以線性紫外偏振光照射含有感光基的液晶配向劑，一般稱為紫外光配向法，簡稱光配向(photoalignment)，在非接觸式配向方法中光配向最常為人使用。Nissan RN1349是光配向中較常使用的配向材料，本論文針對此種配向劑提供了一個可以改善配向效能的新方法。我們首先將E7液晶材料和光聚合單体monomer(NOA65)所混成的化合物塗佈在已完成光配向製程的RN1349配向層的ITO玻璃基板上，再利用不同參數的紫外光照射使光聚合單體在配向層表面鍵結成一層高分子薄膜(polymerized thin film)，此高分子薄膜經過原子力顯微鏡(atomic force microscope, AFM)觀察後我們發現雖然它沒有形成網狀結構，但仍具有液晶配向效果。且經過量測後和單一配向層比較起來具有較好的光電穩定性。我們並可以利用不同的照光參數來控制此高分子薄膜的結構，我們認為此研究結果可以用來改善以往光配向穩定性不足的缺點。在實驗中所使用的觀測儀器，包括偏光顯微鏡(polarized optical microscope, POM)、掃描式電子顯微鏡(scanning electron microscope, SEM)、原子力顯微鏡(atomic force microscope, AFM)及用來量測光穿透率-外加電壓(V-T curve)的量測系統.

Includes the photosensitivity base by the linear ultraviolet polarized
light illumination the liquid crystal to match to the medicinal preparation，Is called the ultraviolet ray to match to the law, the abbreviation light matchesto (photoalignment). Nissan RN1349 is the light matches matching whichcomparatively often uses to the center to the material ,the present paper inview of this kind matches to the medicinal preparation provides to be allowed to improve matches to the potency new method. We first the compoundwhich photocurable monomer (NOA65) mixes the E7 liquid crystal materialspread the cloth in complete the light to match match to system regulationRN1349 to on the level ITO glass foundation plate, Again uses the differentparameter the ultraviolet ray illumination to cause the monomer to match to
the level surface key forms a building store height member thin film (polymerized thin film)，This high polymer thin film passes through atomic force the microscope(AFM)observes us to discover although it has not formed thenetwork structure, but still had the liquid crystal to match to theeffect. Afteralso passes through to measure and solely matches to the levelcompares has
the better photoelectricity stability. We use the different photo-indensity parameter to control this high polymer thin film the structure , we thought
this findings may use for to improve the former light to match the shortcoming which is insufficient to the stability.Off-carriage instrument uses which
in the experiment, including the polarizing microscope (POM), the scanning type electron microscope (SEM),atomic force microscope(AFM) anduses for the quantity light measuring transmission-external voltage(V-T curve)to measure the system.

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