光學同調斷層掃描術（Optical Coherence Tomography）是以低同調干涉儀為基礎的光學造影技術，其可有效對樣品提供非侵入式之微米級橫截面影像。在先前的研究中，已經發展了使用光學同調斷層掃描的技術進行厚度與折射係數的量測，接著並發展出偏極化光學同調斷層掃描術（Polarization-Sensitive OCT）結合低同調干涉儀與雷射偏振干涉儀的特性，能夠檢測樣品各層構造變化引起的雙折射現象。
在本研究中，不需精準定位平台的偏極化光學同調斷層掃描儀，具有量測樣品的厚度、平均折射率、明顯相位延遲、光軸方位之能力已經被建構出來，而以這些傳統偏極化光學同調斷層掃描儀能量測的數值為基礎，更進一步發展延伸的演算，來得到實際的總相位延遲、樣品階數，以及雙折射特性。只要正確的階數與真正明顯相位延遲一旦決定，多階線性雙折射材料的尋常折射率與非尋常折射率便可推算得出。更進一步，利用熱光源產生的高解析度以及仔細的色散補償之後，產生能分辨出兩種折射率所造成差異之系統，於是一個直接精準量得雙折射材料的尋常折射率與非尋常折射率之方法亦成功提出。
整體而言，此研究發展了新型的偏極化光學同調斷層掃描量測方法，使系統具有量測單層雙折射材料的尋常折射率與非尋常折射率、厚度、相位延遲與光軸方位。根據作者所知,這是第一台新型偏極化低同調干涉儀在量測線性雙折射樣品中,具有全部光學參數量測的最完整功能。因此，此干涉儀可應用在相關光電產業，精密量測光學材料之多項光學參數。

Optical coherence tomography (OCT) based on the low coherence interferometry (LCI) is a powerful technique for performing in-depth cross-sectional imaging in scattering media for the resolution of micrometer without invasion. In earlier research, there have been report of the measurement of refractive index (n) and thickness (t) by use of OCT, and subsequently, the polarization-sensitive OCT (PSOCT) combining the properties of the low coherence interferometry and polarimetry has the ability to detect the birefringence induced by the structural change between any reflected layers.
A polarization-sensitive OCT without necessary high-precision scanning stage and stage controller for measurements in the thickness, mean　refractive index, apparent phase retardation, and optical axis orientation has been established. In the research, the stretched derivation based on conventional PSOCT for the actual apparent phase retardation, the order and the birefringence are developed is present. The extraordinary and ordinary refractive indices of the sample can be extracted from the measured parameters once appropriate values of the order and apparent phase retardation of the multiple-order birefringent material have been specified. Furthermore, a method to directly extracting precise values for the extraordinary and ordinary refractive indices of a birefringent sample is developed by measuring the optical path difference induced by the two refractive indices, which requires the use of a thermal light source and careful dispersion compensation in order to improve the axial resolution.
As a result, the novel PSOCT system would have the capabilities in measuring the extraordinary and ordinary refractive indices, thickness, phase retardation and optical axis orientation of a single-layer birefringent sample. As the knowledge from author, this is the first instrument that could measure all the optical parameters of the linear birefringence materials from only one system. It is believed that this novel measuring system could be applied in the opto-electronics industries for highly precise measurements in various optical parameters.

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