目前業界ESD的改善大多數在防範ESD將產品給打壞，業界花費許多人力與物力來改善這部份，但是ESD造成IC 功能面上的損失探討卻非常的少。當在系統層級靜電放電的測試條件下，快速暫態雜訊會使得系統進入當機、故障，或是不正常的工作狀態。如圖形儲存邏輯單元內的存儲元件，由於系統級ESD事件打在電源上使它很容易地失去他們的數據(data flip)。
本論文首先提出了一種應用於系統層級功能面上靜電放電防護的暫態偵測電路設計。利用市面上容易買到的N-MOS/P-MOS零件，快速且簡易的方式來實現此電路。由實驗結果證實，當有靜電放電事件發生時，所提出的電路可以成功的偵測到ESD快速暫態電波在電路電源/地線上產生的干擾現象，並且將此一事件記憶起來，並通知MCU快速的重置系統並恢復至初始狀態，以讓使用者感受不到ESD對系統的影響,經實際測試後,本產品可以通過業界嚴苛的靜電防護測試標準。本論文的貢獻在於此種創新的想法在業界尚未有人提出, 所以可以說是目前業界的先驅。
這份論文總共分成五個章節,第一章是有關於系統層級靜電放電防護國際法規的內容和條例。第二章在簡介目前系統ESD 的各種防護方式。第三章為比較先前偵測電路與本論文所提出偵測電路的差異。第四章則是實際數據測試與比較。第五章為此論文的結論和未來展望。
關鍵字：系統靜電放電防護;靜電偵測電路

Most improvement of IC ESD protection in current industry is focus on prevent from IC being damage. Industry spend a lot of manpower and resources to improve this part, but the discussion of IC function damage due to ESD disturbance is very few, When the system-level ESD test conditions, fast transient noise will make the system into crashes, failure, or abnormal working condition.
This thesis presents system function level ESD protection. Design PCB-based transient detection circuit. We can use popular components (N-MOS/P-MOS) implement this circuit fast and easily.
Confirmed by the test results of the experiment, the PCB-based ESD detection circuit can pass the +/-8kV ESD IEC 61000-4-2[6] standard. When ESD phenomenon occurs in Power / Ground line, our ESD detection circuit can detect and memorize this event successfully, and then inform the MUC reset the system recovery to initial state quickly, so the user will not perceive this failure event.
The contribution of this thesis is that such innovative ideas in the industry has not been raised, it can be said to be a pioneer in the industry. This thesis consists of five chapters; the first chapter introduction the international standard for system-level ESD, the second chapter is the introduction of ESD protection solutions for system-level ESD disturbance. The third chapter is comparison of Array-test chip and PCB-based ESD detection circuit. The fourth chapter is correlation and verification Array-test chip and PCB-based detection circuit. Last Chapter is the conclusions and future works.
Keywords: System-Level ESD;ESD Detection Circuit

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