| 研究生: |
王怡茹 Wang, Yi-Ju |
|---|---|
| 論文名稱: |
高溫鉛錫銲料之機械性質與顯微組織研究 Mechanical Properties and Microstructure of Lead-Tin Solders at High Temperature |
| 指導教授: |
李驊登
Lee, Hwa-Teng |
| 學位類別: |
碩士 Master |
| 系所名稱: |
工學院 - 機械工程學系 Department of Mechanical Engineering |
| 論文出版年: | 2015 |
| 畢業學年度: | 103 |
| 語文別: | 中文 |
| 論文頁數: | 91 |
| 中文關鍵詞: | 高溫銲料 、95Pb-5Sn 、92.5Pb-5Sn-2.5Ag 、接合強度 、IMC |
| 外文關鍵詞: | High temperature solder, 95Pb-5Sn, 92.5Pb-5Sn-2.5Ag, Joints strength, IMC layers |
| 相關次數: | 點閱:160 下載:3 |
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本研究的目的是在探討高溫銲料95Pb-5Sn及92.5Pb-5Sn-2.5Ag與銅銲接後,利用高溫熱儲存後評估顯微結構、界面層厚度及機械性質之影響。實驗結果將作為後續研究的理論基礎與比較。其中儲存溫度為200℃,儲存時間為1、25、100、225及400小時。
研究結果顯示,在95Pb-5Sn原材之析出物為β-Sn,且多由晶界析出,熱儲存後其晶粒大小有逐漸變大的趨勢,但析出物並無明顯成長;92.5Pb-5Sn-2.5Ag原材之析出物為β-Sn、Ag3Sn及ξ-Ag,熱儲存前後晶粒皆不明顯,但熱儲存後析出物有明顯地粗大化。95Pb-5Sn及92.5Pb-5Sn-2.5Ag之銲接試件具有相同的金屬間化合物組成,即為Cu3Sn,隨著熱儲存時間增加,金屬間化合物層越厚,且慢慢的產生剝離的現象。在100小時前,兩者的厚度相當,約在2~4μm;在100小時開始,92.5Pb-5Sn-2.5Ag厚度成長的比95Pb-5Sn的快。到400小時,95Pb-5Sn試件成長至約12μm,而92.5Pb-5Sn-2.5Ag試件已成長到約24μm。
在機械性質試驗中,未熱儲存前,92.5Pb-5Sn-2.5Ag接合強度較95Pb-5Sn接合強度高,其微硬度也比95Pb-5Sn高些,推斷是因為有Ag3Sn及ξ-Ag的析出使得銲料有強化效果。但從100小時後,92.5Pb-5Sn-2.5Ag強度開始比95Pb-5Sn強度低。各接點在經高溫熱儲存後強度皆有下降之趨勢,但微硬度改變不大。而破壞模式也從銲料模式轉變為混合模式,破斷主因為界面層Cu3Sn。
綜合本研究結果,高溫熱儲存下使金屬間化合物生長並開始產生剝離,使得局部弱化,接合強度下降,破壞也發生在金屬間化合物層。推斷金屬間化合物生成、接合強度及破斷模式皆會相互影響。
This research is aimed to investigate the microstructure, the interfacial IMC (Intermetallic Compound) layers and mechanical properties of 95Pb-5Sn/Cu joints and 92.5Pb-5Sn-2.5Ag/Cu joints after heat storage. The storage temperature is 200℃ while the storage times are 1, 25, 100, 225 and 400 hours respectively.
After heat storage, the grain size of 95Pb-5Sn increased gradually, but there’s no significant growth in the precipitation. In 92.5Pb-5Sn-2.5Ag, the grain size doesn’t change apparently after the heat storage, but the precipitations are significantly coarsened.
Only a layered Cu3Sn phase was formed at the 95Pb-5Sn/Cu and the 92.5Pb-5Sn-2.5Ag/Cu interfaces. Before 100 hours, the thickness of IMC layer in both specimens of 95Pb-5Sn and 92.5Pb-5Sn-2.5Ag were about the same. After 100 hours, the IMC layer in 92.5Pb-5Sn-2.5Ag grows faster than that in 95Pb-5Sn. Up to 400 hours, the Cu3Sn intermetallic compound layer is not only growing but also spalling.
In mechanical properties test, the joint strength and micro-hardness in 92.5Pb-5Sn-2.5Ag is higher than in 95Pb-5Sn before the heat storage because the precipitations provided strengthening effect. However, after 100 hours, joint strength in 92.5Pb-5Sn-2.5Ag becomes lower than in 95Pb-5Sn. The strength of all soldered joints decreases distinctly after heat storage at 200℃ for 400 hours, but the change of micro-hardness is not obvious. Also, the fracture modes are transformed from soldered modes to mix modes due to the intermetallic compounds layer.
