本研究以水溶性高分子聚乙烯醇（PVA）及聚（乙烯吡咯烷酮-共聚-丙烯酸）（PVPAA）為保護劑製備鎳奈米線。PVPAA由水相自由基聚合法製備，本研究使用的共聚物VP/AA比例組成經由1H NMR測量後得知為98/2、92/8及89/11。鎳奈米線的大小及外型可藉由調整PVA及PVPAA的濃度來控制並由SEM確認結果。鎳線直徑降低是因PVA及PVPAA會吸附於鎳金屬表面並形成立體障礙使鎳金屬不會二次凝聚。以PVPAA為保護劑的系統中，高分子中的AA可螯合鎳離子，使鎳離子被還原的速率減慢，因此鎳線直徑會更低。而藉由FT-IR及EDS的測量結果可確認高分子會吸附於鎳線表面。XRD的結果顯示鎳線為fcc結構，高分子濃度提高有助鎳晶體呈線成長。藉由SQUID VSM量測結果，可得知鎳奈米線之保磁力會隨鎳線直徑降低而提高。

In this study, water-soluble polymer poly(vinyl alcohol) (PVA) and poly(vinyl pyrrolidone-co-acrylic acid) (PVPAA) copolymers were employed as protecting agents to synthesize Ni nanowires (NWs). The size and morphology of Ni NWs, obtained by SEM, can be controlled by the molar ratio of PVA/Ni2+ or copolymers/Ni2+. The XRD patterns of Ni NWs show characteristic diffractions for nanocrystalline fcc Ni and preferential orientation in wire axis. The coercivity of the Ni NWs obtained by SQUID VSM is enhanced when the diameter of Ni NWs decreases.

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