研究生: |
曾姿翊 Tseng, Tzu-Yi |
---|---|
論文名稱: |
晶圓片缺陷檢測的遮蔽效應之探討 The Masked Effect of Defect Detection from Wafer Bin Maps |
指導教授: |
鄭順林
Jeng, Shuen-Lin |
學位類別: |
碩士 Master |
系所名稱: |
管理學院 - 統計學系 Department of Statistics |
論文出版年: | 2017 |
畢業學年度: | 105 |
語文別: | 英文 |
論文頁數: | 70 |
中文關鍵詞: | 遮蔽效應 、序列測試 、晶圓圖 、HNF 空間檢定 、最大信息係數 、距離相關係數 、Radon 轉換 |
外文關鍵詞: | Masked Effect, Sequential Testing, Wafer Bin Map, HNF Test, MIC, DCOR, Radon Transformation |
相關次數: | 點閱:134 下載:14 |
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晶圓圖是半導體產業中偵測製程異常的重要參考依據。在晶粒完成製造後,電信檢測的結果會因不同的bin code 形成特殊晶圓圖像,協助工程師判斷發生錯誤的製程步驟,進而分析製造過程中的錯誤原因。然而在找尋錯誤原因時,找尋結果會受晶圓片上晶粒功能的量測機制所影響。該機制是在晶粒上發現一種功能錯誤時,便會停止其他功能的量測,故後量測bin code 的晶圓圖像可能並不完整,會受到先量測bin code 所遮蔽,而無法判定被遮蔽的後量測bin code 的原始圖像。
本論文的目的即是利用量測順序的資訊去探討bin code 是否會有被遮蔽問題,先透過空間檢定、最大信息係數、距離相關係數找尋可能存在被遮蔽問題的target bin code,考慮target bin code 和量測順序在target bin code 前的所有bin code 的遮蔽問題,而後將圖像分為可能被遮蔽以及可能佐證被遮蔽的圖像,再利用Radon 轉換等方法去判定此target bin code 是否存在遮蔽效應。
本論文提出的晶圓片遮蔽判定流程以及演算法,可以推測bin code 是否存在被遮蔽問題,以便讓工程師查找什麼原因造成晶圓片上缺陷特徵有特殊的缺陷圖形。本研究的真實分析資料都經過雜訊處理,但不影響尋找target bin code 的被遮蔽問題。
The wafer bin map (WBM) is a useful tool for detecting abnormal manufacturing processes. After the manufacture of dies in a wafer is completed, the results of the circuit probing test (CP test) may form a special WBM from a particular bin code which may help engineers to determine the defect process steps and to find the root cause of the defects in the manufacturing process. However, the mechanism of CP test is a sequential testing process. When a certain type of defect is found, the process will stop the rest of the tests and mark the die with the corresponding bin code of the defect. In other words, the result of the rest of tests will be unknown and the bin code recorded afterward may be masked by the previous defected ones. Therefore, engineers are unable to determine the overall WBM of bin codes that may be masked.
The purpose of this thesis is using the information of sequential testing to determine a bin code whether there exists a masking problem. This thesis proposes a framework integrating the method of a spatial test, Maximal Information Coefficient (MIC), and Distance Correlation
(DCOR). Moreover, we consider the masked problem with a specific bin code and all the other previously tested bin codes, and then separate the wafers with target bin code into two parts, possibly masked wafers maps and possible support for masked wafers maps. We develop an algorithm by using the Radon transform to determine the masked wafers. Some noise was added to each wafer to maintain the confidentiality of the real data.
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