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研究生: 林廷祐
LIN, TING YOU
論文名稱: 純相 (PEA)2MAPb2I7 準二維鈣鈦礦薄膜之激子複合態與光學增益光譜特徵研究
Spectroscopic Signatures of Exciton Complexes and Optical Gain in Phase-Pure (PEA)2MAPb2I7 Quasi-Two-Dimensional Perovskite Films
指導教授: 徐旭政
Hsu, Hsu-Cheng
學位類別: 碩士
Master
系所名稱: 理學院 - 光電科學與工程學系
Department of Photonics
論文出版年: 2026
畢業學年度: 114
語文別: 英文
論文頁數: 95
中文關鍵詞: 準二維鈣鈦礦(PEA)₂MAPb₂I₇空間受限成長雙激子相關放光光學增益Fabry–Pérot 雷射
外文關鍵詞: quasi-two-dimensional perovskite, (PEA)₂MAPb₂I₇, space-confined growth, biexciton-related emission, optical gain, Fabry–Pérot lasing
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  • 準二維鈣鈦礦具有天然量子井結構、強激子效應與優異放光特性,適合應用於發光及雷射元件;然而,溶液製程常伴隨混相與晶域不均勻,進而影響激子複合與光學增益。本研究採用溶劑工程結合空間受限成長法製備純相 (PEA)₂MAPb₂I₇ 準二維鈣鈦礦薄膜,並以光學顯微鏡比較不同 DMF/DMSO 比例下的薄膜形貌。結果顯示,DMF/DMSO = 5:5 的樣品可形成較完整且連續的毫米尺度薄膜區域,因此選用此條件進行後續分析。X 光繞射與掠入射廣角 X 光散射顯示薄膜具有高度取向的層狀晶體結構,吸收與光致發光光譜則呈現以約 2.16 eV 為主的 (PEA)₂MAPb₂I₇ 光學特徵。
    變溫光致發光量測顯示,隨溫度降低,主激子放光增強並變窄,同時低能側放光明顯增加。主激子放光的熱淬熄分析得到 206 ± 24 meV 的活化能;低能側放光的 Arrhenius 分析則得到 21.6 ± 0.8 meV,與文獻報導的雙激子束縛能相近,顯示低能側包含雙激子相關放光貢獻。於 77 K 下進行的功率相依與偏振相依量測進一步顯示,裂縫/邊緣區域的低能側放光具有較明顯的功率增強,且經儀器響應修正後仍呈現較高的偏振異向性。結果顯示,裂縫與薄膜邊緣所形成的局部能量地形可能促進激子遷移與局域化,進而增強低能側放光。
    在高激發條件下,薄膜邊緣區域出現半高寬約 0.25–0.29 nm 的離散窄模態,並具有約 424 μJ cm⁻² 的雷射閾值。不同有效腔長所對應的模態間距與腔長倒數呈近似線性關係,所得有效群折射率約為 3.10 ± 0.17,支持局部薄膜邊緣形成 Fabry–Pérot 型光學回饋。綜合而言,本研究成功製備具高度取向與良好光學均勻性的純相 (PEA)₂MAPb₂I₇ 薄膜,並揭示局部微結構對雙激子相關低能放光、激子局域化與雷射行為的影響。

