| 研究生: |
羅清信 Lo, Ching-Hsin |
|---|---|
| 論文名稱: |
超薄型細間距球柵陣列之翹曲和可靠度分析 Analysis of Warpage and Reliability of Very Thin Profile Fine Pitch Ball Grid Array |
| 指導教授: |
黃聖杰
Hwang, Sheng-Jye |
| 學位類別: |
碩士 Master |
| 系所名稱: |
工學院 - 機械工程學系 Department of Mechanical Engineering |
| 論文出版年: | 2023 |
| 畢業學年度: | 111 |
| 語文別: | 中文 |
| 論文頁數: | 160 |
| 中文關鍵詞: | 先進 IC 封裝 、殘留應力 、RDL 、P-V-T-C 、黏彈 、可靠度 |
| 外文關鍵詞: | Advanced IC packaging, Residual stress, RDL, P-V-T-C, Viscoelasticity, Reliability |
| 相關次數: | 點閱:52 下載:0 |
| 分享至: |
| 查詢本校圖書館目錄 查詢臺灣博碩士論文知識加值系統 勘誤回報 |
[1] G. Kelly, C. Lyden, W. Lawton, J. Barrett, A. Saboui, H. Pape, and H. J. Peters, "Importance of Molding Compound Chemical Shrinkage in the Stress and Warpage Analysis of PQFPs," IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part B, vol. 19, no. 2, pp. 296-300, 1996.
[2] M. Sato and H. Yokoi, "Influences of Molding Conditions on Die-Pad Behavior in IC Encapsulation Process Analyzed by Hall Element Method," IEEE transactions on advanced packaging, vol. 23, no. 3, pp. 574-581, 2000.
[3] S. Rimdusit and H. Ishida, "Development of New Class of Electronic Packaging Materials Based on Ternary Systems of Benzoxazine, Epoxy, and Phenolic Resins," Polymer, vol. 41, no. 22, pp. 7941-7949, 2000.
[4] S. A. Bidstrup-Allen, S.-T. Wang, L. Nguyen, and F. Arbelaez, "Rheokinetics Models for Epoxy Molding Compounds Used in IC Encapsulation," Proceedings. The First IEEE International Symposium on Polymeric Electronics Packaging, PEP'97, pp. 149-157, 1997.
[5] G. Hu, S. Chew, and B. Singh, "Cure Shrinkage Analysis of Green Epoxy Molding Compound with Application to Warpage Analysis in a Plastic IC Package," 2007 8th International Conference on Electronic Packaging Technology, pp. 1-5, 2007.
[6] Y.-S. Chang, S.-J. Hwang, H.-H. Lee, and D.-Y. Huang, "Study of PVTC Relation of EMC," J. Electron. Packag., vol. 124, no. 4, pp. 371-373, 2002.
[7] S. J. Hwang and Y. S. Chang, "Isobaric Cure Shrinkage Behaviors of Epoxy Molding Compound in Isothermal State," Journal of Polymer Science Part B: Polymer Physics, vol. 43, no. 17, pp. 2392-2398, 2005.
[8] S.-J. Hwang and Y.-S. Chang, "PVTC Equation for Epoxy Molding Compound," IEEE Transactions on components and packaging technologies, vol. 29, no. 1, pp. 112-117, 2006.
[9] S. Y. Teng and S.-J. Hwang, "Simulations of Process-Induced Warpage During IC Encapsulation Process," Journal of Electronic Packaging, Transactions of the ASME, vol. 129, no. 3, pp. 307-315, 2007.
[10] S.-S. Deng, S.-J. Hwang, H.-H. Lee, D.-Y. Huang, and G.-S. Shen, "Warpage Simulations with PVTC Equation and Experiments of Fan-Out Wafer Level Package After Encapsulation Process," 2010 5th International Microsystems Packaging Assembly and Circuits Technology Conference, pp. 1-4, 2010.
[11] C.-C. Wang, C.-T. Huang, C.-C. Hsu, R.-Y. Chang, R. Huang, M. F. Huang, and S.-J. Hwang, "Investigation on the PVTC Property Characterization and its Importance on IC Encapsulation Material Application," AIP Conference Proceedings, vol. 2065, no. 1, p. 020006, 2019.
[12] M. Amagai, "Characterization of Chip Scale Packaging Materials," Microelectronics Reliability, vol. 39, no. 9, pp. 1365-1377, 1999.
