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研究生: 蔡正範
Tsai, Cheng-Fan
論文名稱: 利用COMSOL Multiphysics建立物理氣相傳輸製程模擬碳化矽晶體生長及導入不同錐狀構型之探討
Development of Numerical System for Physical Vapor Transport Process Growing Silicon Carbide with COMSOL Multiphysics and Study of Introducing Different Cone-shaped Structure
指導教授: 許文東
Hsu, Wen-Dung
共同指導教授: 黃文星
Hwang, Weng-Sing
學位類別: 碩士
Master
系所名稱: 工學院 - 材料科學及工程學系
Department of Materials Science and Engineering
論文出版年: 2018
畢業學年度: 106
語文別: 中文
論文頁數: 107
中文關鍵詞: 碳化矽晶體擴晶技術氣流導引部件物理氣相傳輸法數值模擬
外文關鍵詞: Silicon Carbide, Physical Vapor Transport, Numerical simulation, Cone-shaped structure
相關次數: 點閱:135下載:47
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  • 本研究目的在於以模擬觀點建立一碳化矽晶體長晶系統,透過先行模擬計算瞭解長晶爐體內部之物理現象並提出改善方案,以減少不必要的實驗成本。本研究採物理氣相傳輸法(Physical vapor transport, PVT)模擬碳化矽晶體生長,由於物理氣相傳輸法之坩堝內部高溫低壓的密閉狀態且長晶腔內的溫度及氣氛傳輸難以經由實驗直接測量,因此利用電腦輔助設計(Computer aided design, CAD)作為分析爐體的工具是一項有效的解析途徑。
    碳化矽長晶系統現象包含電磁加熱、熱場分佈、氣氛濃度分佈以及在晶種層上的長晶行為。藉由數值方法模擬碳化矽生長製程中的熱場及氣氛傳輸進而計算晶種的長晶行為,同時分析石墨坩堝內部之物理現象提出優化方針以達到長晶最佳化(Optimization)之條件。
    本研究另一項目標基於技術已經相當成熟的4吋碳化矽長晶系統,在模擬其擴晶的過程中導入一協助改善熱場和氣氛傳輸的氣流導引部件(Cone-shaped structure)於長晶腔中。本研究針對六組不同的坩堝導引構型模擬其熱場、氣氛濃度分佈與長晶速率分佈並進一步對晶體形貌、熱應力與缺陷進行定性的預測,藉此給出較理想的坩堝構型,以達成碳化矽晶體擴晶與降低晶體缺陷的關鍵模擬技術。

    Modeling of SiC growth is considered important for the design of crucible structure and the efficiency of experiment process. This paper shows that the growth rate profile of SiC bulk crystal grown by physical vapor transport process depends strongly on crucible structure due to the variation of temperature field and species concentration distribution in growth chamber via simulation technique. The current paper aims at studying growth rate profile with different crucible structure designs by demonstrating each temperature field, species concentration distribution in the growth system. Proper crucible design can optimize the growth rate distribution which may avoid the formation of thermal stress and defects in an as-grown SiC crystal.
    To test how crucible structure affect crystal growth, six types of cone-shaped structure have been introduced into growth chamber and calculated the temperature field, concentration distribution and growth rate profile in our simulation. Numerical calculation is conducted by commercial simulation software, COMSOL Multiphysics based on finite element method (FEM), to build up PVT process for our SiC crystal growth simulation.
    In this study, the growth rate resulted from different crucible structures are presented based on simulation results. Hence, the favorable crucible structures are given out to predict crystal shape and improve crystal quality.

    摘要 I Extended Abstract II 總目錄 XI 表目錄 XIII 圖目錄 XIV 符號對照表 XVII 第一章 緒論 1 1.1 研究背景 1 第二章 文獻回顧 3 2.1碳化矽材料之特性 3 2.2碳化矽塊材之製造方法 5 2.3碳化矽塊材之晶體缺陷 9 2.4碳化矽之長晶模擬 11 2.5 研究目的 13 第三章 理論基礎 14 3.1 電磁感應理論 14 3.1.1電磁感應控制方程式 15 3.1.2電磁熱能轉換方程式 20 3.2 熱傳機制 21 3.2.1熱傳控制方程式 21 3.2.2多孔性材料之等效熱參數 23 3.3 質傳機制 24 3.3.1質傳理論 24 3.3.2氬氣流動之控制方程式 25 3.3.3反應氣氛之質傳控制方程式 26 3.4碳化矽分解與長晶之熱力學 28 3.5碳化矽之長晶動力學與長晶速率 31 第四章 數值方法 36 4.1數值模型之爐體規格 36 4.2模擬計算流程 38 4.3邊界條件與初始條件設定 40 4.3.1電磁模組 40 4.3.2熱傳模組 40 4.3.3質傳模組 41 4.3.4長晶模組 42 4.4模擬假設 44 4.5物件熱物參數 45 第五章 結果與討論 58 5.1模擬製程 58 5.2感應電磁場分佈 61 5.3穩態溫度場分佈與驗證 63 5.4暫態升溫之分佈與驗證 65 5.5氬氣流場分佈 70 5.6線圈位置效應 73 5.7加裝氣流導引部件後之溫度分佈 75 5.8長晶腔內之物種濃度與通量分佈 84 5.9長晶速率的模擬與驗證 94 5.10六組導引構型之長晶速率模擬 98 第六章 結論 102 參考文獻 104

    [1] C. Carter Jr et al., "Progress in SiC: from material growth to commercial device development," Materials Science and Engineering: B, vol. 61, pp. 1-8, 1999.