    Quasi-two-dimensional perovskites possess natural quantum-well structures, strong excitonic effects, and excellent luminescence properties, making them promising materials for light-emitting and laser devices. However, solution processing often leads to mixed phases and nonuniform crystalline domains, which can affect exciton recombination and optical gain. In this study, phase-pure (PEA)₂MAPb₂I₇ quasi-2D perovskite films were prepared using solvent engineering combined with a space-confined growth method. Optical microscopy was used to compare the film morphologies obtained with different DMF/DMSO ratios. The sample prepared with DMF/DMSO = 5:5 formed the most complete and continuous millimeter-scale film regions and was therefore selected for further characterization. X-ray diffraction and grazing-incidence wide-angle X-ray scattering revealed a highly oriented layered crystal structure, while the absorption and photoluminescence spectra showed dominant optical features near 2.16 eV corresponding to (PEA)₂MAPb₂I₇.
    Temperature-dependent photoluminescence measurements showed that the main exciton emission became stronger and narrower with decreasing temperature, accompanied by enhanced low-energy-side emission. Thermal-quenching analysis of the main exciton emission yielded an activation energy of 206 ± 24 meV. Arrhenius analysis of the low-energy-side emission yielded an effective energy scale of 21.6 ± 0.8 meV, comparable to the reported biexciton binding energy and suggesting a biexciton-related contribution. Power-dependent and polarization-dependent measurements performed at 77 K further showed stronger power enhancement of the low-energy-side emission in the crack/edge region. After correction for the instrumental response, the low-energy side also retained greater polarization anisotropy near the crack/edge region. These results suggest that a locally modified energy landscape near cracks and film edges promotes exciton migration and localization, thereby enhancing the low-energy-side emission.
    Under high excitation, a selected film-edge region exhibited discrete narrow modes with linewidths of approximately 0.25–0.29 nm and an estimated lasing threshold of 424 μJ cm⁻². The mode spacing exhibited an approximately linear dependence on the inverse effective cavity length, yielding an effective group refractive index of 3.10 ± 0.17 and supporting Fabry–Pérot-type optical feedback along the local film edge. Overall, this work demonstrates the successful preparation of highly oriented and optically uniform phase-pure (PEA)₂MAPb₂I₇ films and reveals the influence of local microstructures on biexciton-related low-energy emission, exciton localization, and lasing behavior.

    摘要 I Abstract II 致謝 IV Contents V List of Tables VIII List of Figures IX Chapter 1. Introduction 1 1.1 Preface 1 1.2 Historical Review 3 1.2.1 Perovskite 3 1.2.2 Two-dimensional Ruddlesden–Popper Perovskites 6 1.3 Motivation 10 Chapter 2. Background Theories 12 2.1 Characteristics of Two-dimensional Ruddlesden–Popper Perovskites 12 2.1.1 Crystal Structure 12 2.1.2 Quantum and Dielectric Confinement 14 2.1.3 Optical Absorption and Photoluminescence 16 2.2 Phase Distribution in Quasi-2D Perovskites 18 2.2.1 Formation of Mixed-n Phases 18 2.2.2 Influence of Phase Purity on Optical Properties 21 2.3 Exciton-Related Emission 23 2.3.1 Exciton 23 2.3.2 Biexciton 25 2.3.3 Self-Trapped Exciton 27 2.3.4 Edge-State-Related Emission in Layered Perovskites 30 2.4 Fabry-Pérot Laser Cavities 31 Chapter 3. Experiment Process and Measurement 34 3.1 Preparation of PEA-based Quasi-2D Perovskites 34 3.1.1 Precursor Solution Preparation 34 3.1.2 Substrate Preparation 35 3.1.3 Fabrication of Quasi-2D Perovskite Films 36 3.2 Morphology and Structural Characterization 37 3.2.1 Scanning Electron Microscopy (SEM) 37 3.2.2 X-ray Diffraction (XRD) 38 3.2.3 Thickness Measurement 40 3.2.4 Grazing-Incident Wide-Angle X-Ray Scattering (GIWAXS) 41 3.3 Optical Characterization 42 3.3.1 Micro-Photoluminescence (μ-PL) System 42 3.3.2 Polarization-dependent PL System 44 3.3.3 Temperature-dependent Photoluminescence (TDPL) 45 3.3.4 Optical Absorption System 46 Chapter 4. Result and Discussion 47 4.1 Phase Control of PEA-based Quasi-2D Perovskite Films 47 4.1.1 Morphology and Thickness Analysis 47 4.1.2 XRD and GIWAXS Analysis 52 4.1.3 Optical Characterization of the Optimized Film 54 4.2 Excitonic and Biexciton-related Emission 57 4.2.1 Temperature-dependent PL Analysis 57 4.2.2 Power-dependent PL Analysis at 77 K 61 4.2.3 Polarization-dependent PL Analysis 64 4.3 Lasing Characteristics of (PEA)₂MAPb₂I₇ Thin Films 68 4.3.1 Power-Dependent Lasing Behavior 68 4.3.2 Fabry–Pérot Cavity-Mode Analysis 71 Chapter 5. Conclusion and Future Work 73 5.1 Conclusion 73 5.2 Future Work 74 References 75 Appendix 80

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