The results show that, the IMC layer is growing and spalling, which means that the adhesion between Cu and Cu3Sn becomes weak. The growth of the intermetallic compounds, joints strength and fracture modes interact with each other.
[1] 陳信文, 陳立軒, 林永森, and 陳志銘, "電子構裝技術與材料," 2005.
[2] 劉雨雯, "RoSH 綠色指令: 全球環境規範 & 無鉛銲接技術," ed: 龍璟文化, 2005.
[3] E. Commision, "Recast of the RoHS directive," http://ec.europa.eu/environment/waste/rohs_eee/, Updated 7 February 2014, accessed 15 July 2014
[4] H. Schoeller, S. Bansal, A. Knobloch, D. Shaddock, and J. Cho, "Microstructure evolution and the constitutive relations of high-temperature solders," Journal of electronic materials, vol. 38, pp. 802-809, 2009.
[5] W. Kay, "ASM Handbook: welding, brazing, soldering, vol. 6," ASM International, Metals Park, 1993.
[6] W. Plumbridge, "Solders in electronics," Journal of Materials Science, vol. 31, pp. 2501-2514, 1996.
[7] K. Suganuma, "无铅焊接技术," ed: 北京: 科学出版社, 2004.
[8] G. Zeng, S. McDonald, and K. Nogita, "Development of high-temperature solders: Review," Microelectronics Reliability, vol. 52, pp. 1306-1322, 2012.
[9] 鍾崇燊 and 柯捷男, "可怕的鉛污染," 科學發展期刊, vol. 357, pp. 52-55, 2002.
[10] 張淑如, "鉛對人體的危害," ed: 勞工安全衛生簡訊, 1995.
[11] 游善溥, "錫鋅系無鉛銲錫與銅基材間附著性與界面反應之研究," 國立成功大學材料科學與工程研究所, 博士論文, 2000.
[12] K. Suganuma, S.-J. Kim, and K.-S. Kim, "High-temperature lead-free solders: properties and possibilities," JOM Journal of the Minerals, Metals and Materials Society, vol. 61, pp. 64-71, 2009.
[13] S. Menon, E. George, M. Osterman, and M. Pecht, "High lead solder (over 85%) solder in the electronics industry: RoHS exemptions and alternatives," Journal of Materials Science: Materials in Electronics, vol. 26, pp. 4021-4030, 2015.
[14] V. R. Manikam and K. Y. Cheong, "Die attach materials for high temperature applications: a review," Components, Packaging and Manufacturing Technology, IEEE Transactions on, vol. 1, pp. 457-478, 2011.
[15] J.-M. Song, H.-Y. Chuang, and Z.-M. Wu, "Interfacial reactions between Bi-Ag high-temperature solders and metallic substrates," Journal of electronic materials, vol. 35, pp. 1041-1049, 2006.
[16] N.-C. Lee, "Getting Ready for Lead-free Solders*," Soldering & Surface Mount Technology, vol. 9, pp. 65-69, 1997.
[17] J. R. Teo, F. Ng, L. K. Goi, Y. Sun, Z. Wang, X. Shi, et al., "Microstructure of eutectic 80Au/20Sn solder joint in laser diode package," Microelectronic Engineering, vol. 85, pp. 512-517, 2008.
[18] J. S. Kim, W. S. Choi, D. Kim, A. Shkel, and C. C. Lee, "Fluxless silicon-to-alumina bonding using electroplated Au–Sn–Au structure at eutectic composition," Materials Science and Engineering: A, vol. 458, pp. 101-107, 2007.
[19] L. Yin, S. J. Meschter, and T. J. Singler, "Wetting in the Au–Sn system," Acta Materialia, vol. 52, pp. 2873-2888, 2004.
[20] J. Kim, nbsp, Hoon, S. Jeong, nbsp, Won, et al., "Thermodynamics-Aided Alloy Design and Evaluation of Pb-free Solders for High-Temperature Applications," MATERIALS TRANSACTIONS, vol. 43, pp. 1873-1878, 2002.
[21] Y. Liu, J. Teo, S. Tung, and K. Lam, "High-temperature creep and hardness of eutectic 80Au/20Sn solder," Journal of Alloys and Compounds, vol. 448, pp. 340-343, 2008.
[22] V. Chidambaram, J. Hattel, and J. Hald, "High-temperature lead-free solder alternatives," Microelectronic Engineering, vol. 88, pp. 981-989, 2011.
[23] H. Okamoto, "Au-sn (gold-tin)," Journal of Phase Equilibria and Diffusion, vol. 28, pp. 490-490, 2007.