    [2] R. Siergiej et al., "Advances in SiC materials and devices: an industrial point of view," Materials Science and Engineering: B, vol. 61, pp. 9-17, 1999.
    [3] W. R. Lambrecht, S. Limpijumnong, S. Rashkeev, and B. Segall, "Electronic band structure of SiC polytypes: a discussion of theory and experiment," Physica Status Solidi (b), vol. 202, no. 1, pp. 5-33, 1997.
    [4] F. Bechstedt et al., "Polytypism and properties of silicon carbide," Physica Status Solidi (B), vol. 202, no. 1, pp. 35-62, 1997.
    [5] P. Råback, Modeling of the sublimation growth of silicon carbide crystals. Center for Scientific Computing, 1999.
    [6] M. Tatsumi, Y. Hosokawa, T. Iwasaki, N. Toyoda, and K. Fujita, "Growth and characterization of III–V materials grown by vapor-pressure-controlled Czochralski method: comparison with standard liquid-encapsulated Czochralski materials," Materials Science and Engineering: B, vol. 28, no. 1-3, pp. 65-71, 1994.
    [7] O. Kordina, K. G. Irvine, J. J. Sumakeris, H. Kong, M. J. Paisley, and C. H. Carter Jr, "Growth of Thick Epitaxial 4H-SiC Layers by Chemical Vapor Deposition," in Materials Science Forum, 1998, vol. 264, pp. 107-110: Trans Tech Publ.
    [8] Y. M. Tairov and V. Tsvetkov, "General principles of growing large-size single crystals of various silicon carbide polytypes," Journal of Crystal Growth, vol. 52, pp. 146-150, 1981.
    [9] Y. M. Tairov, "Growth of bulk SiC," Materials Science and Engineering: B, vol. 29, no. 1, pp. 83-89, 1995.
    [10] M. Dudley et al., "The mechanism of micropipe nucleation at inclusions in silicon carbide," Applied Physics Letters, vol. 75, no. 6, pp. 784-786, 1999.
    [11] H. Li, X. Chen, D. Ni, and X. Wu, "An analysis of seed graphitization for sublimation growth of SiC bulk crystal," Diamond and Related Materials, vol. 13, no. 1, pp. 151-156, 2004.
    [12] J. Liu, J. Gao, J. Cheng, J. Yang, and G. Qiao, "Effects of graphitization degree of crucible on SiC single crystal growth process," Diamond and Related Materials, vol. 15, no. 1, pp. 117-120, 2006.
    [13] Z. Herro, B. Epelbaum, M. Bickermann, P. Masri, and A. Winnacker, "Effective increase of single-crystalline yield during PVT growth of SiC by tailoring of temperature gradient," Journal of Crystal Growth, vol. 262, no. 1, pp. 105-112, 2004.
    [14] M. Selder, L. Kadinski, F. Durst, and D. Hofmann, "Global modeling of the SiC sublimation growth process: prediction of thermoelastic stress and control of growth conditions," Journal of Crystal Growth, vol. 226, no. 4, pp. 501-510, 2001.
    [15] R. Ma, H. Zhang, V. Prasad, and M. Dudley, "Growth kinetics and thermal stress in the sublimation growth of silicon carbide," Crystal Growth & Design, vol. 2, no. 3, pp. 213-220, 2002.
    [16] I. Zhmakin, A. Kulik, S. Y. Karpov, S. Demina, M. Ramm, and Y. N. Makarov, "Evolution of thermoelastic strain and dislocation density during sublimation growth of silicon carbide," Diamond and Related Materials, vol. 9, no. 3, pp. 446-451, 2000.