[13] J. H. Park, J. K. Kim, M. M. F. Yuen, S. W. R. Lee, P. Tong, and P. C. H. Chan, "Thermal Stress Analysis of a PQFP Moulding Process: Comparison of Viscoelastic and Elastic Models," Key engineering materials, pp. 1127-1132, 1998.
[14] D. T. Yeung and M. M. Yuen, "Warpage of Plastic IC Packages as a Function of Processing Conditions," Journal of Electronic Packaging, vol. 123, no. 3, pp. 268-272, 2001.
[15] J. Wang, Z. Qian, and S. Liu, "Process Induced Stresses of a Flip-Chip Packaging by Sequential Processing Modeling Technique," Journal of Electronic Packaging, vol. 120, no. 3, pp. 309-313, 1998.
[16] W. Lin and M. W. Lee, "PoP/CSP Warpage Evaluation and Viscoelastic Modeling," 2008 58th Electronic Components and Technology Conference, pp. 1576-1581, 2008.
[17] C.-H. Shue, S.-J. Hwang, H.-H. Lee, D.-Y. Huang, and Y.-J. Lee, "Post-Mold Cure Process Simulation of IC Packaging," 2008 International Conference on Electronic Materials and Packaging, pp. 106-110, 2008.
[18] Y.-J. Lin, S.-J. Hwang, H.-H. Lee, and D.-Y. Huang, "Modeling of Viscoelastic Behavior of an Epoxy Molding Compound During and After Curing," IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 1, no. 11, pp. 1755-1760, 2011.
[19] Z. G. Wang, "Modeling the Viscoelastic Properties of Epoxy Molding Compound during Post Mold Cure in IC Packaging," Master Thesis, Department of Mechanical Engineering, National Cheng Kung University, 2006.
[20] W. K. Loh, R. W. Kulterman, C. C. Hsu, and H. Fu, "Modeling of Molded Electronic Package Warpage Characteristic with Cure Induced Shrinkage and Viscoelasticity Properties," 2018 IEEE 38th International Electronics Manufacturing Technology Conference (IEMT), pp. 1-9, 2018.
[21] H. Y. Guo, "Prediction of Warpage Considering PVTC Relation and Viscoelastic Behavior of EMC During IC Encapsulation Process," Master Thesis, Department of Mechanical Engineering, National Cheng Kung University, 2020.
[22] C.-C. Lee, C.-P. Chang, C.-Y. Chen, H.-C. Lee, and G. C.-F. Chen, "Warpage Estimation and Demonstration of Panel-level Fan-out Packaging with Cu Pillars Applied on a Highly Integrated Architecture," IEEE Transactions on Components, Packaging and Manufacturing Technology, 2023.
[23] L. F. Coffin Jr, "A Study of the Effects of Cyclic Thermal Stresses on a Ductile Metal," Transactions of the American Society of Mechanical engineers, vol. 76, no. 6, pp. 931-949, 1954.
[24] W. Engelmaier, "Fatigue Life of Leadless Chip Carrier Solder Joints During Power Cycling," IEEE transactions on components, hybrids, and manufacturing technology, vol. 6, no. 3, pp. 232-237, 1983.
[25] W. Engelmaier, "Effects of Power Cycling on Leadless Chip Carrier Mounting Reliability and Technology," Proceedings of International Electronics Packaging Conference (IEPS), San Diego, CA, pp. 15-20, 1982.
[26] W. Engelmaier, "Functional Cycles and Surface Mounting Attachment Reliability," Circuit World, vol. 11, no. 3, pp. 61-72, 1985.
[27] B. Singh, G. Menezes, S. McCann, V. Jayaram, U. Ray, V. Sundaram, R. Pulugurtha, V. Smet, and R. Tummala, "Board-Level Thermal Cycling and Drop-Test Reliability of Large, Ultrathin Glass BGA Packages for Smart Mobile Applications," IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 7, no. 5, pp. 726-733, 2017.
[28] K.-C. Shie, P.-N. Hsu, Y.-J. Li, D.-P. Tran, and C. Chen, "Failure Mechanisms of Cu–Cu Bumps Under Thermal Cycling," Materials, vol. 14, no. 19, p. 5522, 2021.
[29] F. Che, T. Low, H. Pang, C. W. Lin, S. C. Chiang, and T. A. Yang, "Modeling Thermo-Mechanical Reliability of Bumpless Flip Chip Package," 2004 Proceedings. 54th Electronic Components and Technology Conference (IEEE Cat. No. 04CH37546), vol. 1, pp. 421-426, 2004.
