本研究中，將之前有研究過的不同長度之傳輸線法做理論的推導及應用上的延伸。在考慮相角、多重反射及邊緣效應下，所得到的介電特性與其他方法所得之特性相近。利用雙傳輸線來測量微波基板特性，不需像其他方法要有準確的TRL校正及複雜的矩陣轉換，在使用上也更為簡便。
應用DLTL量測出基板的衰減常數，在彈簧針的應用頻率下，能作為測試載具的基板。當彈簧針位於測試載具中時，兩根彈簧針之間便會有互容及互感的電氣效應出現。而彈簧針本身也會具有自容與自感的高頻特性。故在測試方法上即必需先量測單獨一根彈簧針之S參數，以先建立單一彈簧針之等效電路模型為優先目標。ADS模擬軟體，針對彈簧針的結構與等效電路，分別預測頻率響應及萃取等效元件值。待推導出單一彈簧針之等效電路模型後，再接續分析複雜的複
數根彈簧針之等效電路模型。

In this research, we have the theories of difference length transmission line in advanced study. We can obtained the dielectric properties by considering transformation phase, multiple reflection, and filling effect, which are more close to data sheet. The DLTL needn’t the accurate TRL calibration or the complex matrix transformation to obtain the dielectric properties of microwave substrate.
When testing in microwave region, the testing plate and Test Contact Probes need be well electrically and mechanically contacted. The design of the 4 different testing plate to obtain the different Test Contact Probes is required. As the probes positioned between the testing plate, the mutual capacitance and mutual instance between the two Test Contact Probes are appeared. Therefore measuring the S parameters of the single Test Contact Probe is required in the testing method and constructing the equivalent circuit of the single probe is being the first goal. Using the ADS simulation tool, the frequency response and the equivalent values in the structure of the Test Contact Probe can be obtained. After deriving the equivalent circuit of the single Test Contact Probe, the equivalent circuit of the multi probes can be obtained.

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