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研究生: 鍾慶樺
Chung, Chin-Hua
論文名稱: 微電子廠之振動分析
Vibration Analysis of Microelectronic Plants
指導教授: 蕭樂群
Shiau, Le-Chung
學位類別: 碩士
Master
系所名稱: 工學院 - 航空太空工程學系
Department of Aeronautics & Astronautics
論文出版年: 2002
畢業學年度: 90
語文別: 中文
論文頁數: 85
中文關鍵詞: 振動微電子廠
外文關鍵詞: vibration, microelectronic
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  • 中文摘要
    微電子廠之振動分析
    研 究 生:鍾慶樺
    指導教授:蕭樂群

    本文的目的在分析高鐵通過南科對台積電晶圓六廠中晶圓平台振動值的影響。透過以有限元素法為基礎之結構動力分析軟體SAP2000,來模擬建構微電子廠房的整體結構。在模型建構過程中,為了降低系統的自由度,將三樓由格子樑簡化成相當之彈性樓板。在歷時分析中使用Ritz向量來計算出節點速度,再利用微振分析換算成振動分貝值。從分析得到在三方向振動波中,以Y方向所造成的振動分貝值最大。隨著結構阻尼值逐漸遞增,晶圓平台處振動值呈現逐漸遞減的現象。提高柱之彈性模數,對於降低三樓之振動量相當有限。

    Abstract

    Vibration Analysis of Microelectronic Plants

    Student;Chin-Hua Chung
    Advisor;Le-Chung Shiau

    The purpose of this thesis is to study the micro-vibration at the wafer platform of the TSMC 6th plant induced by the high-speed train passing through Tainan Science-based Industrial Park. The finite element model of the microelectronic plant is created by the use of SAP2000 computer code. For order to reduce the huge degree-of-freedom(DOF) contained in the complicated grid floor system, an equivalent plate system is created to replace the gird floor system. Ritz vector modal method is employed to perform the time history analysis. The obtained velocity at each node is then transformed to decibel(dB) value by micro-vibration analysis. Results show that the y-direction ground acceleration caused the largest vibration value. Structure damping value would reduce the wafer platform. Change material strength will slightly reduce the dB value.

    目 錄 中文摘要 英文摘要 誌謝 目錄 表目錄...........................................................I 圖目錄...........................................................II 符號說明.........................................................IV 第一章 緒論......................................................1 第二章 基本理論..................................................5 2-1 有限元素理論...........................................5 2-1-1 樑柱元素.................................................5 2-1-2 板元素..................................................13 2-2 歷時分析................................................21 2-2-1 直接積分法...............................................21 2-2-2 特徵向量.................................................23 2-2-3 Ritz向量.................................................25 2-3 微振量測理論............................................28 第三章 電腦模型之建立...........................................30 3-1 SAP2000簡介及廠房簡介...................................30 3-2 三樓樓版之電腦模擬......................................32 3-3 二樓樓版之電腦模擬......................................35 3-4 加載晶圓設備質量........................................37 3-5 基礎振動源..............................................38 第四章 分析結果與討論...........................................40 4-1 自由振動分析與Ritz向量分析..............................40 4-1-1 自由振動分析............................................40 4-1-2 Ritz向量分析............................................41 4-2 廠房之微振分析..........................................42 4-2-1 無結構阻尼之廠房微振分析..................................42 4-2-2 結構阻尼對微振之影響......................................44 4-2-3 結構勁度改變對微振之影響..................................46 第五章 結論.....................................................48 參考文獻.........................................................82 自述.............................................................84 著作權聲明.......................................................85

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