[30] M.-Y. Lin, Y.-J. Zeng, S.-J. Hwang, M.-H. Wang, H.-P. Liu, and C.-L. Fang, "Warpage and Residual Stress Analyses of Post-mold Cure Process of IC Packages," The International Journal of Advanced Manufacturing Technology, vol. 124, no. 3-4, pp. 1017-1039, 2023.
[31] Y. J. Zeng, "Analysis of Warpage and Reliability of an IC Package with Fine Pitch Substrate," Master Thesis, Department of Mechanical Engineering, National Cheng Kung University, 2022.
[32] S. Su, F. J. Akkara, R. Thaper, A. Alkhazali, M. Hamasha, and S. d. Hamasha, "A State-of-the-Art Review of Fatigue Life Prediction Models for Solder Joint," Journal of Electronic Packaging, vol. 141, no. 4, p. 040802, 2019.
[33] C.-C. Lee, C.-W. Wang, and C.-Y. Chen, "Comparison of Mechanical Modeling to Warpage Estimation of RDL-First Fan-Out Panel-Level Packaging," IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 12, no. 7, pp. 1100-1108, 2022.
[34] I. M. Daniel, O. Ishai, I. M. Daniel, and I. Daniel, Engineering Mechanics of Composite Materials. Oxford university press New York, 2006.
[35] M. Y. Lin, "Analysis of Post Mold Cure Process of IC Packages with Distributed Load," Master Thesis, Department of Mechanical Engineering, National Cheng Kung University, 2021.
[36] W. Ramberg and W. R. Osgood, "Description of Stress-Strain Curves by Three Parameters," 1943.
[37] C. Wu, R. Huang, and K. M. Liechti, "Characterizing Interfacial Sliding of Through-Silicon-Via by Nano-Indentation," IEEE Transactions on Device and Materials Reliability, vol. 17, no. 2, pp. 355-363, 2017.
[38] L. Xue, X. Li, and H. Zhang, "Thermal Stress and Drop Stress Analysis Based on 3D Package Reliability Study," Microelectronics Reliability, vol. 141, p. 114888, 2023.
[39] M. Mengel, J. Mahler, and W. Schober, "Effect of Post-mold Curing on Package Reliability," Journal of reinforced plastics and composites, vol. 23, no. 16, pp. 1755-1765, 2004.
[40] "Analysis of Bi-Metal Thermostats," Josa, vol. 11, no. 3, pp. 233-255, 1925.
[41] E. Suhir, "Stresses in Adhesively Bonded Bi-Material Assemblies used in Electronic Packaging," MRS Online Proceedings Library, vol. 72, pp. 133-138, 1986.
[42] T.-Y. Pan and Y.-H. Pao, "Deformation in Multilayer Stacked Assemblies," Journal of Electronic Packaging, vol. 112, p. 31, 1990.
[43] D. Olsen and H. Berg, "Properties of Die Bond Alloys Relating to Thermal Fatigue," IEEE transactions on components, hybrids, and manufacturing technology, vol. 2, no. 2, pp. 257-263, 1979.
[44] P. M. Hall, "Thermal expansivity and thermal stress in multilayered structures," Thermal Expansivity and Thermal Stress in Multilayered Structures, pp. 78-94, 1993.
[45] B. Kiang, J. Wittmershaus, R. Kar, and N. Sugai, "Package Warpage Evaluation for Multi-Layer Molded PQFP," Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium, pp. 89-93, 1991.
[46] G. Kelly and G. Kelly, "Accurate Prediction of PQFP Warpage," The Simulation of Thermomechanically Induced Stress in Plastic Encapsulated IC Packages, pp. 69-85, 1999.
[47] E. Suhir, "Predicted Residual Bow of Thin Plastic Packages of Integrated Circuit Devices," Journal of Electronic Packaging, vol. 114, no. 4, pp. 467-470, 1992.
[48] K. Oota and K. Shigeno, "Development of Molding Compounds for BGA," 1995 Proceedings. 45th Electronic Components and Technology Conference, pp. 78-85, 1995.
[49] F. Shoraka, K. Kinsman, B. Natarajan, and C. Gealer, "Package and Molding Compound Mechanics," Proceedings of 6th Annual International Electronics Packaging Conference, pp. 294-312, 1986.
[50] K. Oota and M. Saka, "Cure Shrinkage Analysis of Epoxy Molding Compound," Polymer Engineering & Science, vol. 41, no. 8, pp. 1373-1379, 2001.
