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研究生：	林佳瑩 Lin, Chia-Ying
論文名稱：	ZrO2、ZrSiO4及CaSiO3添加對鈣鈦礦結構CaCu3Ti4O12之電性及顯微結構之探討 Effect of ZrO2、ZrSiO4 and CaSiO3 on the Dielectric Properties and Microstructure of CaCu3Ti4O12
指導教授：	方滄澤 Fang, Tsang-Tse
學位類別：	碩士 Master
系所名稱：	工學院 - 材料科學及工程學系 Department of Materials Science and Engineering
論文出版年：	2005
畢業學年度：	93
語文別：	中文
論文頁數：	144
中文關鍵詞：	阻抗分析、高介電常數、鈣銅鈦氧
外文關鍵詞：	giant dielectric constant, impedance spectroscopy, CaCu3Ti4O12
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CaCu3Ti4O12化合物(簡稱CCTO)為鈣鈦礦立方晶系結構。此化合物可在相當廣泛的溫度區間保持著介電持平的效應，且其介電常數是相當的高，在1000Hz室溫所量測之值可達到20000以上，且不需要特殊之製造過程，燒結溫度也不高，是一般介電材料難以達到的性質。
針對Ti的位置，分別添加了不同添加物燒結在1100℃的CCTO，Zr的影響對於介電反應沒有多大的改變，但是Si的添加似乎扮演著重要的角色，第二相的劇增也是影響著介電的一個重要因素，電模數分析圖被用來分析CCTO的導電性，發現有三個半圓組成成分的出現。

The CaCu3Ti4O12 (CCTO) is a cubic perovskite structure. It has s a large dielectric constant which is independent of temperature. The compound can be synthesized and sintered at low temperature.
Focused on the Ti site , CCTO doped several kinds of dopant was sintered at 1100℃. The affect of Zr to the dielectric constant is not serious. However , The affect of Si seems to play an important role on dielectric response, the second phase too. Modulus spectroscopy was used to analyze the conductivity of ceramic CCTO, which was found to be related to three semi-circles.

目    錄
摘要……………………………………...…………………………………….I
英文摘要………………………………………………………………...…...II
目錄……………………………………………………………….................III
圖目錄…………………………………………………………………..........V
表目錄……………………………………………………………...……... XII

第一章  緒論…………………………………………………………..……1
1-1  緒論……………………………………………………………......1
1-2  研究動機、構想及目的…………………………………….2

第二章  理論基礎與文獻回顧………………………………………...…....3
2-1  燒結理論……………………………………………………...…...3
2-2  基本介電理論……………………………………………...…….10
2-3  極化機構…………………………………………………............13
2-4  Barrier Layer capacitor……………………………………..........21
2-5  Maxwell-Wagner model……………………………………........24
2-6  阻抗分析………………………………………………................28
2-7  Modulus…………………………………………………….........38
2-8  介電材料CaCu3Ti4O12之介紹……………………………..........43
2-8-1  CCTO介電性質概述…………………….......................43
2-8-2  CaCu3Ti4O12之結構…………………….........................48
2-8-3  高介電和介電穩定之來源………………......................52

第三章 實驗步驟及方法………………...................……………...…….....53
3-1  使用藥品………………...................…………………….............53
3-2  實驗流程………………...................……………….....................53
3-2-1  粉末的配製……...................………………..….............53
3-2-2  燒結試片的準備...................…………….......................54
3-3  分析設備與量測方法...................……………….........................55
3-3-1  X-ray繞射分析...................………………......................55
3-3-2  密度量測...................……………...................................55
3-3-3  電阻率量測...................……………...............................56
3-3-4  介電性質、阻抗分析量測……………............................56
3-3-5  SEM顯微觀察結構……………......................................57

第四章  結果與討論………………….……………...………59
4-1  粉末之合成………….………...……………...……………...…..59
4-2  電性與介電性質之量測…...……………...………………...…...64
4-2-1  電阻之量測….………...…………..…...…………...…..64
4-2-2  介電性質之探討….……….........……...……….……....69
4-3  顯微結構觀察………….………...……………...…………..…..90
4-4  阻抗分析………………………………………………………..105

第五章  結論…………………………………………………………...…125

第六章  參考文獻………………………………………………………...126
                                    

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校內：2006-08-19公開
校外：2006-08-19公開

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