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研究生: 邱盈達
Chiu, Ying-Ta
論文名稱: 錫鋅系無鉛銲錫與基材接合反應行為研究
Investigation on Bonding and Material Reaction Behavior between Tin-Zinc series Lead-Free Solders and Substrate.
指導教授: 林光隆
Lin, K. L.
學位類別: 碩士
Master
系所名稱: 工學院 - 材料科學及工程學系
Department of Materials Science and Engineering
論文出版年: 2005
畢業學年度: 93
語文別: 中文
論文頁數: 87
中文關鍵詞: 錫鋅系無鉛銲錫,球柵式陣列
外文關鍵詞: ball grid array, lead-free solder
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  •   本實驗是將錫鋅系無鉛銲錫(Sn8.5Zn0.5Ag0.06Al0.1Ga)錫球與BGA基版(Cu/Ni/Au)接合後,以剪力和拉力測試了解界面行為,進ㄧ步利用表面黏著技術,再將BGA試片和印刷電路板(OSP/Cu)接合,經過不同可靠度測試後,探討顯微組織、機械性質、熱性質和電性變化,並且與商業用的Sn37Pb、Sn3Ag0.5Cu銲錫球做比較。

      從剪力和拉力測試結果可以得知,Sn37Pb的剪力強度和拉力強度會因為Ni3Sn4增厚和出現在界面的(Au,Ni)Sn4而下降,並且由延性破斷轉變成脆性破斷。Sn3Ag0.5Cu和Sn8.5Zn0.5Ag0.06Al0.1Ga的剪力強度和拉力強度,隨著時效熱處理時間增加而下降緩慢,並且皆是破斷在銲錫裡面。

      BGA試片和印刷電路板接合後的試片,經過高溫儲存測試,Sn8.5Zn0.5Ag0.06Al0.1Ga與OSP/Cu印刷電路板生成的層狀介金屬化合物AgZn3和Cu5Zn8,隨著時效熱處理時間增加,形成不規則狀,造成電阻增加。由摔落測試結果,可以看出Sn8.5Zn0.5Ag0.06Al0.1Ga試片所能承受比較多次的摔落,並且裂縫沿著AgZn3 及AuZn3附近延伸,Sn37Pb試片比Sn3Ag0.5Cu試片承受多次的摔落,而且裂縫發生在介金屬化合物中。由於熱膨脹係數的差異,經過溫度循環測試後,會有熱應力集中而發生裂縫,導致錫球接點接觸面積大幅減少造成電阻上升。

     This study investigated the bonding behavior between Sn-Zn series lead-free solder and substrate. The bonding strength of the solder ball was measured by shear and pull test. The BGA package was connected to the OSP/Cu print circuit board. After the reliability tests, the microstructure, mechanical property, thermal property and variation of electrical resistance were studied. The properties were compared for Sn8.5Zn0.5Ag0.006Al0.1Ga, Sn37Pb and Sn3Ag0.5Cu solder balls.

     The experimental results revealed that the shear and pull strengths of Sn37Pb decrease with the growth of Ni3Sn4 and (Au,Ni)Sn4 at the interface formed between Sn37Pb and the Cu/Ni/Au substrates. The ductile fracture became the brittle fracture because of Au embrittlement. The shear and pull strength of Sn3Ag0.5Cu and Sn8.5Zn0.5Ag0.006Al0.1Ga decreases with thermal aging time, and ductile fractures exist in both of cases.

     Two layers of AgZn3 and Cu5Zn8 intermetallic compounds formed at the interface between Sn8.5Zn0.5Ag0.006Al0.1Ga and OSP/Cu. After High Temperature Storage Test, the electrical resistance increased as a result of the formation of tow layers of AgZn3 and Cu5Zn8 intermetallic compounds. Drop test results showed that the joints Sn8.5Zn0.5Ag0.006Al0.1Ga solder ball performed better than Sn37Pb and Sn3Ag0.5Cu. The crack propagated along AgZn3 and AuZn3. The life of Sn37Pb is better than Sn3Ag0.5Cu, and the crack occurred in the intermetallic compound.

    中文摘要……………………………………………………………I 英文摘要……………………………………………………………II 總目錄………………………………………………………………III 表目錄………………………………………………………………V 圖目錄………………………………………………………………VI 第壹章 緒論…………………………………………………………1 1-1   表面黏著技術………………………………………………1 1-1-1 球柵式陣列構裝……………………………………………1 1-1-2 導線架表面黏著技術………………………………………4 1-2   無鉛銲錫電子構裝之發展…………………………………9 1-2-1 常見的無鉛銲錫……………………………………………9 1-3   元件可靠性(Reliability)分析方法……………………10 1-4   偉伯分佈……………………………………………………14 1-4-1 偉伯參數求法………………………………………………15 1-4-2 偉伯雙參數的物理意義……………………………………16 1-5   研究目的……………………………………………………16 第貳章 實驗方法與步驟……………………………………………18 2-1  實驗構想……………………………………………………18 2-2  BGA植球方式…………………………………………………18 2-3  BGA錫球與印刷電路板合……………………………………18 2-4  BGA錫球高溫時效測試………………………………………29 2-5  BGA錫球剪力強度測試………………………………………29 2-6  BGA錫球拉力強度測試………………………………………29 2-7 可靠度測試…………………………………………………29 2-7-1 高溫時效試驗………………………………………………29 2-7-2 摔落試驗……………………………………………………29 2-7-3 溫度循環試驗………………………………………………30 第參章 結果與討論…………………………………………………36 3-1  BGA錫球高溫時效測試之表面型態…………………………36 3-2  BGA錫球剪力強度測試分析…………………………………44 3-3  BGA錫球拉力強度測試分析…………………………………52 3-4  破斷現象分析…………………………………………………59 3-5  BGA錫球與印刷電路板接合後之界面介金屬之表面型態……59 3-6  高溫時效與電性之變化………………………………………60 3-7  摔落試驗與電性之變化………………………………………61 3-8  溫度循環試驗與電性之變化…………………………………69 3-9  摔落試驗後之偉伯分佈………………………………………69 3-10  溫度循環試驗後之偉伯分佈…………………………………76 第肆章 結論……………………………………………………………81 參考文獻…………………………………………………………………82

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