液晶盒參數對於液晶顯示器的光學特性有很大的影響，例如亮度，對比度及響應時間等。本研究係關於液晶受電場影響之量測系統之研發。本量測系統係由一精密測距雷射干涉儀系統、液晶盒及產波器，搭配數學解析計算所組成。利用一液晶盒受到外加電場作用下，粒子受其作用改變排列方向造成光路上的改變，搭配精密測距雷射干涉儀可測量隅角反射鏡線性移動的特性，使得干涉儀測得不同於實際距離之數值，藉由本研究推導之光程差與液晶轉動改變角度之關係，便可找出外加電壓與液晶相位延遲之特性。

　　The optical characteristics of LCD are sensitive to the structural parameters of liquid crystal cells, such as brightness, contrast ratio and response time. This measuring system is composed of a laser interferometer for accurate length measuring, a liquid crystal cell and a function generator. Using the characteristic of the liquid crystal under an electric field effect, the particles change the direction causing the optical path length difference. Based on the optical path length difference, a different measured value compared with real length is shown by the laser interferometer. By means of the relations of optical path length difference and the particle change angle, the relation between phase retardation and the applied voltage can be obtained.

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