[51] L.-C. Hong and S.-J. Hwang, "Study of Warpage Due to PVTC Relation of EMC in IC Packaging," IEEE Transactions on Components and Packaging Technologies, vol. 27, no. 2, pp. 291-295, 2004.
[52] J. D. Ferry, Viscoelastic Properties of Polymers. John Wiley & Sons, 1980.
[53] R. Bandyopadhyay, V. Prithivirajan, A. D. Peralta, and M. D. Sangid, "Microstructure-Sensitive Critical Plastic Strain Energy Density Criterion for Fatigue Life Prediction Across Various Loading Regimes," Proceedings of the Royal Society A, vol. 476, no. 2236, p. 20190766, 2020.
[54] A. Syed, "Accumulated Creep Strain and Energy Density Based Thermal Fatigue Life Prediction Models for SnAgCu Solder Joints," 2004 Proceedings. 54th electronic components and technology conference, vol. 1, pp. 737-746, 2004.
[55] W. Lee, L. Nguyen, and G. S. Selvaduray, "Solder Joint Fatigue Models: Review and Applicability to Chip Scale Packages," Microelectronics reliability, vol. 40, no. 2, pp. 231-244, 2000.
[56] B. Qiu, J. Xiong, H. Wang, S. Zhou, X. Yang, Z. Lin, M. Liu, and N. Cai, "Survey on Fatigue Life Prediction of BGA Solder Joints," Electronics, vol. 11, no. 4, p. 542, 2022.
[57] H. Solomon, "Fatigue of 60/40 Solder," IEEE Transactions on Components, Hybrids, and Manufacturing Technology, vol. 9, no. 4, pp. 423-432, 1986.
[58] X. Shi, H. Pang, W. Zhou, and Z. Wang, "Low Cycle Fatigue Analysis of Temperature and Frequency Effects in Eutectic Solder Alloy," International Journal of Fatigue, vol. 22, no. 3, pp. 217-228, 2000.
[59] R. Wild, Some Fatigue Properties of Solders and Solder Joints. IBM Federal Systems Division, Electronics Systems Center, 1973.
[60] W. Engelmaier, "Creep-Fatigue Model for SAC405/305 Solder Joint Reliability Estimation-A proposal," Global SMT & Packaging, vol. 8, no. 12, pp. 46-48, 2008.
[61] P. Chauhan, M. Pecht, M. Osterman, and S. W. R. Lee, "Critical Review of the Engelmaier Model for Solder Joint Creep Fatigue Reliability," IEEE Transactions on Components and Packaging Technologies, vol. 32, no. 3, pp. 693-700, 2009.
[62] S. Knecht and L. Fox, "Integrated Matrix Creep: Application to Accelerated Testing and Lifetime Prediction," Solder Joint Reliability: Theory and Applications, pp. 508-544, 1991.
[63] T. J. Kilinski, J. R. Lesniak, and B. I. Sandor, "Modern Approaches to Fatigue Life Prediction of SMT Solder Joints," Solder Joint Reliability: Theory and Applications, pp. 384-405, 1991.
[64] S. T. Rolfe and J. M. Barsom, Fracture and Fatigue Control in Structures: Applications of Fracture Mechanics. ASTM International, 1977.
[65] J. H. Lau and Y.-H. Pao, Solder Joint Reliability of BGA, CSP, Flip Chip, and Fine Pitch SMT Assemblies. McGraw-Hill Professional Publishing, 1997.
[66] H. Mavoori, J. Chin, S. Vaynman, B. Moran, L. Keer, and M. Fine, "Creep, Stress Relaxation, and Plastic Deformation in Sn-Ag and Sn-Zn Eutectic Solders," Journal of Electronic Materials, vol. 26, pp. 783-790, 1997.
[67] F. C. Monkman, "An Empirical Relationship Between Rupture Life and Minimum Creep Rate in Creep-Rupture Tests," Proc of the ASTM, vol. 56, pp. 593-620, 1956.
[68] M. A. Miner, "Cumulative Damage in Fatigue," Journal of Applied Mechanics, vol. 12, no. 3, pp. A159-A164, 2021.
[69] A. Syed, "Predicting Solder Joint Reliability for Thermal, Power, and Bend Cycle Within 25% Accuracy," 2001 Proceedings. 51st Electronic Components and Technology Conference, pp. 255-263, 2001.
