| 研究生: |
陳彥宇 Chen, Yen-Yu |
|---|---|
| 論文名稱: |
電噴霧法製備SiO2奈米微粒及正丁醇蒸氣在微粒上之非均勻相核凝 Preparation of SiO2 nanoparticles by elelctrospray and the heterogeneous nucleation of n-butanol vapor on the SiO2 nanoparticles |
| 指導教授: |
陳進成
Chen, Chin-Cheng |
| 學位類別: |
碩士 Master |
| 系所名稱: |
工學院 - 化學工程學系 Department of Chemical Engineering |
| 論文出版年: | 2003 |
| 畢業學年度: | 91 |
| 語文別: | 中文 |
| 論文頁數: | 136 |
| 中文關鍵詞: | 電噴霧法 、帶電效應 、奈米微粒 、流動型雲霧室 、非均勻相核凝 、臨界過飽和度 |
| 外文關鍵詞: | electrospray, charge effect, nanoparticles, flow cloud chamber, heterogeneous nucleation, critical supersaturation |
| 相關次數: | 點閱:79 下載:1 |
| 分享至: |
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奈米微粒因為粒徑很小而可能顯現出與巨觀材料性質不同的效應。在大氣中因為天然及人為因素亦產生相當多的奈米微粒,成為大氣氣膠中重要成分。本研究以電噴霧法製備有機碳酸二苯酯(diphenyl carbonate)以及無機SiO2奈米微粒並以流動型雲霧室探討正丁醇蒸氣在帶電或不帶電之無機SiO2奈米微粒(8~20nm)上所引起之非均勻相核凝機構。
在無機SiO2奈米微粒所引起的非均勻相核凝方面,無論是帶電或不帶電的微粒,其粒徑越小,臨界過飽和度隨之增大,定性上與理論相符合。而帶單一正、負電荷之微粒臨界過飽和度大約相同,也就是說並沒有明顯的因微粒所帶之正負電荷極性不同而有不同的效應產生。有關電荷效應,在10~20nm之間的SiO2微粒,不帶電微粒所需之臨界過飽和度小於帶電微粒的值,但在8nm時,不帶電微粒之臨界過飽和度大於帶電微粒的值。
Nanoparticles may have a property different from the bulk due to such a small size. Recently, the subjects concerning their production, properties and applications have received extensively attention and been intensively investigated. On the other hand, nanoparticles are generated due to natural and anthropogenic activities, and become an important component of the atmospheric aerosols. In the study, an electrospray aerosol generator was used to generate organic/inorganic nanoparticles and the flow cloud chamber(FCC) was employed to examine the effects of particle size and charge on the critical supersaturation for the condensation of a supersaturated n-butanol vapor on inorganic nanoparticles with a diameter from 8 to 20nm, each carrying a single positive or negative charge or no charge.
For the condensation of n-butanol vapor on SiO2. The results show that no matter the neutral or charged particles, the experimental Scr increases with decreasing particle size at a rate qualitatively in reasonable agreement with the theoretical prediction. The Scr of single-chaged positive and negative particles are almost the same. On the other hand there is a charge effect on Scr. The Scr of charged particles is greater than that of the neutral particles for particles with a diameter in the range of 10~20nm. But for the particles with a diameter of 8nm, the Scr of the charged particles is smaller than that of the neutral particles.
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