[24] K. Tanaka, A. Ninomiya, T. Ishigohka, and K. Kurahashi, "Measurement of joint resistance of Bi-2223/Ag tapes using one-turn shorted coil," Applied Superconductivity, IEEE Transactions on, vol. 11, pp. 3002-3005, 2001.
[25] J. E. Spinelli, B. L. Silva, and A. Garcia, "Microstructure, phases morphologies and hardness of a Bi–Ag eutectic alloy for high temperature soldering applications," Materials & Design, vol. 58, pp. 482-490, 2014.
[26] J.-M. Song, H.-Y. Chuang, and Z.-M. Wu, "Substrate dissolution and shear properties of the joints between Bi-Ag alloys and Cu substrates for high-temperature soldering applications," Journal of Electronic Materials, vol. 36, pp. 1516-1523, 2007.
[27] J.-M. Song, H.-Y. Chuang, and T.-X. Wen, "Thermal and tensile properties of Bi-Ag alloys," Metallurgical and Materials Transactions A, vol. 38, pp. 1371-1375, 2007.
[28] J. N. Lalena, N. F. Dean, and M. W. Weiser, "Experimental investigation of Ge-doped Bi-11Ag as a new Pb-free solder alloy for power die attachment," Journal of electronic materials, vol. 31, pp. 1244-1249, 2002.
[29] P. Fima, W. Gąsior, A. Sypień, and Z. Moser, "Wetting of Cu by Bi–Ag based alloys with Sn and Zn additions," Journal of Materials Science, vol. 45, pp. 4339-4344, 2010.
[30] Y. Yamada, Y. Takaku, Y. Yagi, Y. Nishibe, I. Ohnuma, Y. Sutou, et al., "Pb-free high temperature solders for power device packaging," Microelectronics Reliability, vol. 46, pp. 1932-1937, 2006.
[31] "Phase Diagrams & Computational Thermodynamics," http://www.metallurgy.nist.gov/phase/solder/agpbsn.html.
[32] R. J. McCabe and M. E. Fine, "Creep of tin, Sb-solution-strengthened tin, and SbSn-precipitate-strengthened tin," Metallurgical and Materials Transactions A, vol. 33, pp. 1531-1539, 2002.
[33] R. J. McCabe and M. E. Fine, "High creep resistance tin-based alloys for soldering applications," Journal of electronic materials, vol. 31, pp. 1276-1282, 2002.
[34] Y. Plevachuk, W. Hoyer, I. Kaban, M. Köhler, and R. Novakovic, "Experimental study of density, surface tension, and contact angle of Sn–Sb-based alloys for high temperature soldering," Journal of materials science, vol. 45, pp. 2051-2056, 2010.
[35] A. El-Daly, A. Fawzy, A. Mohamad, and A. El-Taher, "Microstructural evolution and tensile properties of Sn–5Sb solder alloy containing small amount of Ag and Cu," Journal of Alloys and Compounds, vol. 509, pp. 4574-4582, 2011.
[36] Q. Zeng, J. Guo, X. Gu, and X. Zhao, "Liquid-state interfacial reaction of Sn-10Sb-5Cu high temperature lead-free solder and Cu substrate," in Electronic Packaging Technology & High Density Packaging, 2008. ICEPT-HDP 2008. International Conference on, 2008, pp. 1-5.
[37] Q. Zeng, J. Guo, X. Gu, X. Zhao, and X. Liu, "Wetting Behaviors and Interfacial Reaction between Sn-10Sb-5Cu High Temperature Lead-free Solder and Cu Substrate," Journal of Materials Science & Technology, vol. 26, pp. 156-162, 2010.
[38] A. Torres, L. Hernández, and O. Domínguez, "Effect of Antimony Additions on Corrosion and Mechanical Properties of Sn-Bi Eutectic Lead-Free Solder Alloy," Materials Sciences and Applications, vol. 3 pp. 355-362, 2012.
[39] M. Rettenmayr, P. Lambracht, B. Kempf, and C. Tschudin, "Zn-Al based alloys as Pb-free solders for die attach," Journal of electronic materials, vol. 31, pp. 278-285, 2002.
[40] T. Shimizu, H. Ishikawa, I. Ohnuma, and K. Ishida, "Zn-Al-Mg-Ga alloys as Pb-free solder for die-attaching use," Journal of electronic materials, vol. 28, pp. 1172-1175, 1999.
[41] Y. Takaku, L. Felicia, I. Ohnuma, R. Kainuma, and K. Ishida, "Interfacial reaction between Cu substrates and Zn-Al base high-temperature Pb-free solders," Journal of Electronic Materials, vol. 37, pp. 314-323, 2008.
[42] 顏怡文, 郭筱薇, and 朱泰霓, "鋅-錫-鋁-銅基高溫無鉛銲料的開發," 鑛冶: 中國鑛冶工程學會會刊, pp. 105-113, 2012.