[70] E. H. Amalu and N. Ekere, "Modelling evaluation of Garofalo-Arrhenius creep relation for lead-free solder joints in surface mount electronic component assemblies," Journal of Manufacturing Systems, vol. 39, pp. 9-23, 2016.
[71] B. Hu, J. O. Gonzalez, L. Ran, H. Ren, Z. Zeng, W. Lai, B. Gao, O. Alatise, H. Lu, and C. Bailey, "Failure and Reliability Analysis of a SiC Power Module Based on Stress Comparison to a Si Device," IEEE Transactions on Device and Materials Reliability, vol. 17, no. 4, pp. 727-737, 2017.
[72] J. H. Pang, B. Xiong, and T. Low, "Low Cycle Fatigue Models for Lead-Free Solders," Thin Solid Films, vol. 462, pp. 408-412, 2004.
[73] X. Yanjun, W. Liquan, W. Fengshun, X. Weisheng, and L. Hui, "Effect of Interface Structure on Fatigue Life Under Thermal Cycle with SAC305 Solder Joints," 2013 14th International Conference on Electronic Packaging Technology, pp. 959-964, 2013.
[74] J. Pang, F. Wong, K. Heng, Y. Chua, and C. Long, "Combined Vibration and Thermal Cycling Fatigue Analysis for SAC305 Lead Free Solder Assemblies," 2013 IEEE 63rd Electronic Components and Technology Conference, pp. 1300-1307, 2013.
[75] A. Schubert, R. Dudek, E. Auerswald, A. Gollhardt, B. Michel, and H. Reichl, "Fatigue Life Models for SnAgCu and SnPb Solder Joints Evaluated by Experiments and Simulation," Electronic components and technology conference, pp. 603-610, 2003.
[76] D. S. Steinberg, "Vibration Analysis for Electronic Equipment," 2000.
[77] M. Shaygi, M. Li, K. Lang, H. Laux, and B. Wunderle, "Finite Element-Based Lifetime Modelling of SAC Solder Joints in LED Applications," 2021 22nd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), pp. 1-11, 2021.
[78] J. H. Pang, S. C. Wong, S. K. Neo, and K. E. Tan, "Thermal Cycling Fatigue Analysis of Copper Pillar-to-Solder Joint Reliability," 2008 2nd Electronics System-Integration Technology Conference, pp. 743-748, 2008.
[79] X. Li, R. Sun, and Y. Wang, "A Review of Typical Thermal Fatigue Failure Models for Solder Joints of Electronic Components," IOP Conference Series: Materials Science and Engineering, vol. 242, no. 1, p. 012103, 2017.
[80] H. Pang, "Temperature Cycling Fatigue Analysis of Fine Pitch Solder Joints," Proc. of Interpack'97, vol. 2, pp. 1495-1500, 1997.
[81] X. Zhang, J. H. Pang, X. Shi, and Z. Wang, "On the Moduli of Viscoelastic Materials," 4th Electronics Packaging Technology Conference, pp. 318-322, 2002.
[82] M. Su, L. Cao, T. Lin, F. Chen, J. Li, C. Chen, and G. Tian, "Warpage Simulation and Experimental Verification for 320 mm× 320 mm Panel Level Fan-Out Packaging Based on Die-First Process," Microelectronics reliability, vol. 83, pp. 29-38, 2018.
[83] F. Hou, T. Lin, L. Cao, F. Liu, J. Li, X. Fan, and G. Zhang, "Experimental Verification and Optimization Analysis of Warpage for Panel-Level Fan-Out Package," IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 7, no. 10, pp. 1721-1728, 2017.
[84] Y. J. Lin, "Board Level Reliability of Chip Scale Package Under Cyclic Thermomechanical Loading," Master Thesis, Department of Mechanical Engineering, National Cheng Kung University, 2000.
[85] H. Boyer, "Fatigue Testing," Report of ASM International, USA, 1986.
[86] D. Deluca, "Understanding Fatigue," ASME International Gas Turbine Institute, pp. 7-10, 2001.
[87] Q. Bader and E. Kadum, "Mean Stress Correction Effects on the Fatigue Life Behavior of Steel Alloys by Using Stress Life Approach Theories," Int. J. Eng. Technol, vol. 14, no. 04, pp. 50-58, 2014.
[88] H. Merchant, M. Minor, and Y. Liu, "Mechanical Fatigue of Thin Copper Foil," Journal of Electronic Materials, vol. 28, pp. 998-1007, 1999.
校內:2028-08-17公開