 作動流程 48 4-4 資料擷取系統 51 第五章 實驗結果分析 54 5.1 設備校正 54 5.1.1 訊號干擾 54 5.2 實驗材料之選用 56 5.3 灌膠及剪向行程參數 57 5.3.1 灌膠行程參數 57 5.3.2 剪向行程參數 57 5.4 實驗步驟 58 5.5 實驗結果 59 5.5.1 機台檢驗 60 5.5.2 模具檢驗 63 5.5.3 EMC檢驗 67 第六章 結論與未來發展 69 6.1 結論 69 6.2 未來發展 70 附錄一 71 (1)灌膠行程設定 71 (2)剪向量測行程設定 72 參考文獻 73 自述 80

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