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研究生: 朱志誠
Chu, Chih-Cheng
論文名稱: 寬頻無鏡頭式超聲波顯微鏡量測系統應用於材料性質檢測
Broad Band Lensless Ultrasonic Microscopy Measurement System for Material Characterization
指導教授: 李永春
Lee, Yung - Chun
學位類別: 碩士
Master
系所名稱: 工學院 - 機械工程學系
Department of Mechanical Engineering
論文出版年: 2004
畢業學年度: 92
語文別: 中文
論文頁數: 104
中文關鍵詞: 雙層無鏡頭式超聲波換能器PVDFV(z)振盪曲線聲波干涉波速量測系統超聲波顯微鏡無鏡頭式
外文關鍵詞: broad band, lensless, two layers line-focused transducers, PVDF, ultrasonic microscopy, material characterization
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  •   本論文建立起一套無鏡頭式寬頻超聲波顯微鏡波速量測系統,此量測系統利用單頻脈衝調制(Tone-Burst)信號進行聲波干涉量測,由頻譜分析儀鎖定單一頻率接收回波訊號,直接得到V(z)振盪曲線;此系統的優點在於可針對特定頻率進行聲波干涉量測,並且可選擇不同的操作頻率進行寬頻量測。
      此系統使用新設計的雙層無鏡頭式超聲波換能器,這些換能器採用雙層式壓電膜的設計,使激發訊號以及回波訊號分別經由兩片相同曲率但各別獨立的PVDF薄膜激發與接收,此設計可解決激發與接收信號的切換電路問題,保護接收端的放大電路;同時可以提高信噪比。
      經由數種不同材料之表面波與板波的實驗結果,證明新設計的雙層無鏡頭式超聲波換能器的可行性,也確定量測系統的準確度。此外,藉由數種具有鍍膜的複合板試件實驗,配合複合板板波理論推估出鍍膜的機械性質,亦證明本量測系統可應用於鍍層的機械性質檢測。

      In this thesis, a broad band lensless ultrasonic microscopy measurement system has been set up for material characterization. The measurement system utilizes tone burst signal for sound wave interfering measurement. The reflective signal is received by spectrum analyzer. In this way, V(z) curve can be obtained directly. The advantage of this measurement system is that we can choose certain specific frequency for broad band sound wave interfering measurement.
      This measurement system utilizes new designed lensless ultrasonic transducers. There are two pieces of piezoelectric thin film in these transducers. Exciting and receiving signals are operated by different PVDF thin film. The electric circuit of both signals is isolated by this manipulation. Therefore, the amplifier circuit of receiver is protected from exciting signal, and the signal/noise ratio is improved.
      The fabricated two layers line-focused transducers are experimentally tested to characterize their performance. Furthermore, the Lamb wave dispersion curves of coated plates are also measured. Based on a theoretical model for composite plate of bi-layer structure, the theoretical dispersion curves of the coated plates can be obtained. By comparing the theoretical data to the experimental ones, we can estimate the mechanical properties of the coated layer.

    摘要………………………………………………………I Abstract ………………………………………………II 誌謝……………………………………………………III 目錄 ……………………………………………………IV 表目錄 …………………………………………………VI 圖目錄…………………………………………………VII 符號說明………………………………………………XVI 第一章緒論………………………………………………1 1-1研究背景與目的 ……………………………………1 1-2文獻回顧 ……………………………………………4 1-3本文架構 ……………………………………………7 第二章 實驗架設 ………………………………………8 2-1 V(z)曲線模型………………………………………8 2-2雙層式線聚焦超聲波換能器………………………11 2-2-1雙層式線聚焦超聲波換能器的製作……………13 2-2-2雙層式線聚焦超聲波換能器的規格……………16 2-3寬頻超聲波顯微鏡波速量測系統…………………18 2-4硬體設備……………………………………………21 2-4-1頻譜分析儀………………………………………21 2-4-2運動控制卡………………………………………22 2-4-3線性平台…………………………………………23 第三章 體型與板型試片的量測………………………24 3-1 體型等向性材料量測.……………………………24 3-2體型非等向性材料量測……………………………31 3-3板型試片的量測……………………………………38 第四章 藍姆波用於估算鍍膜複合板的機械性質……43 4-1 鍍層薄板之理論模型 ……………………………44 4-2 鍍層複合板之實驗量測 …………………………50 4-2-1玻璃鍍鎳複合板之實驗量測……………………52 4-2-2 (100)矽晶片鍍鎳複合板0度方向之實驗量測 66 4-2-3(100)矽晶片鍍鎳複合板45度方向之實驗量測 80 4-3 估算鍍層的機械性質 ……………………………94 4-3-1玻璃鍍鎳複合板…………………………………94 4-3-2 (100)矽晶片鍍鎳複合板0度方向 ……………95 4-3-3 (100)矽晶片鍍鎳複合板45度方向……………95 第五章 結論 …………………………………………101 參考文獻………………………………………………103

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