    [17] J.-Y. Yan, Q.-S. Chen, Y.-N. Jiang, and H. Zhang, "Improvement of the thermal design in the SiC PVT growth process," Journal of Crystal Growth, vol. 385, pp. 34-37, 2014.
    [18] J. Lu, Z.-B. Zhang, and Q.-S. Chen, "Numerical simulation of the flow field and concentration distribution in the bulk growth of silicon carbide crystals," Journal of Crystal Growth, vol. 292, no. 2, pp. 519-522, 2006.
    [19] J. Su, X. Chen, and Y. Li, "Numerical design of induction heating in the PVT growth of SiC crystal," Journal of Crystal Growth, vol. 401, pp. 128-132, 2014.
    [20] X. Liu, B.-y. Chen, L.-X. Song, E.-W. Shi, and Z.-Z. Chen, "The behavior of powder sublimation in the long-term PVT growth of SiC crystals," Journal of Crystal Growth, vol. 312, no. 9, pp. 1486-1490, 2010.
    [21] X. Liu, E.-W. Shi, L.-X. Song, and Z.-Z. Chen, "Effects of graphitization of the crucible on silicon carbide crystal growth," Journal of Crystal Growth, vol. 310, no. 19, pp. 4314-4318, 2008.
    [22] I. Matukov et al., "Modeling of facet formation in SiC bulk crystal growth," Journal of Crystal Growth, vol. 266, no. 1, pp. 313-319, 2004.
    [23] J. R. Reitz, F. J. Milford, and R. W. Christy, Foundations of electromagnetic theory. Addison-Wesley Publishing Company, 2008.
    [24] K. Wang, S. Chandrasekar, and H. T. Yang, "Finite-element simulation of induction heat treatment," Journal of Materials Engineering and Performance, vol. 1, no. 1, pp. 97-112, 1992.
    [25] R. Clarksean and Y. Chen, "Development of a Model for Induction Heating," pp. 4-10, 2002.
    [26] Q.-S. Chen, J.-Y. Yan, and V. Prasad, "Application of flow-kinetics model to the PVT growth of SiC crystals," Journal of Crystal Growth, vol. 303, no. 1, pp. 357-361, 2007.
    [27] S. Y. Karpov, V. Prokofyev, E. Yakovlev, R. Talalaev, and Y. N. Makarov, "Novel approach to simulation of group-III nitrides growth by MOVPE," MRS Internet Journal of Nitride Semiconductor Research, vol. 4, no. 01, p. e4, 1999.
    [28] S. Lilov, "Study of the equilibrium processes in the gas phase during silicon carbide sublimation," Materials Science and Engineering: B, vol. 21, no. 1, pp. 65-69, 1993.
    [29] Q.-S. Chen, H. Zhang, V. Prasad, C. M. Balkas, N. K. Yushin, and S. Wang, "Kinetics and modeling of sublimation growth of silicon carbide bulk crystal," Joural of Crystal Growth, vol. 224, pp. 101-110, 2001.
    [30] A. Elhaddad, "Growth of SiC by high temperature CVD and Application of Thermo-gravimetry for an In-situ growth rate measurement," 2010.
    [31] S. Chen and S. Saxena, "Thermal conductivity of argon in the temperature range 350 to 2500 K," Molecular Physics, vol. 29, no. 2, pp. 455-466, 1975.
    [32] Specific Heat and Individual Gas Constant of Gases. [Online].
    [33] 黃家輝, "物理氣相傳輸法生長碳化矽單晶之數值模擬系統建立及其製程探討," 材料科學及工程學系, 成功大學, 2013年, 2013.
    [34] Y. Wang, M. Sasaki, and T. Hirai, "Thermal properties of CVD SiC-C nanocomposites.," JOURNAL OF MATERIALS SCIENCE, vol. 26, pp. 5495-5501, 1991.
    [35] X. Wu, H. Ma, X. Chen, Z. Li, and J. Li, "Thermal Conductivity and Microstructure Properties of Porous SiC Ceramic Derived from Silicon Carbide Powder," New Journal of Glass and Ceramics, vol. 03, no. 01, pp. 43-47, 2013.
    [36] 范修谦, "铸造奥氏体不锈钢的铬镍当量比和相对磁导率," 特种铸造及有色合金, vol. 31, no. 5, pp. 439-441, 2011.
    [37] Q.-S. Chen, H. Zhang, V. Prasad, C. M. Balkas, N. K. Yushin, and S. Wang, "Modeling of transport processed and kinetics of silicon carbide bulk growth," Joural of Crystal Growth, vol. 225, pp. 299-306, 2001.

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