[43] V. Raghavan, "Al-Cu-Zn (Aluminum-Copper-Zinc)," Journal of phase equilibria and diffusion, vol. 28, pp. 183-188, 2007.
[44] 黃于菁, "添加 La 對 Sn-Ag-Sb 無鉛銲料銲點微結構及結合強度之研究," 成功大學機械工程研究所, 碩士論文, 2010.
[45] X. Shi, H. Pang, W. Zhou, and Z. Wang, "Low cycle fatigue analysis of temperature and frequency effects in eutectic solder alloy," International Journal of Fatigue, vol. 22, pp. 217-228, 2000.
[46] J. H. Pang, K. H. Tan, X. Shi, and Z. Wang, "Thermal cycling aging effects on microstructural and mechanical properties of a single PBGA solder joint specimen," Components and Packaging Technologies, IEEE Transactions on, vol. 24, pp. 10-15, 2001.
[47] N. Bonda and I. Noyan, "Effect of the specimen size in predicting the mechanical properties of PbSn solder alloys," Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on, vol. 19, pp. 208-212, 1996.
[48] L. Quan, D. Frear, D. Grivas, and J. Morris, "Tensile behavior of Pb-Sn solder/Cu joints," Journal of Electronic Materials, vol. 16, pp. 203-208, 1987.
[49] H.-C. Tseng, "Low-Cycle Fatigue Behavior and Mechanisms of Lead-Free Solders," 2003.
[50] K. Johal, S. Lamprecht, and H. Roberts, "Electroless nickel/electroless palladium/immersion gold plating process for gold-and aluminum-wire bonding designed for high-temperature applications," in SMTA 9th annual pan pacific microelectronics symposium, 2004.
[51] M. Corporation, "Materion Solder Alloys," http://materion.com/~/media/Files/PDFs/Advanced%20Materials%20Group/ME/Solder%20Alloys.pdf.
[52] L. Ramanathan, J. Jang, J. Lin, and D. Frear, "Solid-state annealing behavior of two high-Pb solders, 95Pb5Sn and 90Pb10Sn, on Cu under bump metallurgy," Journal of electronic materials, vol. 34, pp. L43-L46, 2005.
[53] C.-m. Chen, K.-j. Wang, and K.-c. Chen, "Isothermal solid-state aging of Pb–5Sn solder bump on Ni/Cu/Ti under bump metallization," Journal of alloys and compounds, vol. 432, pp. 122-128, 2007.
[54] "University of Wisconsin Moodle," https://ay14-15.moodle.wisc.edu/prod/mod/resource/view.php?id=14965University
[55] H. Schoeller, S. Bansal, A. Knobloch, D. Shaddock, and J. Cho, "Effect of alloying elements on the creep behavior of high Pb-based solders," Materials Science and Engineering: A, vol. 528, pp. 1063-1070, 2011.
[56] 楊忠霖, "熱電材料與銅電極之固液擴散接合研究," 臺灣大學材料科學與工程學研究所學位論文, 2013.
[57] J.-W. Jang, L. N. Ramanathan, J.-K. Lin, and D. R. Frear, "Spalling of Cu3Sn intermetallics in high-lead 95Pb5Sn solder bumps on Cu under bump metallization during solid-state annealing," Journal of applied physics, vol. 95, pp. 8286-8289, 2004.
[58] 陳明宏, "錫銲接點之機械性質與顯微組織研究," 成功大學機械工程研究所, 碩士論文, 1999.
[59] 陳明宏, "添加Sb對Sn-Ag無鉛銲料銲點冶金性質與機械性質之研究," 國立成功大學機械工程研究所, 博士論文, 2003.
[60] J. Parent, D. Chung, and I. Bernstein, "Effects of intermetallic formation at the interface between copper and lead-tin solder," Journal of materials science, vol. 23, pp. 2564-2572, 1988.
[61] H.-T. Lee, M.-H. Chen, H.-M. Jao, and T.-L. Liao, "Influence of interfacial intermetallic compound on fracture behavior of solder joints," Materials Science and Engineering: A, vol. 358, pp. 134-141, 2003.
[62] M. Tsai, Y. Lin, H. Chuang, and C. Kao, "Effect of Sn concentration on massive spalling in high-Pb soldering reaction with Cu substrate," Journal of Materials Research, vol. 24, pp. 3407-3411, 2009.
[63] C.-P. Lin, C.-M. Chen, Y.-W. Yen, H.-J. Wu, and S.-W. Chen, "Interfacial reactions between high-Pb solders and Ag," Journal of Alloys and Compounds, vol. 509, pp. 3509-3514, 2011.
校內:2020-08-24公開