光學同調斷層掃描(Optical coherence tomography，OCT)是新穎的光學照影技術。OCT是以麥克森干涉儀為基本架構並且使用低同調光源可以針對樣本做非侵入式的內部照影。
在科學或是工業的領域上有一些技術可以量測樣本的折射率，如折射儀。然而這些技術通常只能得到樣本的折射率，為了得到樣本的幾何厚度就必須額外使用其他技術，因此研究可同時量測樣本折射率以及幾何厚度的方法是重要的。
在本論文中，我們提出一套新的光學斷層掃描系統應用於同時量測樣本折射率以及幾何厚度。此系統除了利用光纖式的結構降低外接環境的干擾之外，同時利用光程差的概念設計而成，最後以穿透較佳的玻璃來測試本系統的可行性。

Optical coherence tomography (OCT), based on Michelson interferometer and utilizing low coherence light as the optical source, is a novel optical imaging technique used to perform noninvasive image of internal structures material.
There are some techniques such as the refractometry are often used to measure the refractive index of the sample both in science and industry. In order to measure the thickness of the sample, must add the other technique to the system. Therefore, to find a method of simultaneous measurement of refractive index and thickness of sample is important.
In this thesis, we present a novel OCT scheme for measurement of refractive index and thickness of sample simultaneously. This system utilizes optic-fiber type structure to reduce the interference of the real environment, and use the conception of the optical path distances to design. We utilize the penetrating better glass to test the feasibility of this system finally.

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